{"id":"https://openalex.org/W2145089376","doi":"https://doi.org/10.1109/mdt.2003.1188261","title":"Fast fault simulation for nonlinear analog circuits","display_name":"Fast fault simulation for nonlinear analog circuits","publication_year":2003,"publication_date":"2003-03-01","ids":{"openalex":"https://openalex.org/W2145089376","doi":"https://doi.org/10.1109/mdt.2003.1188261","mag":"2145089376"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2003.1188261","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2003.1188261","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015621274","display_name":"N. Engin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"N. Engin","raw_affiliation_strings":["Philips Research Laboratories, Netherlands"],"affiliations":[{"raw_affiliation_string":"Philips Research Laboratories, Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063280452","display_name":"Hans G. Kerkhoff","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"H.G. Kerkhoff","raw_affiliation_strings":["MESA Research Institute, Netherlands"],"affiliations":[{"raw_affiliation_string":"MESA Research Institute, Netherlands","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5015621274"],"corresponding_institution_ids":["https://openalex.org/I4210122849"],"apc_list":null,"apc_paid":null,"fwci":0.5031,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.67949342,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"20","issue":"2","first_page":"40","last_page":"47"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.9616410732269287},{"id":"https://openalex.org/keywords/speedup","display_name":"Speedup","score":0.8099104166030884},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6377586126327515},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.6095575094223022},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5953861474990845},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5816818475723267},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.572877049446106},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5637204051017761},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.4660649597644806},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4644021987915039},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4629533886909485},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.43446409702301025},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3514097332954407},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.2536596655845642},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.2506214678287506},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.23042947053909302},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18506371974945068},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.17496958374977112},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.13762548565864563},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12494397163391113},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08388340473175049},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0727584958076477}],"concepts":[{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.9616410732269287},{"id":"https://openalex.org/C68339613","wikidata":"https://www.wikidata.org/wiki/Q1549489","display_name":"Speedup","level":2,"score":0.8099104166030884},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6377586126327515},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.6095575094223022},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5953861474990845},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5816818475723267},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.572877049446106},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5637204051017761},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.4660649597644806},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4644021987915039},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4629533886909485},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.43446409702301025},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3514097332954407},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2536596655845642},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.2506214678287506},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.23042947053909302},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18506371974945068},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.17496958374977112},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.13762548565864563},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12494397163391113},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08388340473175049},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0727584958076477},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2003.1188261","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2003.1188261","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322421","display_name":"Orta Do\u011fu Teknik \u00dcniversitesi","ror":"https://ror.org/014weej12"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W177946546","https://openalex.org/W1591509466","https://openalex.org/W1924227955","https://openalex.org/W1979410517","https://openalex.org/W2010393246","https://openalex.org/W2101196233","https://openalex.org/W2101353552","https://openalex.org/W2138186805","https://openalex.org/W2146685901","https://openalex.org/W2163133378","https://openalex.org/W2165961247","https://openalex.org/W2596951540","https://openalex.org/W4206810020","https://openalex.org/W4235485521","https://openalex.org/W4241050566","https://openalex.org/W4248462573","https://openalex.org/W6607233012","https://openalex.org/W6635096737"],"related_works":["https://openalex.org/W1506159315","https://openalex.org/W1530804449","https://openalex.org/W2297417762","https://openalex.org/W2124342848","https://openalex.org/W2171786655","https://openalex.org/W18035309","https://openalex.org/W1985951220","https://openalex.org/W2185394135","https://openalex.org/W2082366402","https://openalex.org/W4376607244"],"abstract_inverted_index":{"A":[0],"new":[1],"method":[2,31],"of":[3,11,18,35],"transient":[4],"fault":[5],"simulation":[6],"uses":[7],"dc":[8],"bias":[9],"grouping":[10],"faulty":[12],"circuits":[13],"and":[14],"decreases":[15],"the":[16],"number":[17],"Newton-Raphson":[19],"iterations":[20],"needed":[21],"to":[22,37],"reach":[23],"a":[24,33,40],"solution.":[25],"An":[26],"experimental":[27],"tool":[28],"implementing":[29],"this":[30],"achieves":[32],"speedup":[34],"20%":[36],"30%":[38],"on":[39],"flat":[41],"netlist.":[42]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}