{"id":"https://openalex.org/W1993974694","doi":"https://doi.org/10.1109/mdt.2002.1033787","title":"I/sub DDQ/ test: will it survive the DSM challenge?","display_name":"I/sub DDQ/ test: will it survive the DSM challenge?","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W1993974694","doi":"https://doi.org/10.1109/mdt.2002.1033787","mag":"1993974694"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2002.1033787","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033787","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069009697","display_name":"S.S. Sabade","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S.S. Sabade","raw_affiliation_strings":["Texas A and M University, USA","[Texas A&M University, Tx, USA]"],"affiliations":[{"raw_affiliation_string":"Texas A and M University, USA","institution_ids":[]},{"raw_affiliation_string":"[Texas A&M University, Tx, USA]","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027337337","display_name":"D.M.H. Walker","orcid":"https://orcid.org/0000-0002-4839-3830"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.M.H. Walker","raw_affiliation_strings":["Texas A and M University, USA","[Texas A&M University, Tx, USA]"],"affiliations":[{"raw_affiliation_string":"Texas A and M University, USA","institution_ids":[]},{"raw_affiliation_string":"[Texas A&M University, Tx, USA]","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5069009697"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":2.0653,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.87234165,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"19","issue":"5","first_page":"8","last_page":"16"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10217","display_name":"Cardiac electrophysiology and arrhythmias","score":0.9768000245094299,"subfield":{"id":"https://openalex.org/subfields/2705","display_name":"Cardiology and Cardiovascular Medicine"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11235","display_name":"Statistical Methods in Clinical Trials","score":0.9079999923706055,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5957160592079163},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5259383320808411},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5175253748893738},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3921622335910797},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29084357619285583},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08948194980621338}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5957160592079163},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5259383320808411},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5175253748893738},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3921622335910797},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29084357619285583},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08948194980621338},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2002.1033787","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033787","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1609157825","https://openalex.org/W1909769229","https://openalex.org/W1950292122","https://openalex.org/W2017377271","https://openalex.org/W2069257560","https://openalex.org/W2115729533","https://openalex.org/W2122191042","https://openalex.org/W2130404536","https://openalex.org/W2147198689","https://openalex.org/W2151244242","https://openalex.org/W2158581741","https://openalex.org/W2161197076","https://openalex.org/W2166777727"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"Deep-submicron":[0],"technologies":[1],"pose":[2],"difficult":[3],"challenges":[4],"for":[5],"I/sub":[6,25,29],"DDQ/":[7,30],"testing":[8],"in":[9],"the":[10,21],"future.":[11],"The":[12],"low":[13],"threshold":[14],"voltage":[15],"used":[16],"by":[17],"DSM":[18],"devices":[19],"decreases":[20],"defect":[22],"resolution":[23],"of":[24],"DDQ./":[26],"However,":[27],"because":[28],"is":[31],"a":[32],"valuable":[33],"test":[34,43],"method,":[35],"researchers":[36],"are":[37],"working":[38],"to":[39,45],"augment":[40],"with":[41],"other":[42],"parameters":[44],"prolong":[46],"its":[47],"effectiveness.":[48]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}