{"id":"https://openalex.org/W4413360087","doi":"https://doi.org/10.1109/mdat.2025.3576974","title":"A Growing and Thriving Electronic Design, Automation, and Test Community: A DATE 2025 Perspective","display_name":"A Growing and Thriving Electronic Design, Automation, and Test Community: A DATE 2025 Perspective","publication_year":2025,"publication_date":"2025-08-20","ids":{"openalex":"https://openalex.org/W4413360087","doi":"https://doi.org/10.1109/mdat.2025.3576974"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2025.3576974","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2025.3576974","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design &amp; Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://pure.tue.nl/ws/files/369247383/A_Growing_and_Thriving_Electronic_Design_Automation_and_Test_Community_A_DATE_2025_Perspective.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022136174","display_name":"Aida Todri\u2010Sanial","orcid":"https://orcid.org/0000-0001-8573-2910"},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"Aida Todri-Sanial","raw_affiliation_strings":["Eindhoven University of Technology, Eindhoven, The Netherlands"],"affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041366767","display_name":"Theocharis Theocharides","orcid":"https://orcid.org/0000-0001-7222-9152"},"institutions":[{"id":"https://openalex.org/I34771391","display_name":"University of Cyprus","ror":"https://ror.org/02qjrjx09","country_code":"CY","type":"education","lineage":["https://openalex.org/I34771391"]}],"countries":["CY"],"is_corresponding":false,"raw_author_name":"Theocharis Theocharides","raw_affiliation_strings":["University of Cyprus Aglantzia, Nicosia, Cyprus"],"affiliations":[{"raw_affiliation_string":"University of Cyprus Aglantzia, Nicosia, Cyprus","institution_ids":["https://openalex.org/I34771391"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030335506","display_name":"Valeria Bertacco","orcid":"https://orcid.org/0000-0002-0319-3368"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Valeria Bertacco","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI, USA"],"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074986688","display_name":"Alberto Bosio","orcid":"https://orcid.org/0000-0001-6116-7339"},"institutions":[{"id":"https://openalex.org/I112936343","display_name":"\u00c9cole Centrale de Lyon","ror":"https://ror.org/05s6rge65","country_code":"FR","type":"education","lineage":["https://openalex.org/I112936343","https://openalex.org/I203339264"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alberto Bosio","raw_affiliation_strings":["&#x00C9;cole Centrale de Lyon, &#x00C9;cully, France"],"affiliations":[{"raw_affiliation_string":"&#x00C9;cole Centrale de Lyon, &#x00C9;cully, France","institution_ids":["https://openalex.org/I112936343"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5022136174"],"corresponding_institution_ids":["https://openalex.org/I83019370"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.29147194,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"5","first_page":"93","last_page":"99"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11283","display_name":"Experimental Learning in Engineering","score":0.916100025177002,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11283","display_name":"Experimental Learning in Engineering","score":0.916100025177002,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thriving","display_name":"Thriving","score":0.924504280090332},{"id":"https://openalex.org/keywords/perspective","display_name":"Perspective (graphical)","score":0.7974286675453186},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6119595766067505},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4753035008907318},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3450598120689392},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32096242904663086},{"id":"https://openalex.org/keywords/sociology","display_name":"Sociology","score":0.31145262718200684},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11492189764976501},{"id":"https://openalex.org/keywords/social-science","display_name":"Social science","score":0.08922556042671204}],"concepts":[{"id":"https://openalex.org/C2776745293","wikidata":"https://www.wikidata.org/wiki/Q7798302","display_name":"Thriving","level":2,"score":0.924504280090332},{"id":"https://openalex.org/C12713177","wikidata":"https://www.wikidata.org/wiki/Q1900281","display_name":"Perspective (graphical)","level":2,"score":0.7974286675453186},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6119595766067505},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4753035008907318},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3450598120689392},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32096242904663086},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.31145262718200684},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11492189764976501},{"id":"https://openalex.org/C36289849","wikidata":"https://www.wikidata.org/wiki/Q34749","display_name":"Social science","level":1,"score":0.08922556042671204},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mdat.2025.3576974","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2025.3576974","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design &amp; Test","raw_type":"journal-article"},{"id":"pmh:oai:pure.tue.nl:publications/5013cf4e-444f-48f3-8d84-a28fe4e0034d","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/5013cf4e-444f-48f3-8d84-a28fe4e0034d","pdf_url":"https://pure.tue.nl/ws/files/369247383/A_Growing_and_Thriving_Electronic_Design_Automation_and_Test_Community_A_DATE_2025_Perspective.pdf","source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Todri-Sanial, A, Theocharides, T, Bertacco, V & Bosio, A 2025, 'A Growing and Thriving Electronic Design, Automation, and Test Community : A DATE 2025 Perspective', IEEE Design and Test, vol. 42, no. 5, 11131548, pp. 93-99. https://doi.org/10.1109/MDAT.2025.3576974","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:pure.tue.nl:publications/5013cf4e-444f-48f3-8d84-a28fe4e0034d","is_oa":true,"landing_page_url":"https://research.tue.nl/en/publications/5013cf4e-444f-48f3-8d84-a28fe4e0034d","pdf_url":"https://pure.tue.nl/ws/files/369247383/A_Growing_and_Thriving_Electronic_Design_Automation_and_Test_Community_A_DATE_2025_Perspective.pdf","source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Todri-Sanial, A, Theocharides, T, Bertacco, V & Bosio, A 2025, 'A Growing and Thriving Electronic Design, Automation, and Test Community : A DATE 2025 Perspective', IEEE Design and Test, vol. 42, no. 5, 11131548, pp. 93-99. https://doi.org/10.1109/MDAT.2025.3576974","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4413360087.pdf","grobid_xml":"https://content.openalex.org/works/W4413360087.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W3110653194","https://openalex.org/W1964821925","https://openalex.org/W2165054589","https://openalex.org/W2316932825","https://openalex.org/W4401925798","https://openalex.org/W4375951624","https://openalex.org/W3209322685","https://openalex.org/W2625819229","https://openalex.org/W2893149153"],"abstract_inverted_index":{"The":[0],"Design,":[1],"Automation,":[2],"and":[3,21,26,28,32,36,41],"Test":[4],"in":[5,30],"Europe":[6],"(DATE)":[7],"Conference":[8],"is":[9],"a":[10],"premier":[11],"international":[12],"event":[13],"providing":[14],"unique":[15],"networking":[16],"opportunities,":[17],"bringing":[18],"together":[19],"designers":[20],"design":[22],"automation":[23],"users,":[24],"researchers":[25],"vendors,":[27],"specialists":[29],"hardware":[31],"software":[33],"design,":[34],"test,":[35],"manufacturing":[37],"of":[38],"electronic":[39],"circuits":[40],"systems.":[42]},"counts_by_year":[],"updated_date":"2026-04-04T08:04:53.788161","created_date":"2025-10-10T00:00:00"}
