{"id":"https://openalex.org/W2027138893","doi":"https://doi.org/10.1109/mdt.2002.1033786","title":"Guest editors' introduction: defect-oriented testing in the deep-submicron era","display_name":"Guest editors' introduction: defect-oriented testing in the deep-submicron era","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2027138893","doi":"https://doi.org/10.1109/mdt.2002.1033786","mag":"2027138893"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2002.1033786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033786","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077705720","display_name":"J. Segura","orcid":"https://orcid.org/0000-0001-9742-2936"},"institutions":[{"id":"https://openalex.org/I50441567","display_name":"Universitat de les Illes Balears","ror":"https://ror.org/03e10x626","country_code":"ES","type":"education","lineage":["https://openalex.org/I50441567"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"J. Segura","raw_affiliation_strings":["Universitat de les Illes Balears, Palma de Mallorca, Spain"],"affiliations":[{"raw_affiliation_string":"Universitat de les Illes Balears, Palma de Mallorca, Spain","institution_ids":["https://openalex.org/I50441567"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090093329","display_name":"Alexander P. Maxwell","orcid":"https://orcid.org/0000-0002-6110-7253"},"institutions":[{"id":"https://openalex.org/I138285227","display_name":"Agilent Technologies (United States)","ror":"https://ror.org/02tryst02","country_code":"US","type":"company","lineage":["https://openalex.org/I138285227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Maxwell","raw_affiliation_strings":["Agilent Technologies, Santa Clara, CA"],"affiliations":[{"raw_affiliation_string":"Agilent Technologies, Santa Clara, CA","institution_ids":["https://openalex.org/I138285227"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5077705720"],"corresponding_institution_ids":["https://openalex.org/I50441567"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13428802,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":"5","first_page":"5","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5026304721832275}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5026304721832275}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.2002.1033786","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1033786","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655","https://openalex.org/W2359140296"],"abstract_inverted_index":{"Presents":[0],"the":[1,8],"guest":[2],"editorial":[3],"for":[4],"this":[5],"issue":[6],"of":[7],"publication.":[9]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}