{"id":"https://openalex.org/W2147105328","doi":"https://doi.org/10.1109/mdt.2003.1188260","title":"Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test","display_name":"Extending IEEE Std. 1149.4 analog boundary modules to enhance mixed-signal test","publication_year":2003,"publication_date":"2003-03-01","ids":{"openalex":"https://openalex.org/W2147105328","doi":"https://doi.org/10.1109/mdt.2003.1188260","mag":"2147105328"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2003.1188260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2003.1188260","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076663576","display_name":"Uro\u0161 Ka\u010d","orcid":null},"institutions":[{"id":"https://openalex.org/I3006985408","display_name":"Jo\u017eef Stefan Institute","ror":"https://ror.org/05060sz93","country_code":"SI","type":"facility","lineage":["https://openalex.org/I3006985408"]}],"countries":["SI"],"is_corresponding":false,"raw_author_name":"U. Kac","raw_affiliation_strings":["Jozef Stefan Institute, Slovenia","Jozef Stefan Institute , Ljubljana , Slovenia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jozef Stefan Institute, Slovenia","institution_ids":["https://openalex.org/I3006985408"]},{"raw_affiliation_string":"Jozef Stefan Institute , Ljubljana , Slovenia","institution_ids":["https://openalex.org/I3006985408"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108583318","display_name":"Franc Novak","orcid":null},"institutions":[{"id":"https://openalex.org/I3006985408","display_name":"Jo\u017eef Stefan Institute","ror":"https://ror.org/05060sz93","country_code":"SI","type":"facility","lineage":["https://openalex.org/I3006985408"]}],"countries":["SI"],"is_corresponding":false,"raw_author_name":"F. Novak","raw_affiliation_strings":["Jozef Stefan Institute, Slovenia","Jozef Stefan Institute , Ljubljana , Slovenia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Jozef Stefan Institute, Slovenia","institution_ids":["https://openalex.org/I3006985408"]},{"raw_affiliation_string":"Jozef Stefan Institute , Ljubljana , Slovenia","institution_ids":["https://openalex.org/I3006985408"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040698879","display_name":"F. Aza\u0131\u0308s","orcid":"https://orcid.org/0000-0001-6458-5018"},"institutions":[{"id":"https://openalex.org/I4210089655","display_name":"Chimie Mol\u00e9culaire, Macromol\u00e9culaire, Mat\u00e9riaux","ror":"https://ror.org/007sc9r91","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I190752583","https://openalex.org/I2746051580","https://openalex.org/I4210089655","https://openalex.org/I4210128300","https://openalex.org/I98910050"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Azais","raw_affiliation_strings":["L.I.R.M.M, France","[L.I.R.M.M, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"L.I.R.M.M, France","institution_ids":["https://openalex.org/I4210089655"]},{"raw_affiliation_string":"[L.I.R.M.M, France]","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054580128","display_name":"Pascal Nouet","orcid":"https://orcid.org/0000-0003-2137-2623"},"institutions":[{"id":"https://openalex.org/I4210089655","display_name":"Chimie Mol\u00e9culaire, Macromol\u00e9culaire, Mat\u00e9riaux","ror":"https://ror.org/007sc9r91","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I190752583","https://openalex.org/I2746051580","https://openalex.org/I4210089655","https://openalex.org/I4210128300","https://openalex.org/I98910050"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Nouet","raw_affiliation_strings":["L.I.R.M.M, France","[L.I.R.M.M, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"L.I.R.M.M, France","institution_ids":["https://openalex.org/I4210089655"]},{"raw_affiliation_string":"[L.I.R.M.M, France]","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069159925","display_name":"M. Renovell","orcid":"https://orcid.org/0000-0002-3896-8231"},"institutions":[{"id":"https://openalex.org/I4210089655","display_name":"Chimie Mol\u00e9culaire, Macromol\u00e9culaire, Mat\u00e9riaux","ror":"https://ror.org/007sc9r91","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I190752583","https://openalex.org/I2746051580","https://openalex.org/I4210089655","https://openalex.org/I4210128300","https://openalex.org/I98910050"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. Renovell","raw_affiliation_strings":["L.I.R.M.M, France","[L.I.R.M.M, France]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"L.I.R.M.M, France","institution_ids":["https://openalex.org/I4210089655"]},{"raw_affiliation_string":"[L.I.R.M.M, France]","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.2297,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.88454341,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"20","issue":"2","first_page":"32","last_page":"39"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.8319152593612671},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.6170559525489807},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6030580401420593},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5206707715988159},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5016663074493408},{"id":"https://openalex.org/keywords/analog-signal","display_name":"Analog signal","score":0.5003092288970947},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3779226541519165},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3664690852165222},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36257922649383545},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34876275062561035},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34588703513145447},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.17117062211036682},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.09269803762435913}],"concepts":[{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.8319152593612671},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.6170559525489807},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6030580401420593},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5206707715988159},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5016663074493408},{"id":"https://openalex.org/C13412647","wikidata":"https://www.wikidata.org/wiki/Q174948","display_name":"Analog signal","level":3,"score":0.5003092288970947},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3779226541519165},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3664690852165222},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36257922649383545},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34876275062561035},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34588703513145447},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.17117062211036682},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.09269803762435913},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mdt.2003.1188260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2003.1188260","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-00269600v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269600","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Design & Test, 2003, 20 (2), pp.32-39. ⟨10.1109/MDT.2003.1188260⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1600567638","https://openalex.org/W1836481701","https://openalex.org/W1850320327","https://openalex.org/W1875092857","https://openalex.org/W2033237998","https://openalex.org/W2112025713","https://openalex.org/W2142508670","https://openalex.org/W2149364102","https://openalex.org/W2166053532","https://openalex.org/W4231486519","https://openalex.org/W4236512234","https://openalex.org/W4251744051","https://openalex.org/W4255033936"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2359879230","https://openalex.org/W2166940391","https://openalex.org/W2171373553","https://openalex.org/W2109999133","https://openalex.org/W2149959433","https://openalex.org/W1849410037","https://openalex.org/W800701192","https://openalex.org/W2385360076","https://openalex.org/W969526214"],"abstract_inverted_index":{"Will":[0],"it":[1,30],"or":[2],"won't":[3],"it?":[4],"The":[5],"1999":[6],"IEEE":[7],"1149.4":[8],"Standard":[9],"for":[10],"a":[11],"mixed-signal":[12],"test":[13],"bus":[14],"is":[15],"on":[16,56],"the":[17,42,53],"cusp":[18],"of":[19,44],"industrial":[20],"acceptance,":[21],"but":[22],"it's":[23],"not":[24],"clear":[25],"whether":[26],"industry":[27],"will":[28],"pick":[29],"up.":[31],"This":[32],"study,":[33],"by":[34],"two":[35],"leading":[36],"European":[37],"research":[38],"institute,":[39],"delves":[40],"into":[41],"details":[43],"hardware":[45],"implementation":[46],"and,":[47],"in":[48],"so":[49],"doing,":[50],"contributes":[51],"to":[52],"growing":[54],"literature":[55],"this":[57],"topic.":[58]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}