{"id":"https://openalex.org/W4378805006","doi":"https://doi.org/10.1109/mdat.2023.3281733","title":"Safety Ethics for Design and Test of Automated Driving Features","display_name":"Safety Ethics for Design and Test of Automated Driving Features","publication_year":2023,"publication_date":"2023-05-31","ids":{"openalex":"https://openalex.org/W4378805006","doi":"https://doi.org/10.1109/mdat.2023.3281733"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2023.3281733","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2023.3281733","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036158209","display_name":"Philip Koopman","orcid":"https://orcid.org/0000-0003-1658-2386"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Philip Koopman","raw_affiliation_strings":["Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA"],"raw_orcid":"https://orcid.org/0000-0003-1658-2386","affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, Carnegie Mellon University, Pittsburgh, PA, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050703151","display_name":"William H. Widen","orcid":null},"institutions":[{"id":"https://openalex.org/I145608581","display_name":"University of Miami","ror":"https://ror.org/02dgjyy92","country_code":"US","type":"education","lineage":["https://openalex.org/I145608581"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"William Widen","raw_affiliation_strings":["University of Miami School of Law, Coral Gables, FL, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Miami School of Law, Coral Gables, FL, USA","institution_ids":["https://openalex.org/I145608581"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6202,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.66278465,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"41","issue":"1","first_page":"17","last_page":"24"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11099","display_name":"Autonomous Vehicle Technology and Safety","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11099","display_name":"Autonomous Vehicle Technology and Safety","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10525","display_name":"Human-Automation Interaction and Safety","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/3207","display_name":"Social Psychology"},"field":{"id":"https://openalex.org/fields/32","display_name":"Psychology"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6340624094009399},{"id":"https://openalex.org/keywords/test-design","display_name":"Test design","score":0.43580162525177},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39881521463394165},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3928171396255493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3640996813774109},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.35508492588996887},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.18393823504447937},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10635340213775635},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07046696543693542},{"id":"https://openalex.org/keywords/biology","display_name":"Biology","score":0.07040345668792725}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6340624094009399},{"id":"https://openalex.org/C11017329","wikidata":"https://www.wikidata.org/wiki/Q7705763","display_name":"Test design","level":3,"score":0.43580162525177},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39881521463394165},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3928171396255493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3640996813774109},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.35508492588996887},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.18393823504447937},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10635340213775635},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07046696543693542},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.07040345668792725},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2023.3281733","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2023.3281733","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","score":0.5400000214576721,"display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W4230141506","https://openalex.org/W4313064694","https://openalex.org/W7066577288"],"related_works":["https://openalex.org/W2384146448","https://openalex.org/W2810041922","https://openalex.org/W4243083202","https://openalex.org/W1034637324","https://openalex.org/W1540608021","https://openalex.org/W2127722144","https://openalex.org/W2608593081","https://openalex.org/W2367642278","https://openalex.org/W2765249889","https://openalex.org/W1970368438"],"abstract_inverted_index":{"Autonomous":[0],"vehicles":[1],"promise":[2],"to":[3,29],"revolutionize":[4],"transportation,":[5],"with":[6],"benefits":[7],"such":[8],"as":[9],"improved":[10],"safety,":[11],"fuel":[12],"efficiency,":[13],"and":[14,36],"quality":[15],"of":[16,38],"life.":[17],"This":[18],"article":[19],"discusses":[20],"the":[21,34],"ethical":[22],"dilemmas":[23],"that":[24],"must":[25],"be":[26],"urgently":[27],"addressed":[28],"prevent":[30],"safety":[31],"lapses":[32],"during":[33],"engineering":[35],"deployment":[37],"emerging":[39],"autonomous":[40],"vehicles.":[41]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}