{"id":"https://openalex.org/W2978448132","doi":"https://doi.org/10.1109/mdat.2019.2944094","title":"The Impact of Ferroelectric FETs on Digital and Analog Circuits and Architectures","display_name":"The Impact of Ferroelectric FETs on Digital and Analog Circuits and Architectures","publication_year":2019,"publication_date":"2019-10-03","ids":{"openalex":"https://openalex.org/W2978448132","doi":"https://doi.org/10.1109/mdat.2019.2944094","mag":"2978448132"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2019.2944094","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2019.2944094","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100373745","display_name":"Xiaohong Chen","orcid":"https://orcid.org/0000-0002-9797-8384"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaoming Chen","raw_affiliation_strings":["Chinese Academy of Sciences"],"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062894678","display_name":"Xiaoyu Sun","orcid":"https://orcid.org/0000-0001-5337-5680"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoyu Sun","raw_affiliation_strings":["Georgia Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044516117","display_name":"Panni Wang","orcid":"https://orcid.org/0000-0001-8559-2727"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Panni Wang","raw_affiliation_strings":["Georgia Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036105393","display_name":"Suman Datta","orcid":"https://orcid.org/0000-0001-6044-5173"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suman Datta","raw_affiliation_strings":["University of Notre Dame"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100600905","display_name":"Xiaobo Sharon Hu","orcid":"https://orcid.org/0000-0002-6636-9738"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaobo Sharon Hu","raw_affiliation_strings":["University of Notre Dame"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071383109","display_name":"Xunzhao Yin","orcid":"https://orcid.org/0000-0003-4656-9545"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xunzhao Yin","raw_affiliation_strings":["University of Notre Dame"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024336276","display_name":"Matthew Jerry","orcid":"https://orcid.org/0000-0001-7220-1854"},"institutions":[{"id":"https://openalex.org/I4210111972","display_name":"Micron Biomedical (United States)","ror":"https://ror.org/02383bz17","country_code":"US","type":"company","lineage":["https://openalex.org/I4210111972"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Jerry","raw_affiliation_strings":["Micron"],"affiliations":[{"raw_affiliation_string":"Micron","institution_ids":["https://openalex.org/I4210111972"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054894631","display_name":"Shimeng Yu","orcid":"https://orcid.org/0000-0002-0068-3652"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shimeng Yu","raw_affiliation_strings":["Georgia Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053712676","display_name":"Ann Franchesca Laguna","orcid":"https://orcid.org/0000-0001-8267-1040"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ann Franchesca Laguna","raw_affiliation_strings":["University of Notre Dame"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075633314","display_name":"Kai Ni","orcid":"https://orcid.org/0000-0002-3628-3431"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kai Ni","raw_affiliation_strings":["University of Notre Dame"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003032564","display_name":"Michael Niemier","orcid":"https://orcid.org/0000-0001-7776-4306"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael T. Niemier","raw_affiliation_strings":["University of Notre Dame, Notre Dame, USA"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame, Notre Dame, USA","institution_ids":["https://openalex.org/I107639228"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064528017","display_name":"Dayane Reis","orcid":"https://orcid.org/0000-0002-8571-1308"},"institutions":[{"id":"https://openalex.org/I107639228","display_name":"University of Notre Dame","ror":"https://ror.org/00mkhxb43","country_code":"US","type":"education","lineage":["https://openalex.org/I107639228"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dayane Reis","raw_affiliation_strings":["University of Notre Dame"],"affiliations":[{"raw_affiliation_string":"University of Notre Dame","institution_ids":["https://openalex.org/I107639228"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5100373745"],"corresponding_institution_ids":["https://openalex.org/I19820366"],"apc_list":null,"apc_paid":null,"fwci":1.4307,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.82524755,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"37","issue":"1","first_page":"79","last_page":"99"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7577368021011353},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5991899371147156},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5725405216217041},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5134214162826538},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5127474069595337},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4664700925350189},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4649898409843445},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.4286785125732422},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3459402918815613},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3297552466392517}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