{"id":"https://openalex.org/W2119691242","doi":"https://doi.org/10.1109/mdt.2002.1003802","title":"Survey of low-power testing of VLSI circuits","display_name":"Survey of low-power testing of VLSI circuits","publication_year":2002,"publication_date":"2002-05-01","ids":{"openalex":"https://openalex.org/W2119691242","doi":"https://doi.org/10.1109/mdt.2002.1003802","mag":"2119691242"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2002.1003802","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1003802","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005116115","display_name":"Patrick Girard","orcid":"https://orcid.org/0000-0003-0722-8772"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"P. Girard","raw_affiliation_strings":["Laboratory of Informatics, Robotics and Microelectronics, France","Lab. of Informatics Robotics & Microelectron., Montpellier, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Informatics, Robotics and Microelectronics, France","institution_ids":["https://openalex.org/I4210101743"]},{"raw_affiliation_string":"Lab. of Informatics Robotics & Microelectron., Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5005116115"],"corresponding_institution_ids":["https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":6.782,"has_fulltext":false,"cited_by_count":439,"citation_normalized_percentile":{"value":0.97504416,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"19","issue":"3","first_page":"82","last_page":"92"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.8525696992874146},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.5605108737945557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5496278405189514},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5468241572380066},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5374159812927246},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.4495231509208679},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4485079050064087},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4310012757778168},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3326120376586914},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3323599100112915}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.8525696992874146},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.5605108737945557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5496278405189514},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5468241572380066},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5374159812927246},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.4495231509208679},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4485079050064087},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4310012757778168},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3326120376586914},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3323599100112915},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mdt.2002.1003802","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2002.1003802","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-00268584v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268584","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Design & Test, 2002, 19 (3), pp.82-92. ⟨10.1109/MDT.2002.1003802⟩","raw_type":"Journal articles"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W104496058","https://openalex.org/W603405442","https://openalex.org/W1524490503","https://openalex.org/W1540427222","https://openalex.org/W1561562902","https://openalex.org/W1628577686","https://openalex.org/W1660272255","https://openalex.org/W1683546237","https://openalex.org/W1883208636","https://openalex.org/W1914799182","https://openalex.org/W1921137125","https://openalex.org/W1942759344","https://openalex.org/W1967602327","https://openalex.org/W1968188056","https://openalex.org/W1976062726","https://openalex.org/W1978040115","https://openalex.org/W2001352955","https://openalex.org/W2006097283","https://openalex.org/W2080510479","https://openalex.org/W2101406500","https://openalex.org/W2105913179","https://openalex.org/W2106303764","https://openalex.org/W2113576355","https://openalex.org/W2114980975","https://openalex.org/W2122206014","https://openalex.org/W2125734620","https://openalex.org/W2126641963","https://openalex.org/W2131261851","https://openalex.org/W2132881562","https://openalex.org/W2138349604","https://openalex.org/W2138654786","https://openalex.org/W2139356796","https://openalex.org/W2146091965","https://openalex.org/W2146893269","https://openalex.org/W2148244401","https://openalex.org/W2149690470","https://openalex.org/W2160621850","https://openalex.org/W2169462318","https://openalex.org/W2169839635","https://openalex.org/W2936804578","https://openalex.org/W3014113159","https://openalex.org/W4243807552","https://openalex.org/W6607104645","https://openalex.org/W6987070245"],"related_works":["https://openalex.org/W4283025278","https://openalex.org/W2082432309","https://openalex.org/W817174743","https://openalex.org/W4254559750","https://openalex.org/W2050492524","https://openalex.org/W2998315020","https://openalex.org/W1976665945","https://openalex.org/W575537888","https://openalex.org/W2121123467","https://openalex.org/W2146514983"],"abstract_inverted_index":{"The":[0],"author":[1],"reviews":[2],"low-power":[3],"testing":[4],"techniques":[5,40],"for":[6,21],"VLSI":[7],"circuits.":[8],"He":[9,29],"prefaces":[10],"this":[11],"with":[12,31],"a":[13,32],"discussion":[14,33],"of":[15,24,34],"power":[16,26],"consumption":[17],"that":[18],"gives":[19],"reasons":[20],"and":[22],"consequences":[23],"increased":[25],"during":[27],"test.":[28],"ends":[30],"the":[35],"opportunity":[36],"to":[37],"use":[38],"such":[39],"in":[41],"varying":[42],"situations.":[43]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":15},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":20},{"year":2014,"cited_by_count":29},{"year":2013,"cited_by_count":29},{"year":2012,"cited_by_count":24}],"updated_date":"2026-05-28T09:10:13.091523","created_date":"2025-10-10T00:00:00"}