{"id":"https://openalex.org/W2066750428","doi":"https://doi.org/10.1109/mdt.2002.1047746","title":"Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell","display_name":"Testing mixed-signal cores: a practical oscillation-based test in an analog macrocell","publication_year":2002,"publication_date":"2002-11-01","ids":{"openalex":"https://openalex.org/W2066750428","doi":"https://doi.org/10.1109/mdt.2002.1047746","mag":"2066750428"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2002.1047746","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1047746","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://idus.us.es/handle//11441/76292","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073688627","display_name":"Gloria Huertas","orcid":"https://orcid.org/0000-0001-5851-2576"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"G. Huertas","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","Inst. de Microelectron., Seville, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","institution_ids":["https://openalex.org/I4210104545"]},{"raw_affiliation_string":"Inst. de Microelectron., Seville, Spain","institution_ids":["https://openalex.org/I4210104545"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078607433","display_name":"D. V\u00e1zquez","orcid":"https://orcid.org/0000-0002-9650-7804"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"D. Vazquez","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","Inst. de Microelectron., Seville, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","institution_ids":["https://openalex.org/I4210104545"]},{"raw_affiliation_string":"Inst. de Microelectron., Seville, Spain","institution_ids":["https://openalex.org/I4210104545"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091600572","display_name":"E. Peral\u00edas","orcid":"https://orcid.org/0000-0003-0629-0785"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E.J. Peralias","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","Inst. de Microelectron., Seville, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","institution_ids":["https://openalex.org/I4210104545"]},{"raw_affiliation_string":"Inst. de Microelectron., Seville, Spain","institution_ids":["https://openalex.org/I4210104545"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066990447","display_name":"A. Rueda","orcid":"https://orcid.org/0000-0003-4564-9359"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"A. Rueda","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","Inst. de Microelectron., Seville, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","institution_ids":["https://openalex.org/I4210104545"]},{"raw_affiliation_string":"Inst. de Microelectron., Seville, Spain","institution_ids":["https://openalex.org/I4210104545"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016693928","display_name":"J.L. Huertas","orcid":"https://orcid.org/0000-0001-8230-9543"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J.L. Huertas","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","Inst. de Microelectron., Seville, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla (IMSE-CNM), Spain","institution_ids":["https://openalex.org/I4210104545"]},{"raw_affiliation_string":"Inst. de Microelectron., Seville, Spain","institution_ids":["https://openalex.org/I4210104545"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5073688627"],"corresponding_institution_ids":["https://openalex.org/I4210104545"],"apc_list":null,"apc_paid":null,"fwci":3.3351,"has_fulltext":true,"cited_by_count":65,"citation_normalized_percentile":{"value":0.92857959,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"19","issue":"6","first_page":"73","last_page":"82"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/macrocell","display_name":"Macrocell","score":0.7881960868835449},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6474599838256836},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5858436226844788},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5737861394882202},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5310884714126587},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5000414848327637},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4794532358646393},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.4544657766819},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4433266818523407},{"id":"https://openalex.org/keywords/oscillation","display_name":"Oscillation (cell