{"id":"https://openalex.org/W4379528722","doi":"https://doi.org/10.1109/mdat.2023.3283349","title":"Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond","display_name":"Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond","publication_year":2023,"publication_date":"2023-06-07","ids":{"openalex":"https://openalex.org/W4379528722","doi":"https://doi.org/10.1109/mdat.2023.3283349"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2023.3283349","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2023.3283349","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101967980","display_name":"Ke Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I26538001","display_name":"San Diego State University","ror":"https://ror.org/0264fdx42","country_code":"US","type":"education","lineage":["https://openalex.org/I26538001"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ke Huang","raw_affiliation_strings":["San Diego State University, San Diego, CA, USA"],"raw_orcid":"https://orcid.org/0000-0002-1587-9877","affiliations":[{"raw_affiliation_string":"San Diego State University, San Diego, CA, USA","institution_ids":["https://openalex.org/I26538001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100724226","display_name":"Yu Liu","orcid":"https://orcid.org/0000-0002-2082-2904"},"institutions":[{"id":"https://openalex.org/I4210101778","display_name":"Samsung (United States)","ror":"https://ror.org/01bfbvm65","country_code":"US","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4210101778"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Liu","raw_affiliation_strings":["Samsung Research, Plano, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samsung Research, Plano, TX, USA","institution_ids":["https://openalex.org/I4210101778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060669480","display_name":"Nenad Korolija","orcid":"https://orcid.org/0000-0003-2224-8157"},"institutions":[{"id":"https://openalex.org/I4068193","display_name":"University of Belgrade","ror":"https://ror.org/02qsmb048","country_code":"RS","type":"education","lineage":["https://openalex.org/I4068193"]}],"countries":["RS"],"is_corresponding":false,"raw_author_name":"Nenad Korolija","raw_affiliation_strings":["University of Belgrade, Belgrade, Serbia"],"raw_orcid":"https://orcid.org/0000-0003-2224-8157","affiliations":[{"raw_affiliation_string":"University of Belgrade, Belgrade, Serbia","institution_ids":["https://openalex.org/I4068193"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039431688","display_name":"John M. Carulli","orcid":null},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John M. Carulli","raw_affiliation_strings":["Globalfoundries, Malta, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Globalfoundries, Malta, NY, USA","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078818440","display_name":"Yiorgos Makris","orcid":"https://orcid.org/0000-0002-4322-0068"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yiorgos Makris","raw_affiliation_strings":["Electrical and Computer Engineering Department, The University of Texas at Dallas, Richardson, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-4322-0068","affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, The University of Texas at Dallas, Richardson, TX, USA","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101967980"],"corresponding_institution_ids":["https://openalex.org/I26538001"],"apc_list":null,"apc_paid":null,"fwci":1.197,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76181042,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"41","issue":"2","first_page":"15","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9812999963760376,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.6711643934249878},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6465580463409424},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.506756603717804},{"id":"https://openalex.org/keywords/variety","display_name":"Variety (cybernetics)","score":0.45589756965637207},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.40817609429359436},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.3658323287963867},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32418859004974365},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.23648834228515625},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.21269461512565613},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14447540044784546}],"concepts":[{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.6711643934249878},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6465580463409424},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.506756603717804},{"id":"https://openalex.org/C136197465","wikidata":"https://www.wikidata.org/wiki/Q1729295","display_name":"Variety (cybernetics)","level":2,"score":0.45589756965637207},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.40817609429359436},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3658323287963867},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32418859004974365},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.23648834228515625},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.21269461512565613},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14447540044784546},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2023.3283349","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2023.3283349","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2035407142","https://openalex.org/W2040298438","https://openalex.org/W2099101940","https://openalex.org/W2554877499","https://openalex.org/W2737813463","https://openalex.org/W2903835765","https://openalex.org/W2911385329","https://openalex.org/W2921563893","https://openalex.org/W2969597218","https://openalex.org/W3007510053","https://openalex.org/W3041142214","https://openalex.org/W3081015702","https://openalex.org/W3084879046","https://openalex.org/W3088909405","https://openalex.org/W3089544536","https://openalex.org/W3207199251","https://openalex.org/W4211263472","https://openalex.org/W4296593671"],"related_works":["https://openalex.org/W2032233321","https://openalex.org/W3121970507","https://openalex.org/W2110028391","https://openalex.org/W54497855","https://openalex.org/W217960748","https://openalex.org/W3125814499","https://openalex.org/W2090827041","https://openalex.org/W2094012830","https://openalex.org/W187246281","https://openalex.org/W2079194830"],"abstract_inverted_index":{"This":[0],"article":[1],"summarizes":[2],"the":[3],"current":[4],"approaches":[5],"in":[6],"using":[7],"statistical":[8],"methods":[9],"to":[10],"identify":[11],"recycled":[12],"hardware,":[13],"including":[14],"IC,":[15],"FPGA,":[16],"memories,":[17],"and":[18],"network":[19],"components.":[20],"\u2014Gang":[21],"Qu,":[22],"University":[23],"of":[24],"Maryland,":[25],"USA":[26]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}