{"id":"https://openalex.org/W2622863561","doi":"https://doi.org/10.1109/mdat.2017.2713390","title":"Data-Driven Test Plan Augmentation for Platform Verification","display_name":"Data-Driven Test Plan Augmentation for Platform Verification","publication_year":2017,"publication_date":"2017-06-08","ids":{"openalex":"https://openalex.org/W2622863561","doi":"https://doi.org/10.1109/mdat.2017.2713390","mag":"2622863561"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2017.2713390","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2017.2713390","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100344172","display_name":"Wen Chen","orcid":"https://orcid.org/0000-0002-6721-6266"},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Wen Chen","raw_affiliation_strings":["NXP Semiconductors Inc"],"raw_orcid":"https://orcid.org/0000-0002-6721-6266","affiliations":[{"raw_affiliation_string":"NXP Semiconductors Inc","institution_ids":["https://openalex.org/I4210123704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034427067","display_name":"Kuo-Kai Hsieh","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kuo-Kai Hsieh","raw_affiliation_strings":["University of California Santa Barbara"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California Santa Barbara","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li-Chung Wang","raw_affiliation_strings":["University of California Santa Barbara"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California Santa Barbara","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108510816","display_name":"Jayanta Bhadra","orcid":null},"institutions":[{"id":"https://openalex.org/I4210123704","display_name":"NXP (Germany)","ror":"https://ror.org/0268h4j55","country_code":"DE","type":"company","lineage":["https://openalex.org/I109147379","https://openalex.org/I4210123704"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jayanta Bhadra","raw_affiliation_strings":["NXP Semiconductors Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors Inc","institution_ids":["https://openalex.org/I4210123704"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3458,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.64249481,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"34","issue":"5","first_page":"23","last_page":"29"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11099","display_name":"Autonomous Vehicle Technology and Safety","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11099","display_name":"Autonomous Vehicle Technology and Safety","score":0.9800000190734863,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14351","display_name":"Statistical and Computational Modeling","score":0.9247999787330627,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12205","display_name":"Time Series Analysis and Forecasting","score":0.9100000262260437,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/plan","display_name":"Plan (archaeology)","score":0.8335026502609253},{"id":"https://openalex.org/keywords/test-plan","display_name":"Test plan","score":0.7759206295013428},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.7473787069320679},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6488123536109924},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4798542857170105},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4396589994430542},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.43319615721702576},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09800946712493896},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08326125144958496}],"concepts":[{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.8335026502609253},{"id":"https://openalex.org/C12148698","wikidata":"https://www.wikidata.org/wiki/Q364651","display_name":"Test plan","level":3,"score":0.7759206295013428},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.7473787069320679},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6488123536109924},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4798542857170105},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4396589994430542},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.43319615721702576},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09800946712493896},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08326125144958496},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2017.2713390","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2017.2713390","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7346885992","display_name":null,"funder_award_id":"2012-TJ-2268","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1974291029","https://openalex.org/W2067191022","https://openalex.org/W2069736170","https://openalex.org/W2084666366","https://openalex.org/W2098165956","https://openalex.org/W2117874980","https://openalex.org/W2553621330","https://openalex.org/W6729969515"],"related_works":["https://openalex.org/W2072180474","https://openalex.org/W2134355894","https://openalex.org/W2135461415","https://openalex.org/W2356632721","https://openalex.org/W4205526386","https://openalex.org/W2795457403","https://openalex.org/W4252376856","https://openalex.org/W2503350312","https://openalex.org/W4294053627","https://openalex.org/W1507162423"],"abstract_inverted_index":{"This":[0],"article":[1],"points":[2],"out":[3],"that":[4],"the":[5,14,25],"fundamental":[6],"problem":[7],"of":[8,13],"platform":[9],"verification":[10],"is":[11],"incompleteness":[12],"test":[15,26],"plan":[16],"and":[17],"proposes":[18],"an":[19],"unsupervised":[20],"learning":[21],"approach":[22],"to":[23],"augment":[24],"plan.-Magdy":[27],"Abadir,":[28],"Helic":[29],"Inc.":[30]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}