{"id":"https://openalex.org/W2913865232","doi":"https://doi.org/10.1109/mdat.2019.2899054","title":"On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration","display_name":"On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration","publication_year":2019,"publication_date":"2019-02-13","ids":{"openalex":"https://openalex.org/W2913865232","doi":"https://doi.org/10.1109/mdat.2019.2899054","mag":"2913865232"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2019.2899054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2019.2899054","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101755936","display_name":"Jae Woong Jeong","orcid":"https://orcid.org/0000-0001-6827-3193"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]},{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Jae Woong Jeong","raw_affiliation_strings":["Intel Corporation and Arizona State University"],"affiliations":[{"raw_affiliation_string":"Intel Corporation and Arizona State University","institution_ids":["https://openalex.org/I1343180700","https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047190948","display_name":"Jennifer Kitchen","orcid":"https://orcid.org/0000-0002-3187-7281"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jennifer Kitchen","raw_affiliation_strings":["Arizona State University"],"affiliations":[{"raw_affiliation_string":"Arizona State University","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Arizona State University"],"affiliations":[{"raw_affiliation_string":"Arizona State University","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101755936"],"corresponding_institution_ids":["https://openalex.org/I1343180700","https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":0.4769,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.63672655,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"36","issue":"3","first_page":"117","last_page":"125"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phased-array","display_name":"Phased array","score":0.7986781001091003},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7447600364685059},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.6183493137359619},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6104094386100769},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5815349817276001},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.49967503547668457},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.48052701354026794},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.47537532448768616},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.45533105731010437},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4414343237876892},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3447021245956421},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31025707721710205},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24752533435821533},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15639343857765198},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09556907415390015}],"concepts":[{"id":"https://openalex.org/C55494473","wikidata":"https://www.wikidata.org/wiki/Q727898","display_name":"Phased array","level":3,"score":0.7986781001091003},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7447600364685059},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6183493137359619},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6104094386100769},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5815349817276001},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.49967503547668457},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.48052701354026794},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.47537532448768616},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.45533105731010437},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4414343237876892},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3447021245956421},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31025707721710205},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24752533435821533},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15639343857765198},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09556907415390015},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2019.2899054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2019.2899054","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2034390587","https://openalex.org/W2045522226","https://openalex.org/W2078140751","https://openalex.org/W2130927165","https://openalex.org/W2155678104","https://openalex.org/W2168249927","https://openalex.org/W2185023738","https://openalex.org/W3148712655"],"related_works":["https://openalex.org/W4306152236","https://openalex.org/W2979111876","https://openalex.org/W2099634618","https://openalex.org/W2143818732","https://openalex.org/W1969639234","https://openalex.org/W4255837520","https://openalex.org/W2385501957","https://openalex.org/W2387011115","https://openalex.org/W2376764577","https://openalex.org/W2020955201"],"abstract_inverted_index":{"Editor's":[0],"note:":[1],"This":[2],"article":[3],"presents":[4],"an":[5],"on-chip":[6],"built-in":[7],"self-test":[8],"(BIST)":[9],"measurement":[10],"system":[11],"for":[12],"in-field":[13],"calibration":[14],"of":[15,32,39,46,74],"RF":[16],"phased":[17,33],"arrays.":[18],"The":[19,55],"approach":[20,56],"can":[21],"be":[22],"used":[23],"to":[24],"measure":[25],"the":[26,47,52],"gain":[27],"mismatch":[28],"and":[29,41],"phase":[30],"difference":[31],"array":[34],"elements":[35],"with":[36],"low":[37],"degrees":[38],"error":[40],"does":[42],"not":[43],"require":[44],"knowledge":[45],"exact":[48],"amplitudes":[49,68],"generated":[50],"by":[51],"BIST":[53],"system.":[54],"uses":[57],"a":[58],"test":[59,66],"signal":[60,67],"steering":[61],"circuit":[62],"that":[63,65],"ensures":[64],"are":[69],"identical":[70],"through":[71],"different":[72],"phases":[73],"testing.":[75],"-Binoy":[76],"Ravindran,":[77],"Virginia":[78],"Tech.":[79]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}