{"id":"https://openalex.org/W2915599891","doi":"https://doi.org/10.1109/mdat.2018.2865455","title":"Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects","display_name":"Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects","publication_year":2018,"publication_date":"2018-08-14","ids":{"openalex":"https://openalex.org/W2915599891","doi":"https://doi.org/10.1109/mdat.2018.2865455","mag":"2915599891"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2018.2865455","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2018.2865455","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053229053","display_name":"Luis Pizano\u2010Escalante","orcid":"https://orcid.org/0000-0001-7034-8967"},"institutions":[{"id":"https://openalex.org/I113686770","display_name":"Instituto Tecnol\u00f3gico y de Estudios Superiores de Occidente","ror":"https://ror.org/00cwp6m07","country_code":"MX","type":"education","lineage":["https://openalex.org/I113686770"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"L. Pizano-Escalante","raw_affiliation_strings":["Department of Electronics, Systems and IT, ITESO University, Tlaquepaque, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, Systems and IT, ITESO University, Tlaquepaque, Mexico","institution_ids":["https://openalex.org/I113686770"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020234193","display_name":"Omar Longoria\u2010Gandara","orcid":"https://orcid.org/0000-0002-9239-0821"},"institutions":[{"id":"https://openalex.org/I113686770","display_name":"Instituto Tecnol\u00f3gico y de Estudios Superiores de Occidente","ror":"https://ror.org/00cwp6m07","country_code":"MX","type":"education","lineage":["https://openalex.org/I113686770"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"O. Longoria-Gandara","raw_affiliation_strings":["Department of Electronics, Systems and IT, ITESO University, Tlaquepaque, Mexico"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, Systems and IT, ITESO University, Tlaquepaque, Mexico","institution_ids":["https://openalex.org/I113686770"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022375772","display_name":"R. Parra-Michel","orcid":"https://orcid.org/0000-0003-2327-2482"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Centro de Investigaci\u00f3n y de Estudios Avanzados del Instituto Polit\u00e9cnico Nacional","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"R. Parra-Michel","raw_affiliation_strings":["CINVESTAV-IPN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CINVESTAV-IPN","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067711175","display_name":"F. Pena-Campos","orcid":"https://orcid.org/0000-0001-9481-2058"},"institutions":[{"id":"https://openalex.org/I98461037","display_name":"Tecnol\u00f3gico de Monterrey","ror":"https://ror.org/03ayjn504","country_code":"MX","type":"education","lineage":["https://openalex.org/I98461037"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"F. Pena-Campos","raw_affiliation_strings":["Tecnologico de Monterrey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tecnologico de Monterrey","institution_ids":["https://openalex.org/I98461037"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2619,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.60509336,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"36","issue":"1","first_page":"31","last_page":"39"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4520818591117859}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4520818591117859}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2018.2865455","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2018.2865455","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2009339635","https://openalex.org/W2066590552","https://openalex.org/W2084773768","https://openalex.org/W2131641407","https://openalex.org/W2163160177","https://openalex.org/W2168901237","https://openalex.org/W2171817730","https://openalex.org/W2505095228","https://openalex.org/W2529670944","https://openalex.org/W2782062448","https://openalex.org/W4301253858"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655"],"abstract_inverted_index":{"This":[0],"work":[1],"aims":[2],"to":[3,21],"predict":[4],"bounds":[5],"on":[6],"bit-error-rate":[7],"performance":[8],"of":[9,18,26],"highspeed":[10],"interconnects.":[11,28],"The":[12],"novelty":[13],"lies":[14],"in":[15],"the":[16],"characterization":[17],"timing":[19],"jitter":[20],"achieve":[22],"more":[23],"accurate":[24],"modeling":[25],"such":[27]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}