{"id":"https://openalex.org/W4243665131","doi":"https://doi.org/10.1109/mdt.2012.2205997","title":"Hardware IP Protection During Evaluation Using Embedded Sequential Trojan","display_name":"Hardware IP Protection During Evaluation Using Embedded Sequential Trojan","publication_year":2012,"publication_date":"2012-06-01","ids":{"openalex":"https://openalex.org/W4243665131","doi":"https://doi.org/10.1109/mdt.2012.2205997"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2012.2205997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2012.2205997","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004668210","display_name":"Seetharam Narasimhan","orcid":null},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seetharam Narasimhan","raw_affiliation_strings":["Case Western Reserve University, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Case Western Reserve University, USA","institution_ids":["https://openalex.org/I58956616"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049426113","display_name":"Rajat Subhra Chakraborty","orcid":"https://orcid.org/0000-0003-3588-163X"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]},{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Rajat Subhra Chakraborty","raw_affiliation_strings":["Case Western Reserve University, USA","Indian Institute of Technology, Kharagpur"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Case Western Reserve University, USA","institution_ids":["https://openalex.org/I58956616"]},{"raw_affiliation_string":"Indian Institute of Technology, Kharagpur","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044790063","display_name":"Swarup Chakraborty","orcid":"https://orcid.org/0000-0001-5495-6161"},"institutions":[{"id":"https://openalex.org/I58956616","display_name":"Case Western Reserve University","ror":"https://ror.org/051fd9666","country_code":"US","type":"education","lineage":["https://openalex.org/I58956616"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Swarup Chakraborty","raw_affiliation_strings":["Case Western Reserve University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Case Western Reserve University","institution_ids":["https://openalex.org/I58956616"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3174,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.89053391,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"29","issue":"3","first_page":"70","last_page":"79"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9595000147819519,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trojan","display_name":"Trojan","score":0.7012988924980164},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6520707011222839},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6164788603782654},{"id":"https://openalex.org/keywords/hardware-trojan","display_name":"Hardware Trojan","score":0.4815973937511444},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4220609664916992},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38459452986717224},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.33224862813949585},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3072664737701416}],"concepts":[{"id":"https://openalex.org/C174333608","wikidata":"https://www.wikidata.org/wiki/Q19635","display_name":"Trojan","level":2,"score":0.7012988924980164},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6520707011222839},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6164788603782654},{"id":"https://openalex.org/C2780873074","wikidata":"https://www.wikidata.org/wiki/Q5656397","display_name":"Hardware Trojan","level":3,"score":0.4815973937511444},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4220609664916992},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38459452986717224},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.33224862813949585},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3072664737701416}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2012.2205997","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2012.2205997","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1792138475","https://openalex.org/W1988381220","https://openalex.org/W2135211381","https://openalex.org/W2161998562","https://openalex.org/W3144121041"],"related_works":["https://openalex.org/W4385434494","https://openalex.org/W3159333627","https://openalex.org/W3004467197","https://openalex.org/W1500594134","https://openalex.org/W2091750459","https://openalex.org/W2999465529","https://openalex.org/W3084939900","https://openalex.org/W2382172865","https://openalex.org/W1526642037","https://openalex.org/W4321062229"],"abstract_inverted_index":{"Editor's":[0],"notes:":[1]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}