{"id":"https://openalex.org/W2140283778","doi":"https://doi.org/10.1109/mdt.2002.1033794","title":"Extending OPMISR beyond 10\u00d7 scan test efficiency","display_name":"Extending OPMISR beyond 10\u00d7 scan test efficiency","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2140283778","doi":"https://doi.org/10.1109/mdt.2002.1033794","mag":"2140283778"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2002.1033794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033794","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014786517","display_name":"C. Barnhart","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"C. Barnhart","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057428217","display_name":"V. Brunkhorst","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V. Brunkhorst","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007373235","display_name":"F. Distler","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F. Distler","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049666459","display_name":"O. Farnsworth","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"O. Farnsworth","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025221020","display_name":"A Ferko","orcid":"https://orcid.org/0000-0003-3031-1400"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Ferko","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006214290","display_name":"Brion Keller","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B. Keller","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068028533","display_name":"David Scott","orcid":"https://orcid.org/0000-0001-5226-1972"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Scott","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017691247","display_name":"B. Koenemann","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B. Koenemann","raw_affiliation_strings":["IBM Microelectronics, USA","IBM Microelectron., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Microelectronics, USA","institution_ids":[]},{"raw_affiliation_string":"IBM Microelectron., USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113728186","display_name":"Tetsuo Onodera","orcid":null},"institutions":[{"id":"https://openalex.org/I2800278093","display_name":"Sony Corporation (United States)","ror":"https://ror.org/05k91zb11","country_code":"US","type":"company","lineage":["https://openalex.org/I2800278093"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Onodera","raw_affiliation_strings":["Sony"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sony","institution_ids":["https://openalex.org/I2800278093"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.9321,"has_fulltext":false,"cited_by_count":119,"citation_normalized_percentile":{"value":0.95909531,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"19","issue":"5","first_page":"65","last_page":"73"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9868999719619751,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8355293273925781},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.7230238318443298},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.6525610685348511},{"id":"https://openalex.org/keywords/signature","display_name":"Signature (topology)","score":0.6207917928695679},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5470486879348755},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5431094169616699},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.5285153388977051},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5086801648139954},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.4783494174480438},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4364165663719177},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4301730692386627},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3882625699043274},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3607898950576782},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31674355268478394},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11949008703231812},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11127811670303345},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.09575125575065613},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0946001410484314}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8355293273925781},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.7230238318443298},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.6525610685348511},{"id":"https://openalex.org/C2779696439","wikidata":"https://www.wikidata.org/wiki/Q7512811","display_name":"Signature (topology)","level":2,"score":0.6207917928695679},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5470486879348755},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5431094169616699},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.5285153388977051},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5086801648139954},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.4783494174480438},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4364165663719177},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4301730692386627},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3882625699043274},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3607898950576782},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31674355268478394},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11949008703231812},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11127811670303345},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.09575125575065613},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0946001410484314},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2002.1033794","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033794","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5600000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W197391467","https://openalex.org/W1763985980","https://openalex.org/W1863819993","https://openalex.org/W1905213452","https://openalex.org/W1985440524","https://openalex.org/W2004458344","https://openalex.org/W2099814124","https://openalex.org/W2105282021","https://openalex.org/W2106258585","https://openalex.org/W2117154146","https://openalex.org/W2168755502","https://openalex.org/W4235550258","https://openalex.org/W4243651083","https://openalex.org/W6607990715"],"related_works":["https://openalex.org/W2146381271","https://openalex.org/W2154529098","https://openalex.org/W2061326683","https://openalex.org/W2356961922","https://openalex.org/W2989178840","https://openalex.org/W2144004661","https://openalex.org/W2550725449","https://openalex.org/W1232298525","https://openalex.org/W565729072","https://openalex.org/W2620614665"],"abstract_inverted_index":{"Rapidly":[0],"increasing":[1],"ASIC":[2],"gate":[3],"counts":[4],"are":[5],"stressing":[6],"the":[7],"test":[8,12,22,32],"capacity":[9],"of":[10],"manufacturing":[11],"equipment.":[13],"New":[14],"on-product":[15],"multiple-input":[16],"signature":[17],"register":[18],"(OPMISR)":[19],"techniques":[20],"compress":[21],"vectors":[23],"produced":[24],"by":[25],"ATPG,":[26],"substantially":[27],"reducing":[28],"data":[29],"volume":[30],"and":[31],"time.":[33]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":5},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":5},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":5}],"updated_date":"2026-06-19T17:40:00.097472","created_date":"2025-10-10T00:00:00"}