{"id":"https://openalex.org/W4383113583","doi":"https://doi.org/10.1109/mdat.2023.3292208","title":"Efficient SoC Security Monitoring: Quality Attributes and Potential Solutions","display_name":"Efficient SoC Security Monitoring: Quality Attributes and Potential Solutions","publication_year":2023,"publication_date":"2023-07-04","ids":{"openalex":"https://openalex.org/W4383113583","doi":"https://doi.org/10.1109/mdat.2023.3292208"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2023.3292208","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2023.3292208","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089442585","display_name":"Mridha Md Mashahedur Rahman","orcid":"https://orcid.org/0000-0001-9865-5061"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Mridha Md Mashahedur Rahman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-9865-5061","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092398902","display_name":"Shams Tarek","orcid":"https://orcid.org/0000-0001-7671-6409"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shams Tarek","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"],"raw_orcid":"https://orcid.org/0000-0001-7671-6409","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031747364","display_name":"Kimia Zamiri Azar","orcid":"https://orcid.org/0000-0001-5684-100X"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kimia Zamiri Azar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102766705","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0009-0006-8410-2347"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark M. Tehranipoor","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019820972","display_name":"Farimah Farahmandi","orcid":"https://orcid.org/0000-0003-1535-0938"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Farimah Farahmandi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5089442585"],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":2.9924,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.9138982,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"41","issue":"4","first_page":"26","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9815000295639038,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6632113456726074},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5872567296028137},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.5807533264160156},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5214670896530151},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.3493931293487549},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.17574119567871094}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6632113456726074},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5872567296028137},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.5807533264160156},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5214670896530151},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3493931293487549},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.17574119567871094},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2023.3292208","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2023.3292208","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2067569648","https://openalex.org/W2403062295","https://openalex.org/W3134493110","https://openalex.org/W3163316191","https://openalex.org/W3164170653","https://openalex.org/W3184144680","https://openalex.org/W4241490134","https://openalex.org/W4244257922","https://openalex.org/W6675797392"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W4391913857","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"With":[0],"the":[1,46,57,66,101,118],"ever-increasing":[2],"size":[3],"and":[4,36],"complexity":[5],"of":[6,45,59,68,86],"system-on-chip":[7],"(SoC)":[8],"architectures,":[9],"where":[10],"numerous":[11],"parties":[12],"(either":[13],"trusted":[14],"or":[15],"untrusted)":[16],"are":[17],"involved":[18],"each":[19,114],"playing":[20],"a":[21,84],"crucial":[22],"role":[23],"(e.g.,":[24],"providing":[25],"3rd-party":[26],"intellectual":[27],"properties":[28],"(IPs),":[29],"accomplishing":[30],"design":[31],"stages":[32],"like":[33],"fabrication,":[34],"testing,":[35],"packaging),":[37],"various":[38],"hardware-oriented":[39],"security":[40,53,61,91,109],"threats":[41,50],"have":[42,111],"emerged.":[43],"One":[44],"solutions":[47,76,93,106],"against":[48],"such":[49],"is":[51],"SoC-level":[52],"monitoring,":[54],"which":[55],"enables":[56],"possibility":[58],"validating":[60],"policies.":[62],"However,":[63],"due":[64],"to":[65,97],"lack":[67],"comprehensive":[69],"research":[70],"in":[71],"this":[72],"field,":[73],"its":[74],"current":[75],"suffer":[77],"from":[78],"significant":[79],"flaws.":[80],"This":[81],"paper":[82],"identifies":[83],"set":[85],"quality":[87,120],"attributes":[88],"for":[89,107],"SoC":[90,108],"monitoring":[92,110],"(which":[94],"mostly":[95],"failed":[96],"be":[98],"met":[99],"by":[100],"existing":[102],"solutions).":[103],"The":[104],"potential":[105],"been":[112],"defined":[113],"evaluated":[115],"based":[116],"on":[117],"identified":[119],"attributes.":[121]},"counts_by_year":[{"year":2024,"cited_by_count":10}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}