{"id":"https://openalex.org/W7152016936","doi":"https://doi.org/10.1109/mdat.2026.3681880","title":"A Time-Based, Fast-Transient, Capacitor-Less NMOS LDO for a Wide Range of On-Chip Capacitive Loads","display_name":"A Time-Based, Fast-Transient, Capacitor-Less NMOS LDO for a Wide Range of On-Chip Capacitive Loads","publication_year":2026,"publication_date":"2026-04-08","ids":{"openalex":"https://openalex.org/W7152016936","doi":"https://doi.org/10.1109/mdat.2026.3681880"},"language":null,"primary_location":{"id":"doi:10.1109/mdat.2026.3681880","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2026.3681880","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5133173812","display_name":"Lingling Wei","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingling Wei","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0000-6556-6273","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5133228522","display_name":"AoyunSun","orcid":null},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aoyun Sun","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0009-0009-4183-796X","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100599312","display_name":"Zhang Zhang","orcid":"https://orcid.org/0000-0002-3510-4585"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhang Zhang","raw_affiliation_strings":["School of Microelectronics, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3510-4585","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28683896,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"43","issue":"4","first_page":"58","last_page":"68"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.38370001316070557,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.38370001316070557,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.2004999965429306,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.10989999771118164,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.5080999732017517},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.45890000462532043},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.35749998688697815},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.32109999656677246},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.272599995136261}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.612500011920929},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.5080999732017517},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.45890000462532043},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3919000029563904},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.35749998688697815},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.32109999656677246},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3165000081062317},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.272599995136261},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.27000001072883606},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.26930001378059387},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2522999942302704}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2026.3681880","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2026.3681880","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.784491240978241,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G5449546659","display_name":null,"funder_award_id":"2308085MF207","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G7705247925","display_name":null,"funder_award_id":"U19A2053","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320334897","display_name":"Natural Science Foundation of Anhui Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2078318212","https://openalex.org/W2082353820","https://openalex.org/W2769693554","https://openalex.org/W2883603878","https://openalex.org/W2921481678","https://openalex.org/W3082145289","https://openalex.org/W3161924788","https://openalex.org/W4226115173","https://openalex.org/W4386178902","https://openalex.org/W4386230775","https://openalex.org/W4387411131","https://openalex.org/W4403511162"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-08-11T07:18:39.950985","created_date":"2026-04-09T00:00:00"}