signaling)","score":0.4283354580402374},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.4184158444404602},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4163166284561157},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34945663809776306},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2912946045398712},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.19735047221183777},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.19658705592155457},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08713507652282715}],"concepts":[{"id":"https://openalex.org/C2778291847","wikidata":"https://www.wikidata.org/wiki/Q1163937","display_name":"Macrocell","level":3,"score":0.7881960868835449},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6474599838256836},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5858436226844788},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5737861394882202},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5310884714126587},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5000414848327637},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4794532358646393},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.4544657766819},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4433266818523407},{"id":"https://openalex.org/C2778439541","wikidata":"https://www.wikidata.org/wiki/Q7106412","display_name":"Oscillation (cell signaling)","level":2,"score":0.4283354580402374},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.4184158444404602},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4163166284561157},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34945663809776306},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2912946045398712},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.19735047221183777},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.19658705592155457},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08713507652282715},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C68649174","wikidata":"https://www.wikidata.org/wiki/Q1379116","display_name":"Base station","level":2,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/mdt.2002.1047746","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1047746","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},{"id":"pmh:oai:dnet:idus________::11a6654e5a09f6704a520d1d6fc910ea","is_oa":true,"landing_page_url":"https://idus.us.es/handle//11441/76292","pdf_url":"https://idus.us.es/handle//11441/76292","source":{"id":"https://openalex.org/S4306402641","display_name":"LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Cient\u00edficas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4383465926","host_organization_name":"LA Referencia","host_organization_lineage":["https://openalex.org/I4383465926"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:digital.csic.es:10261/85257","is_oa":false,"landing_page_url":"http://hdl.handle.net/10261/85257","pdf_url":null,"source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"art\u00edculo"}],"best_oa_location":{"id":"pmh:oai:dnet:idus________::11a6654e5a09f6704a520d1d6fc910ea","is_oa":true,"landing_page_url":"https://idus.us.es/handle//11441/76292","pdf_url":"https://idus.us.es/handle//11441/76292","source":{"id":"https://openalex.org/S4306402641","display_name":"LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Cient\u00edficas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4383465926","host_organization_name":"LA Referencia","host_organization_lineage":["https://openalex.org/I4383465926"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2066750428.pdf","grobid_xml":"https://content.openalex.org/works/W2066750428.grobid-xml"},"referenced_works_count":14,"referenced_works":["https://openalex.org/W118952169","https://openalex.org/W1501573324","https://openalex.org/W1531446014","https://openalex.org/W1940143604","https://openalex.org/W1972876480","https://openalex.org/W2000599178","https://openalex.org/W2017085810","https://openalex.org/W2077251002","https://openalex.org/W2080230903","https://openalex.org/W2113006656","https://openalex.org/W2142590167","https://openalex.org/W2156213538","https://openalex.org/W2162281676","https://openalex.org/W4230078331"],"related_works":["https://openalex.org/W2147796811","https://openalex.org/W2138490825","https://openalex.org/W1901574727","https://openalex.org/W2146381271","https://openalex.org/W2165948443","https://openalex.org/W1646128378","https://openalex.org/W2149724644","https://openalex.org/W2377850316","https://openalex.org/W1909129617","https://openalex.org/W1849410037"],"abstract_inverted_index":{"A":[0],"formal":[1],"set":[2],"of":[3,67],"design":[4],"decisions":[5],"can":[6,80],"aid":[7],"in":[8,16,52,90],"using":[9],"oscillation-based":[10],"test":[11,36,56],"(OBT)":[12],"for":[13,47,87],"analog":[14],"subsystems":[15],"SoCs.":[17],"The":[18],"goal":[19],"is":[20,43,95],"to":[21,50,62,69,83,97,101],"offer":[22],"designers":[23,79],"testing":[24],"options":[25],"that":[26,41],"do":[27],"not":[28],"have":[29,59],"significant":[30],"area":[31],"overhead,":[32],"performance":[33],"degradation,":[34],"or":[35],"time.":[37],"This":[38],"work":[39],"shows":[40],"OBT":[42,68,82],"a":[44,73],"potential":[45],"candidate":[46],"IP":[48],"providers":[49],"use":[51,81],"combination":[53],"with":[54,72],"functional":[55],"techniques.":[57],"We":[58],"shown":[60],"how":[61],"modify":[63],"the":[64,85],"basic":[65],"concept":[66],"come":[70],"up":[71],"practical":[74],"method.":[75],"Using":[76],"our":[77],"approach,":[78],"pave":[84],"way":[86],"future":[88],"developments":[89],"SoC":[91],"testing,":[92],"and":[93],"it":[94],"simple":[96],"extend":[98],"this":[99],"idea":[100],"BIST.":[102]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-03-17T17:19:04.345684","created_date":"2025-10-10T00:00:00"}