{"id":"https://openalex.org/W2054851329","doi":"https://doi.org/10.1109/mdt.1984.5005619","title":"Prototype Debug using ATE","display_name":"Prototype Debug using ATE","publication_year":1984,"publication_date":"1984-05-01","ids":{"openalex":"https://openalex.org/W2054851329","doi":"https://doi.org/10.1109/mdt.1984.5005619","mag":"2054851329"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.1984.5005619","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.1984.5005619","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077646726","display_name":"David Florcik","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122731","display_name":"Digital Wave (United States)","ror":"https://ror.org/02t3fqk56","country_code":"US","type":"company","lineage":["https://openalex.org/I4210122731"]},{"id":"https://openalex.org/I4210162662","display_name":"Digital Equipment (Germany)","ror":"https://ror.org/047vmzn25","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210162662"]}],"countries":["DE","US"],"is_corresponding":true,"raw_author_name":"David Florcik","raw_affiliation_strings":["Digital Equipment Corporation, USA","Digital Equipment Corporation"],"affiliations":[{"raw_affiliation_string":"Digital Equipment Corporation, USA","institution_ids":["https://openalex.org/I4210122731"]},{"raw_affiliation_string":"Digital Equipment Corporation","institution_ids":["https://openalex.org/I4210162662"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109183156","display_name":"D. K. Y. Low","orcid":null},"institutions":[{"id":"https://openalex.org/I4210162662","display_name":"Digital Equipment (Germany)","ror":"https://ror.org/047vmzn25","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210162662"]},{"id":"https://openalex.org/I4210122731","display_name":"Digital Wave (United States)","ror":"https://ror.org/02t3fqk56","country_code":"US","type":"company","lineage":["https://openalex.org/I4210122731"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"David Low","raw_affiliation_strings":["Digital Equipment Corporation, USA","Digital Equipment Corporation"],"affiliations":[{"raw_affiliation_string":"Digital Equipment Corporation, USA","institution_ids":["https://openalex.org/I4210122731"]},{"raw_affiliation_string":"Digital Equipment Corporation","institution_ids":["https://openalex.org/I4210162662"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027603148","display_name":"Martin Roche","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122731","display_name":"Digital Wave (United States)","ror":"https://ror.org/02t3fqk56","country_code":"US","type":"company","lineage":["https://openalex.org/I4210122731"]},{"id":"https://openalex.org/I4210162662","display_name":"Digital Equipment (Germany)","ror":"https://ror.org/047vmzn25","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210162662"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"Martin Roche","raw_affiliation_strings":["Digital Equipment Corporation, USA","Digital Equipment Corporation"],"affiliations":[{"raw_affiliation_string":"Digital Equipment Corporation, USA","institution_ids":["https://openalex.org/I4210122731"]},{"raw_affiliation_string":"Digital Equipment Corporation","institution_ids":["https://openalex.org/I4210162662"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5077646726"],"corresponding_institution_ids":["https://openalex.org/I4210122731","https://openalex.org/I4210162662"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.20330806,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":"2","first_page":"94","last_page":"99"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9854000210762024,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9822999835014343,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9811000227928162,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.7657853364944458},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6741304993629456},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.6528280377388},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5553933382034302},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5460067987442017},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4870627224445343},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.47829896211624146},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.46658068895339966},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.4554838538169861},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4308604896068573},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40991681814193726},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3711918592453003},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.3425324559211731},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.18900525569915771}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.7657853364944458},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6741304993629456},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.6528280377388},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5553933382034302},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5460067987442017},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4870627224445343},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.47829896211624146},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.46658068895339966},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.4554838538169861},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4308604896068573},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40991681814193726},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3711918592453003},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3425324559211731},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.18900525569915771},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdt.1984.5005619","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.1984.5005619","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W5816820","https://openalex.org/W130777441","https://openalex.org/W2090871559","https://openalex.org/W4232687632","https://openalex.org/W6600245427","https://openalex.org/W6605416426"],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W2015265939","https://openalex.org/W2360845672","https://openalex.org/W2165509751","https://openalex.org/W1519425523","https://openalex.org/W2113956642","https://openalex.org/W2158223159","https://openalex.org/W2134869803","https://openalex.org/W2128938169","https://openalex.org/W1792267454"],"abstract_inverted_index":{"A":[0],"less":[1,3],"costly,":[2],"time-consuming":[4],"method":[5],"of":[6,9,94,111],"design":[7,71],"verification":[8],"printed":[10],"circuit":[11],"boards":[12],"would":[13],"permit":[14],"a":[15,27,41,65,80,84,119,138],"faster":[16],"time-to-market":[17],"in":[18,129,141],"`today's":[19],"highly":[20],"competitive":[21],"marketplace.":[22],"Digital":[23],"Equipment's":[24],"staff":[25],"devised":[26],"procedure":[28],"that":[29],"accelerates":[30],"the":[31,62,90,114,126,131],"process":[32,47,124],"with":[33],"ATE":[34],"(using":[35],"dynamic":[36],"high-speed":[37],"functional":[38],"testing":[39],"and":[40,54,69,136,143],"simulation":[42,67,95,101],"pattern":[43],"capturing":[44],"process).":[45],"This":[46,123],"also":[48],"permits":[49],"more":[50,52,55],"rapid,":[51],"efficient,":[53],"accurate":[56],"fault":[57],"isolation.":[58],"For":[59],"this":[60],"method,":[61],"designer":[63],"creates":[64],"hierarchical":[66],"scheme":[68],"writes":[70],"verfication":[72],"tests.":[73],"These":[74],"tests":[75],"are":[76],"used":[77],"to":[78,117],"develop":[79],"test":[81,121],"program":[82],"for":[83,89],"prototype":[85],"board.":[86],"Interface":[87],"signals":[88],"next":[91],"lower":[92],"level":[93,110],"must":[96,103],"be":[97,134],"modeled.":[98,108],"The":[99],"final":[100,127],"model":[102],"have":[104],"all":[105],"device-level":[106],"interconnects":[107],"(The":[109],"automation":[112],"determines":[113],"time":[115,142],"required":[116],"produce":[118],"board":[120,132],"program.)":[122],"emulates":[125],"environment":[128],"which":[130],"will":[133],"located":[135],"accomplishes":[137],"significant":[139],"savings":[140],"cost.":[144]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}