{"id":"https://openalex.org/W2894600047","doi":"https://doi.org/10.1109/mdat.2018.2873446","title":"Upgrade/Downgrade: Efficient and Secure Legacy Electronic System Replacement","display_name":"Upgrade/Downgrade: Efficient and Secure Legacy Electronic System Replacement","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2894600047","doi":"https://doi.org/10.1109/mdat.2018.2873446","mag":"2894600047"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2018.2873446","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2018.2873446","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074276081","display_name":"Ulbert J. Botero","orcid":"https://orcid.org/0000-0001-9848-8611"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ulbert J. Botero","raw_affiliation_strings":["Electrical and Computer Engineering Department, University of Florida, Gainesville, FL, USA"],"affiliations":[{"raw_affiliation_string":"Electrical and Computer Engineering Department, University of Florida, Gainesville, FL, USA","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102766705","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0009-0006-8410-2347"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark M. Tehranipoor","raw_affiliation_strings":["University of Florida"],"affiliations":[{"raw_affiliation_string":"University of Florida","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009243659","display_name":"Domenic Forte","orcid":"https://orcid.org/0000-0002-2794-7320"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Domenic Forte","raw_affiliation_strings":["University of Florida"],"affiliations":[{"raw_affiliation_string":"University of Florida","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5074276081"],"corresponding_institution_ids":["https://openalex.org/I33213144"],"apc_list":null,"apc_paid":null,"fwci":1.0797,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.83470221,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"36","issue":"1","first_page":"14","last_page":"22"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14014","display_name":"Transportation Systems and Infrastructure","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T14014","display_name":"Transportation Systems and Infrastructure","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9840999841690063,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9613999724388123,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/downgrade","display_name":"Downgrade","score":0.9010106325149536},{"id":"https://openalex.org/keywords/upgrade","display_name":"Upgrade","score":0.8563430309295654},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.6584344506263733},{"id":"https://openalex.org/keywords/compromise","display_name":"Compromise","score":0.6573846340179443},{"id":"https://openalex.org/keywords/legacy-system","display_name":"Legacy system","score":0.6546052098274231},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.5823553800582886},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5483225584030151},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5051315426826477},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3321436941623688},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1828065812587738},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09824973344802856},{"id":"https://openalex.org/keywords/political-science","display_name":"Political science","score":0.09019336104393005}],"concepts":[{"id":"https://openalex.org/C2779628075","wikidata":"https://www.wikidata.org/wiki/Q1253258","display_name":"Downgrade","level":2,"score":0.9010106325149536},{"id":"https://openalex.org/C2780615140","wikidata":"https://www.wikidata.org/wiki/Q920419","display_name":"Upgrade","level":2,"score":0.8563430309295654},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.6584344506263733},{"id":"https://openalex.org/C46355384","wikidata":"https://www.wikidata.org/wiki/Q726686","display_name":"Compromise","level":2,"score":0.6573846340179443},{"id":"https://openalex.org/C105446022","wikidata":"https://www.wikidata.org/wiki/Q445962","display_name":"Legacy system","level":3,"score":0.6546052098274231},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.5823553800582886},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5483225584030151},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5051315426826477},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3321436941623688},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1828065812587738},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09824973344802856},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.09019336104393005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2018.2873446","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2018.2873446","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2047934477","https://openalex.org/W2073513347","https://openalex.org/W2120215366","https://openalex.org/W2140904634","https://openalex.org/W2518432791","https://openalex.org/W2575241219","https://openalex.org/W4246853294","https://openalex.org/W4291927144","https://openalex.org/W6842023481"],"related_works":["https://openalex.org/W2397073236","https://openalex.org/W2244900583","https://openalex.org/W2294220175","https://openalex.org/W4362573928","https://openalex.org/W2928297335","https://openalex.org/W1508463959","https://openalex.org/W2252901578","https://openalex.org/W2271677855","https://openalex.org/W1973885073","https://openalex.org/W2894600047"],"abstract_inverted_index":{"Maintaining":[0],"legacy":[1,48],"systems,":[2],"especially":[3],"in":[4],"military":[5],"and":[6,29,34,50],"aeronautic":[7],"applications,":[8],"can":[9,24],"pose":[10],"a":[11,42,47],"significant":[12],"challenge":[13],"when":[14],"system":[15,49,61],"components":[16,21],"become":[17],"obsolete.":[18],"Obtaining":[19],"these":[20],"through":[22],"brokers":[23],"easily":[25],"introduce":[26],"counterfeit":[27],"devices":[28,54],"otherwise":[30],"compromise":[31],"the":[32,37,60],"reliability":[33],"security":[35],"of":[36],"system.":[38],"This":[39],"article":[40],"presents":[41],"framework":[43],"for":[44],"reverse":[45],"engineering":[46],"determining":[51],"how":[52],"modern":[53],"may":[55],"be":[56],"used":[57],"to":[58],"replace":[59],"or":[62],"individual":[63],"components.":[64]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}