{"id":"https://openalex.org/W4205581926","doi":"https://doi.org/10.1109/mdat.2022.3143427","title":"Machine Learning and Algorithms: Let Us Team Up for EDA","display_name":"Machine Learning and Algorithms: Let Us Team Up for EDA","publication_year":2022,"publication_date":"2022-01-14","ids":{"openalex":"https://openalex.org/W4205581926","doi":"https://doi.org/10.1109/mdat.2022.3143427"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2022.3143427","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2022.3143427","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029928585","display_name":"Haoxing Ren","orcid":"https://orcid.org/0000-0003-1028-3860"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Haoxing Ren","raw_affiliation_strings":["NVIDIA Corporation, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation, Austin, TX, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010156116","display_name":"Brucek Khailany","orcid":"https://orcid.org/0000-0002-7584-3489"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brucek Khailany","raw_affiliation_strings":["NVIDIA Corporation, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA Corporation, Austin, TX, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087082539","display_name":"Matthew Fojtik","orcid":"https://orcid.org/0000-0003-3138-9293"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Fojtik","raw_affiliation_strings":["NVIDIA, Durham, NC, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA, Durham, NC, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019641855","display_name":"Yanqing Zhang","orcid":"https://orcid.org/0000-0001-9030-5876"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yanqing Zhang","raw_affiliation_strings":["NVIDIA, Inc., Santa Clara, CA, USA"],"affiliations":[{"raw_affiliation_string":"NVIDIA, Inc., Santa Clara, CA, USA","institution_ids":["https://openalex.org/I4210127875"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5029928585"],"corresponding_institution_ids":["https://openalex.org/I4210127875"],"apc_list":null,"apc_paid":null,"fwci":0.9148,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.71756987,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"40","issue":"1","first_page":"70","last_page":"76"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6513418555259705},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6140190958976746},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.5943576693534851},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5239289402961731},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.5105725526809692},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.48916080594062805},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4802701473236084},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.16700589656829834},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1646886169910431}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6513418555259705},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6140190958976746},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.5943576693534851},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5239289402961731},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.5105725526809692},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.48916080594062805},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4802701473236084},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.16700589656829834},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1646886169910431},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2022.3143427","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2022.3143427","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.44999998807907104}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2122701159","https://openalex.org/W2266612535","https://openalex.org/W2346205343","https://openalex.org/W2736601468","https://openalex.org/W2795746309","https://openalex.org/W2899885603","https://openalex.org/W2995194170","https://openalex.org/W3018195242","https://openalex.org/W3091933103","https://openalex.org/W3127191906","https://openalex.org/W3183370799","https://openalex.org/W3185898267","https://openalex.org/W4254271781","https://openalex.org/W6678494045","https://openalex.org/W6741002519","https://openalex.org/W6750262148","https://openalex.org/W6770812723","https://openalex.org/W6776921880"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2544423928","https://openalex.org/W2406177692","https://openalex.org/W3214257365","https://openalex.org/W4252660273","https://openalex.org/W1976154696","https://openalex.org/W4247948903","https://openalex.org/W2108092114","https://openalex.org/W2998637246"],"abstract_inverted_index":{"This":[0],"article":[1],"argues":[2],"that":[3],"the":[4,40],"integration":[5],"of":[6,22],"machine":[7],"learning":[8],"(ML)":[9],"techniques":[10],"with":[11],"well-established":[12],"algorithmic":[13],"approaches":[14],"can":[15],"overcome":[16],"challenges":[17],"faced":[18],"by":[19],"current":[20],"applications":[21],"ML":[23],"to":[24],"electronic":[25],"design":[26],"automation":[27],"problems.":[28],"The":[29],"standard":[30],"cell":[31],"routing":[32],"problem":[33],"is":[34],"used":[35],"as":[36],"a":[37],"showcase":[38],"for":[39],"proposed":[41],"approach.":[42]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}