{"id":"https://openalex.org/W2151884217","doi":"https://doi.org/10.1109/mdt.2003.1198682","title":"Electrical modeling of integrated-package power and ground distributions","display_name":"Electrical modeling of integrated-package power and ground distributions","publication_year":2003,"publication_date":"2003-05-01","ids":{"openalex":"https://openalex.org/W2151884217","doi":"https://doi.org/10.1109/mdt.2003.1198682","mag":"2151884217"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2003.1198682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2003.1198682","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001143102","display_name":"Hui Zheng","orcid":"https://orcid.org/0000-0002-5128-6606"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"H. Zheng","raw_affiliation_strings":["Carnegie Mellon University, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004024474","display_name":"Lawrence T. Pileggi","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Pileggi","raw_affiliation_strings":["IBM","IBM, USA"],"affiliations":[{"raw_affiliation_string":"IBM","institution_ids":[]},{"raw_affiliation_string":"IBM, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007415208","display_name":"B. Kratiter","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Kratiter","raw_affiliation_strings":["Carnegie Mellon University"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5001143102"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":1.0432,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.79116602,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"20","issue":"3","first_page":"24","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/susceptance","display_name":"Susceptance","score":0.7643435597419739},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6156449317932129},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.47323641180992126},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4680487811565399},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.46343570947647095},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3163350224494934},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25116151571273804},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1693320870399475},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.11687928438186646}],"concepts":[{"id":"https://openalex.org/C102380595","wikidata":"https://www.wikidata.org/wiki/Q509598","display_name":"Susceptance","level":3,"score":0.7643435597419739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6156449317932129},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47323641180992126},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4680487811565399},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.46343570947647095},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3163350224494934},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25116151571273804},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1693320870399475},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.11687928438186646},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2003.1198682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2003.1198682","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8199999928474426}],"awards":[],"funders":[{"id":"https://openalex.org/F4320310207","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2026188268","https://openalex.org/W2053711806","https://openalex.org/W2061503856","https://openalex.org/W2105853422","https://openalex.org/W2122608783","https://openalex.org/W2125671371","https://openalex.org/W2128004834","https://openalex.org/W2142761462","https://openalex.org/W2154941678","https://openalex.org/W2166412861","https://openalex.org/W2724336187","https://openalex.org/W4230607007","https://openalex.org/W4235080448","https://openalex.org/W4238115498","https://openalex.org/W4243445004","https://openalex.org/W4244050449","https://openalex.org/W4249970081","https://openalex.org/W4252261125","https://openalex.org/W4256402224","https://openalex.org/W6684443594"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2766843486","https://openalex.org/W2088155960","https://openalex.org/W2904959921","https://openalex.org/W2400774189","https://openalex.org/W2933744343","https://openalex.org/W2071360584","https://openalex.org/W1972223223","https://openalex.org/W1602914939","https://openalex.org/W2337245573"],"abstract_inverted_index":{"Ensuring":[0],"reliable":[1],"power":[2,9],"distribution":[3],"requires":[4],"accurate":[5],"modeling":[6,20,46],"of":[7,42],"on-package":[8],"and":[10],"ground":[11],"networks.":[12],"This,":[13],"in":[14],"turn,":[15],"necessitates":[16],"efficient":[17],"magnetic":[18],"coupling":[19],"-":[21],"a":[22,33],"massively":[23],"complex":[24],"task.":[25],"Extending":[26],"their":[27],"previous":[28],"work,":[29],"these":[30],"authors":[31],"introduce":[32],"window-based":[34],"extraction":[35],"technique":[36],"that":[37],"uses":[38],"the":[39],"physical":[40],"concept":[41],"susceptance":[43],"to":[44],"control":[45],"complexity.":[47]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}