{"id":"https://openalex.org/W2869059643","doi":"https://doi.org/10.1109/meco.2018.8405988","title":"High-power microfocus X-ray installation","display_name":"High-power microfocus X-ray installation","publication_year":2018,"publication_date":"2018-06-01","ids":{"openalex":"https://openalex.org/W2869059643","doi":"https://doi.org/10.1109/meco.2018.8405988","mag":"2869059643"},"language":"en","primary_location":{"id":"doi:10.1109/meco.2018.8405988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco.2018.8405988","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 7th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083631880","display_name":"\u0410. \u0410. \u0422\u0440\u0443\u0431\u0438\u0446\u044b\u043d","orcid":"https://orcid.org/0000-0002-9337-8947"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Andrey Trubitsyn","raw_affiliation_strings":["Industrial Electronics Department, University Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"Industrial Electronics Department, University Ryazan, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113846129","display_name":"Evgeniy Grachev","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Evgeniy Grachev","raw_affiliation_strings":["Industrial Electronics Department, University Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"Industrial Electronics Department, University Ryazan, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018477726","display_name":"D. A. Morozov","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dmitriy Morozov","raw_affiliation_strings":["Industrial Electronics Department, University Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"Industrial Electronics Department, University Ryazan, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030392852","display_name":"A. E. Serebryakov","orcid":"https://orcid.org/0000-0002-8593-7374"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Andrey Serebryakov","raw_affiliation_strings":["Industrial Electronics Department, University Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"Industrial Electronics Department, University Ryazan, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113796528","display_name":"Evgeniy Kozlov","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Evgeniy Kozlov","raw_affiliation_strings":["Industrial Electronics Department, University Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"Industrial Electronics Department, University Ryazan, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013046287","display_name":"V. M. Bochkov","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Viktor Bochkov","raw_affiliation_strings":["R&D Department, PulsedTechnologies Ltd, Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"R&D Department, PulsedTechnologies Ltd, Ryazan, Russia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101868687","display_name":"Petr Panov","orcid":"https://orcid.org/0000-0003-0660-1563"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Petr Panov","raw_affiliation_strings":["R&D Department, PulsedTechnologies Ltd, Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"R&D Department, PulsedTechnologies Ltd, Ryazan, Russia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017792392","display_name":"Boris Polonskiy","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Boris Polonskiy","raw_affiliation_strings":["R&D Department, PulsedTechnologies Ltd, Ryazan, Russia"],"affiliations":[{"raw_affiliation_string":"R&D Department, PulsedTechnologies Ltd, Ryazan, Russia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5083631880"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2179,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.51493911,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6295446753501892},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5781227946281433},{"id":"https://openalex.org/keywords/tube","display_name":"Tube (container)","score":0.565273642539978},{"id":"https://openalex.org/keywords/x-ray-tube","display_name":"X-ray tube","score":0.5521513223648071},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5491268634796143},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.5390483736991882},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.49389225244522095},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.49316710233688354},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4659026563167572},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43110886216163635},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40695521235466003},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3729252815246582},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2823028564453125},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2409716546535492},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13348069787025452},{"id":"https://openalex.org/keywords/anode","display_name":"Anode","score":0.1162264347076416},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.06274503469467163}],"concepts":[{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6295446753501892},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5781227946281433},{"id":"https://openalex.org/C2777551473","wikidata":"https://www.wikidata.org/wiki/Q2093072","display_name":"Tube (container)","level":2,"score":0.565273642539978},{"id":"https://openalex.org/C2777498775","wikidata":"https://www.wikidata.org/wiki/Q174443","display_name":"X-ray tube","level":4,"score":0.5521513223648071},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5491268634796143},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.5390483736991882},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.49389225244522095},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.49316710233688354},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4659026563167572},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43110886216163635},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40695521235466003},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3729252815246582},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2823028564453125},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2409716546535492},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13348069787025452},{"id":"https://openalex.org/C89395315","wikidata":"https://www.wikidata.org/wiki/Q181232","display_name":"Anode","level":3,"score":0.1162264347076416},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.06274503469467163},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/meco.2018.8405988","is_oa":false,"landing_page_url":"https://doi.org/10.1109/meco.2018.8405988","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 7th Mediterranean Conference on Embedded Computing (MECO)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8399999737739563,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2587155255","https://openalex.org/W6733462809"],"related_works":["https://openalex.org/W1967182180","https://openalex.org/W2144363584","https://openalex.org/W2326385731","https://openalex.org/W2044652327","https://openalex.org/W2166558597","https://openalex.org/W2134035281","https://openalex.org/W2018157300","https://openalex.org/W2070669830","https://openalex.org/W2410737015","https://openalex.org/W2222928110"],"abstract_inverted_index":{"An":[0],"X-ray":[1,13,28],"installation":[2,21,44],"was":[3],"developed,":[4],"the":[5,18,20],"heart":[6],"of":[7,43],"which":[8],"is":[9],"a":[10,23,30],"high-power":[11],"microfocus":[12],"tube.":[14],"In":[15],"addition":[16],"to":[17],"tube,":[19],"includes":[22],"high-voltage":[24],"power":[25],"supply,":[26],"an":[27],"detector,":[29],"sample":[31],"positioning":[32],"system,":[33],"components":[34],"control":[35],"sofware":[36],"and":[37],"image":[38],"processing":[39],"software.":[40],"The":[41],"testing":[42],"have":[45],"been":[46],"produced.":[47]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}