{"id":"https://openalex.org/W2036424259","doi":"https://doi.org/10.1109/mdt.2002.1033796","title":"Multilevel testability analysis and solutions for integrated Bluetooth transceivers","display_name":"Multilevel testability analysis and solutions for integrated Bluetooth transceivers","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2036424259","doi":"https://doi.org/10.1109/mdt.2002.1033796","mag":"2036424259"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2002.1033796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033796","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Ozev","raw_affiliation_strings":["University of California, San Diego, USA","Comput. Eng. Dept., Univ. of California, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"University of California, San Diego, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Comput. Eng. Dept., Univ. of California, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006811625","display_name":"Alex Orailo\u011flu","orcid":"https://orcid.org/0000-0002-6104-3923"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Orailoglu","raw_affiliation_strings":["University of California, San Diego, USA","University of California at San Diego"],"affiliations":[{"raw_affiliation_string":"University of California, San Diego, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"University of California at San Diego","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006296494","display_name":"C. \u00d8lgaard","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C.V. Olgaard","raw_affiliation_strings":["LitePoint"],"affiliations":[{"raw_affiliation_string":"LitePoint","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5058946013"],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":2.4783,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.89551035,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"19","issue":"5","first_page":"82","last_page":"91"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bluetooth","display_name":"Bluetooth","score":0.8330779075622559},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7471379041671753},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.617599368095398},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6097420454025269},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.603320300579071},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.5953322052955627},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5295779705047607},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4636818766593933},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4274716377258301},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3995736837387085},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38371729850769043},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.277168333530426},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.19812312722206116}],"concepts":[{"id":"https://openalex.org/C546215728","wikidata":"https://www.wikidata.org/wiki/Q39531","display_name":"Bluetooth","level":3,"score":0.8330779075622559},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7471379041671753},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.617599368095398},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6097420454025269},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.603320300579071},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.5953322052955627},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5295779705047607},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4636818766593933},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4274716377258301},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3995736837387085},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38371729850769043},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.277168333530426},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.19812312722206116}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2002.1033796","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033796","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2095679095","https://openalex.org/W2104525307","https://openalex.org/W2109911518","https://openalex.org/W2112058282","https://openalex.org/W2119242599","https://openalex.org/W4231510779"],"related_works":["https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2153086993","https://openalex.org/W2114980936","https://openalex.org/W2118697956","https://openalex.org/W2128920253","https://openalex.org/W2164349885","https://openalex.org/W1768820276"],"abstract_inverted_index":{"As":[0],"use":[1],"of":[2],"wireless":[3],"communications":[4],"rises":[5],"and":[6,19,39],"profit":[7],"margins":[8],"shrink,":[9],"low-cost":[10,43],"solutions":[11],"are":[12],"becoming":[13],"increasingly":[14],"important.":[15],"Incorporating":[16],"test":[17,36,40],"design":[18,24],"DFT":[20],"into":[21],"the":[22],"system":[23],"flow":[25],"is":[26],"essential":[27],"to":[28],"achieving":[29],"such":[30],"solutions.":[31],"This":[32],"case":[33],"study":[34],"analyzes":[35],"requirements,":[37],"implications,":[38],"cost":[41],"for":[42],"Bluetooth":[44],"systems,":[45],"which":[46],"enable":[47],"communication":[48],"among":[49],"several":[50],"electronic":[51],"components.":[52]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}