7577368021011353},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5991899371147156},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5725405216217041},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5134214162826538},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5127474069595337},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4664700925350189},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4649898409843445},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4286785125732422},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3459402918815613},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3297552466392517}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2019.2944094","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2019.2944094","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6399999856948853,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":91,"referenced_works":["https://openalex.org/W1486162840","https://openalex.org/W1682403713","https://openalex.org/W1836465849","https://openalex.org/W1902934009","https://openalex.org/W2008987170","https://openalex.org/W2013028205","https://openalex.org/W2016106189","https://openalex.org/W2030765577","https://openalex.org/W2086709250","https://openalex.org/W2102255233","https://openalex.org/W2105011467","https://openalex.org/W2113645429","https://openalex.org/W2125469204","https://openalex.org/W2141546789","https://openalex.org/W2170510975","https://openalex.org/W2285660444","https://openalex.org/W2290316169","https://openalex.org/W2290702954","https://openalex.org/W2300242332","https://openalex.org/W2307193480","https://openalex.org/W2319920447","https://openalex.org/W2331783522","https://openalex.org/W2342750693","https://openalex.org/W2345609443","https://openalex.org/W2399033357","https://openalex.org/W2407339173","https://openalex.org/W2407647853","https://openalex.org/W2424280650","https://openalex.org/W2492987453","https://openalex.org/W2508602506","https://openalex.org/W2515432102","https://openalex.org/W2521149585","https://openalex.org/W2537444166","https://openalex.org/W2583220202","https://openalex.org/W2588666075","https://openalex.org/W2593172471","https://openalex.org/W2612094091","https://openalex.org/W2612333299","https://openalex.org/W2613103714","https://openalex.org/W2615444103","https://openalex.org/W2620977911","https://openalex.org/W2622875686","https://openalex.org/W2627034335","https://openalex.org/W2745040423","https://openalex.org/W2786159202","https://openalex.org/W2787453651","https://openalex.org/W2787759178","https://openalex.org/W2792001294","https://openalex.org/W2792488046","https://openalex.org/W2793168176","https://openalex.org/W2798654995","https://openalex.org/W2798836702","https://openalex.org/W2799043997","https://openalex.org/W2800717486","https://openalex.org/W2885334747","https://openalex.org/W2889210320","https://openalex.org/W2893163116","https://openalex.org/W2894696827","https://openalex.org/W2894948827","https://openalex.org/W2896122000","https://openalex.org/W2898878850","https://openalex.org/W2899077824","https://openalex.org/W2906313120","https://openalex.org/W2912270587","https://openalex.org/W2921982984","https://openalex.org/W2946189125","https://openalex.org/W2949117887","https://openalex.org/W2963114950","https://openalex.org/W2963385418","https://openalex.org/W2963446207","https://openalex.org/W2963771263","https://openalex.org/W3098133019","https://openalex.org/W4206262605","https://openalex.org/W4293407356","https://openalex.org/W6629026720","https://openalex.org/W6638667902","https://openalex.org/W6639703010","https://openalex.org/W6675347859","https://openalex.org/W6678466197","https://openalex.org/W6698200048","https://openalex.org/W6700264148","https://openalex.org/W6712906272","https://openalex.org/W6717751050","https://openalex.org/W6734548531","https://openalex.org/W6737696902","https://openalex.org/W6747913522","https://openalex.org/W6748144487","https://openalex.org/W6748714585","https://openalex.org/W6750683844","https://openalex.org/W6756063398","https://openalex.org/W6757135734"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2381855323","https://openalex.org/W4254962629","https://openalex.org/W2113924398","https://openalex.org/W2001286211","https://openalex.org/W2013781131","https://openalex.org/W2151446372","https://openalex.org/W2058286800","https://openalex.org/W969526214","https://openalex.org/W2138543354"],"abstract_inverted_index":{"Editor's":[0],"note:":[1],"Semiconductor":[2],"industry":[3],"is":[4],"steadily":[5],"on":[6,50],"the":[7,31,53,77],"quest":[8],"for":[9],"emerging":[10,34,68],"devices":[11,35],"and":[12,20,59,85],"device":[13,57],"technologies":[14,69],"that":[15,36],"lead":[16],"to":[17,63],"higher":[18,21],"performance":[19],"efficiency":[22],"of":[23,33,79],"computing":[24],"over":[25],"CMOS":[26,64],"technology.":[27],"This":[28],"tutorial":[29],"introduces":[30],"potential":[32],"integrate":[37],"ferroelectric":[38],"material":[39],"into":[40],"digital":[41],"as":[42,44,71],"well":[43],"analog":[45],"circuits.":[46],"With":[47],"a":[48],"focus":[49],"FeFET":[51,80],"technology,":[52],"authors":[54],"first":[55],"present":[56],"characteristics,":[58],"advantages":[60],"in":[61,82],"comparison":[62],"but":[65],"also":[66],"other":[67],"such":[70],"RRAM.":[72],"The":[73],"article":[74],"comprehensively":[75],"demonstrates":[76],"use":[78],"technology":[81],"circuits,":[83],"architectures,":[84],"applications.":[86]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}