{"id":"https://openalex.org/W4391807587","doi":"https://doi.org/10.1109/mdat.2024.3365958","title":"A BIST Approach to Approximate Co-Testing of Embedded Data Converters","display_name":"A BIST Approach to Approximate Co-Testing of Embedded Data Converters","publication_year":2024,"publication_date":"2024-02-14","ids":{"openalex":"https://openalex.org/W4391807587","doi":"https://doi.org/10.1109/mdat.2024.3365958"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2024.3365958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2024.3365958","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041667331","display_name":"Kushagra Bhatheja","orcid":"https://orcid.org/0000-0003-3283-7449"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Kushagra Bhatheja","raw_affiliation_strings":["Texas Instruments Inc, Tucson, AZ, USA"],"raw_orcid":"https://orcid.org/0000-0003-3283-7449","affiliations":[{"raw_affiliation_string":"Texas Instruments Inc, Tucson, AZ, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023673688","display_name":"Shravan K. Chaganti","orcid":"https://orcid.org/0000-0001-5930-5894"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shravan Chaganti","raw_affiliation_strings":["Texas Instruments Inc, Houston, TX, USA"],"raw_orcid":"https://orcid.org/0000-0001-5930-5894","affiliations":[{"raw_affiliation_string":"Texas Instruments Inc, Houston, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093926612","display_name":"Johnathan Leisinger","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Johnathan Leisinger","raw_affiliation_strings":["Iowa State University, Ames, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093828063","display_name":"Emmanuel Nti Darko","orcid":"https://orcid.org/0009-0003-8237-2384"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Emmanuel Nti Darko","raw_affiliation_strings":["Iowa State University, Ames, IA, USA"],"raw_orcid":"https://orcid.org/0009-0003-8237-2384","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017653134","display_name":"Isaac Bruce","orcid":"https://orcid.org/0000-0003-3959-1293"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Isaac Bruce","raw_affiliation_strings":["Iowa State University, Ames, IA, USA"],"raw_orcid":"https://orcid.org/0000-0003-3959-1293","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Iowa State University, Ames, IA, USA"],"raw_orcid":"https://orcid.org/0000-0002-5938-6329","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5041667331"],"corresponding_institution_ids":["https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":3.3205,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.92843808,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"41","issue":"3","first_page":"21","last_page":"28"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.8375486135482788},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6111494898796082},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5734735727310181},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5579186677932739},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.43369078636169434},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4323377013206482},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4101906418800354},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.20360806584358215},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1631767749786377},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09904992580413818},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08845844864845276}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.8375486135482788},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6111494898796082},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5734735727310181},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5579186677932739},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.43369078636169434},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4323377013206482},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4101906418800354},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.20360806584358215},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1631767749786377},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09904992580413818},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08845844864845276},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2024.3365958","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2024.3365958","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2006786321","https://openalex.org/W2101752872","https://openalex.org/W2122877993","https://openalex.org/W2152310581","https://openalex.org/W2578010358","https://openalex.org/W2781391663","https://openalex.org/W2871035070","https://openalex.org/W2871677142","https://openalex.org/W2913356818","https://openalex.org/W3084659084","https://openalex.org/W4312719148","https://openalex.org/W4387611377"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W2354856110","https://openalex.org/W2168668096","https://openalex.org/W3215142653","https://openalex.org/W2150113875","https://openalex.org/W2025912852"],"abstract_inverted_index":{"Increasing":[0],"complexity":[1],"of":[2,32,105],"integrated":[3],"circuits":[4],"(ICs)":[5],"is":[6,96],"making":[7],"post-production":[8],"tests":[9],"expensive":[10],"and":[11,44,55,93],"cumbersome.":[12],"Approximate":[13],"testing":[14,27,31],"can":[15,58],"help":[16],"alleviate":[17],"these":[18],"issues.":[19],"The":[20,36,65],"paper":[21],"proposes":[22],"a":[23,90],"BIST":[24],"based":[25],"approximate":[26],"approach":[28],"for":[29,68],"linearity":[30],"embedded":[33],"data":[34],"converters.":[35],"methodology":[37,88],"does":[38],"not":[39],"require":[40],"any":[41],"external":[42],"equipment":[43],"counts":[45],"on":[46,89],"the":[47,69,87,106],"fact":[48],"that":[49,82],"most":[50],"SoCs":[51],"contain":[52],"both":[53],"ADC":[54,95],"DAC":[56,92],"which":[57],"be":[59],"used":[60],"to":[61],"test":[62],"each":[63],"other.":[64],"precision":[66],"requirements":[67],"signal":[70],"source/measurement":[71],"device":[72],"are":[73],"removed":[74],"through":[75],"an":[76],"algorithmic":[77],"technique.":[78],"Simulation":[79],"results":[80],"demonstrate":[81],"INL":[83],"estimation":[84],"error":[85],"using":[86],"14-bit":[91,94],"less":[97],"than":[98],"0.7":[99],"LSBs":[100],"across":[101],"100":[102],"random":[103],"iterations":[104],"DAC/ADC.":[107]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}