{"id":"https://openalex.org/W2954567619","doi":"https://doi.org/10.1109/mdat.2019.2908643","title":"Practices and Challenges for Achieving Functional Safety of Modern Automotive SoCs","display_name":"Practices and Challenges for Achieving Functional Safety of Modern Automotive SoCs","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2954567619","doi":"https://doi.org/10.1109/mdat.2019.2908643","mag":"2954567619"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2019.2908643","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2019.2908643","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100344172","display_name":"Wen Chen","orcid":"https://orcid.org/0000-0002-6721-6266"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wen Chen","raw_affiliation_strings":["NXP Semiconductors, Austin, TX, USA"],"raw_orcid":"https://orcid.org/0000-0002-6721-6266","affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Austin, TX, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108510816","display_name":"Jayanta Bhadra","orcid":null},"institutions":[{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Jayanta Bhadra","raw_affiliation_strings":["Advanced Micro Devices"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Micro Devices","institution_ids":["https://openalex.org/I1311921367"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2335,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.53130669,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"36","issue":"4","first_page":"31","last_page":"47"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/functional-safety","display_name":"Functional safety","score":0.8321995139122009},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.8016242980957031},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.676314115524292},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.6673871278762817},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.5660426616668701},{"id":"https://openalex.org/keywords/safety-assurance","display_name":"Safety assurance","score":0.5370736122131348},{"id":"https://openalex.org/keywords/advanced-driver-assistance-systems","display_name":"Advanced driver assistance systems","score":0.500495195388794},{"id":"https://openalex.org/keywords/best-practice","display_name":"Best practice","score":0.4613364636898041},{"id":"https://openalex.org/keywords/engineering-management","display_name":"Engineering management","score":0.45069628953933716},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4332291781902313},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.39273661375045776},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.3757212460041046},{"id":"https://openalex.org/keywords/process-management","display_name":"Process management","score":0.3690832257270813},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.34828507900238037},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33601588010787964},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.22899076342582703},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.13741731643676758},{"id":"https://openalex.org/keywords/management","display_name":"Management","score":0.10589581727981567}],"concepts":[{"id":"https://openalex.org/C148493468","wikidata":"https://www.wikidata.org/wiki/Q2646951","display_name":"Functional safety","level":2,"score":0.8321995139122009},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.8016242980957031},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.676314115524292},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.6673871278762817},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.5660426616668701},{"id":"https://openalex.org/C112805685","wikidata":"https://www.wikidata.org/wiki/Q10566551","display_name":"Safety assurance","level":2,"score":0.5370736122131348},{"id":"https://openalex.org/C87833898","wikidata":"https://www.wikidata.org/wiki/Q1060280","display_name":"Advanced driver assistance systems","level":2,"score":0.500495195388794},{"id":"https://openalex.org/C184356942","wikidata":"https://www.wikidata.org/wiki/Q830382","display_name":"Best practice","level":2,"score":0.4613364636898041},{"id":"https://openalex.org/C110354214","wikidata":"https://www.wikidata.org/wiki/Q6314146","display_name":"Engineering management","level":1,"score":0.45069628953933716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4332291781902313},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.39273661375045776},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.3757212460041046},{"id":"https://openalex.org/C195094911","wikidata":"https://www.wikidata.org/wiki/Q14167904","display_name":"Process management","level":1,"score":0.3690832257270813},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.34828507900238037},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33601588010787964},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.22899076342582703},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.13741731643676758},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.10589581727981567},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2019.2908643","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2019.2908643","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1600732579","https://openalex.org/W1905213452","https://openalex.org/W1977716053","https://openalex.org/W1978353289","https://openalex.org/W1980073965","https://openalex.org/W1986027887","https://openalex.org/W2039267132","https://openalex.org/W2095705004","https://openalex.org/W2102741949","https://openalex.org/W2111934918","https://openalex.org/W2121337044","https://openalex.org/W2130022711","https://openalex.org/W2132663077","https://openalex.org/W2148605318","https://openalex.org/W2212765426","https://openalex.org/W2342204193","https://openalex.org/W2342840547","https://openalex.org/W2608763036","https://openalex.org/W2626329331","https://openalex.org/W2753775551","https://openalex.org/W2767260595","https://openalex.org/W6674330103","https://openalex.org/W6704559304"],"related_works":["https://openalex.org/W4308089085","https://openalex.org/W2071209111","https://openalex.org/W2016459326","https://openalex.org/W2358743281","https://openalex.org/W2903094435","https://openalex.org/W2083030475","https://openalex.org/W2239809351","https://openalex.org/W2102330754","https://openalex.org/W4225988977","https://openalex.org/W2954567619"],"abstract_inverted_index":{"Editor's":[0],"note:":[1],"Assurance":[2],"of":[3,10,18],"functional":[4,41],"safety":[5,42],"is":[6],"a":[7],"critical":[8],"component":[9],"automotive":[11],"SoC":[12],"design,":[13],"specifically":[14],"in":[15],"the":[16,30,36],"context":[17],"autonomous":[19],"driving":[20],"and":[21,43],"advanced":[22],"driver":[23],"assistance.":[24],"This":[25],"tutorial,":[26],"written":[27],"based":[28],"on":[29],"authors'":[31],"strong":[32],"industry":[33],"experience,":[34],"outlines":[35],"key":[37],"challenges":[38],"associated":[39],"with":[40],"practices":[44],"as":[45,47],"well":[46],"standards":[48],"to":[49],"address":[50],"them.-Swarup":[51],"Bhunia,":[52],"Case":[53],"Western":[54],"Reserve":[55],"University.":[56]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}