{"id":"https://openalex.org/W2556825344","doi":"https://doi.org/10.1109/mdat.2016.2630317","title":"Can Dark Silicon Be Exploited to Prolong System Lifetime?","display_name":"Can Dark Silicon Be Exploited to Prolong System Lifetime?","publication_year":2016,"publication_date":"2016-11-17","ids":{"openalex":"https://openalex.org/W2556825344","doi":"https://doi.org/10.1109/mdat.2016.2630317","mag":"2556825344"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2016.2630317","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2016.2630317","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11311/1015124","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014977873","display_name":"Mohammad-Hashem Haghbayan","orcid":"https://orcid.org/0000-0001-6583-4418"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Mohammad-Hashem Haghbayan","raw_affiliation_strings":["Department of Information Technology, University of Turku, Turku, Finland"],"raw_orcid":"https://orcid.org/0000-0001-6583-4418","affiliations":[{"raw_affiliation_string":"Department of Information Technology, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042140592","display_name":"Amir M. Rahmani","orcid":"https://orcid.org/0000-0003-0725-1155"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Amir M. Rahmani","raw_affiliation_strings":["Department of Information Technology, University of Turku, Turku, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Technology, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019546150","display_name":"Pasi Liljeberg","orcid":"https://orcid.org/0000-0002-9392-3589"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Pasi Liljeberg","raw_affiliation_strings":["Department of Information Technology, University of Turku, Turku, Finland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Technology, University of Turku, Turku, Finland","institution_ids":["https://openalex.org/I155660961"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032163732","display_name":"Axel Jantsch","orcid":"https://orcid.org/0000-0003-2251-0004"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Axel Jantsch","raw_affiliation_strings":["Vienna University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vienna University of Technology","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031451381","display_name":"Antonio Miele","orcid":"https://orcid.org/0000-0003-3197-0723"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Antonio Miele","raw_affiliation_strings":["Politecnico di Milano"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Politecnico di Milano","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014159983","display_name":"Cristiana Bolchini","orcid":"https://orcid.org/0000-0001-5065-7906"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]},{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["FI","SE"],"is_corresponding":false,"raw_author_name":"Cristiana Bolchini","raw_affiliation_strings":["University of Turku and KTH Royal Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Turku and KTH Royal Institute of Technology","institution_ids":["https://openalex.org/I155660961","https://openalex.org/I86987016"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003371230","display_name":"Hannu Tenhunen","orcid":"https://orcid.org/0000-0003-1959-6513"},"institutions":[{"id":"https://openalex.org/I155660961","display_name":"University of Turku","ror":"https://ror.org/05vghhr25","country_code":"FI","type":"education","lineage":["https://openalex.org/I155660961"]},{"id":"https://openalex.org/I86987016","display_name":"KTH Royal Institute of Technology","ror":"https://ror.org/026vcq606","country_code":"SE","type":"education","lineage":["https://openalex.org/I86987016"]}],"countries":["FI","SE"],"is_corresponding":false,"raw_author_name":"Hannu Tenhunen","raw_affiliation_strings":["University of Turku and KTH Royal Institute of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Turku and KTH Royal Institute of Technology","institution_ids":["https://openalex.org/I155660961","https://openalex.org/I86987016"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1466,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60240467,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"34","issue":"2","first_page":"51","last_page":"59"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-budget","display_name":"Power budget","score":0.7237657904624939},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7225950360298157},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.6981881856918335},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6301751732826233},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5568321943283081},{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.5520666837692261},{"id":"https://openalex.org/keywords/silicon-chip","display_name":"Silicon chip","score":0.5364577770233154},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42897987365722656},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.4147014021873474},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39483723044395447},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.3382512927055359},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27472424507141113},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.26565682888031006},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.18834349513053894},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17689061164855957},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14387446641921997},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.11546489596366882}],"concepts":[{"id":"https://openalex.org/C149768029","wikidata":"https://www.wikidata.org/wiki/Q1509342","display_name":"Power budget","level":4,"score":0.7237657904624939},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7225950360298157},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6981881856918335},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6301751732826233},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5568321943283081},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.5520666837692261},{"id":"https://openalex.org/C2983805867","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Silicon chip","level":3,"score":0.5364577770233154},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42897987365722656},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4147014021873474},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39483723044395447},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3382512927055359},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27472424507141113},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.26565682888031006},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.18834349513053894},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17689061164855957},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14387446641921997},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.11546489596366882},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/mdat.2016.2630317","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2016.2630317","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1015124","is_oa":true,"landing_page_url":"http://hdl.handle.net/11311/1015124","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:re.public.polimi.it:11311/1015124","is_oa":true,"landing_page_url":"http://hdl.handle.net/11311/1015124","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5799999833106995}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1642255152","https://openalex.org/W1973765113","https://openalex.org/W1993273773","https://openalex.org/W2080300564","https://openalex.org/W2082973036","https://openalex.org/W2098335003","https://openalex.org/W2347205803","https://openalex.org/W3148014290","https://openalex.org/W4233774062","https://openalex.org/W6705281235"],"related_works":["https://openalex.org/W2076199735","https://openalex.org/W2372686625","https://openalex.org/W2386903594","https://openalex.org/W4713013","https://openalex.org/W2074178765","https://openalex.org/W3155422432","https://openalex.org/W583682455","https://openalex.org/W2416990614","https://openalex.org/W2114537201","https://openalex.org/W2362229590"],"abstract_inverted_index":{"Besides":[0],"stringent":[1],"power":[2,39],"and":[3,38],"thermal":[4],"constraints,":[5],"a":[6,45],"dark":[7,22],"silicon":[8,23],"chip":[9],"is":[10],"also":[11],"subjected":[12],"to":[13,27],"various":[14],"reliability":[15],"threats.":[16],"This":[17],"article":[18],"illustrates":[19],"how":[20],"the":[21,29],"can":[24],"be":[25],"exploited":[26],"improve":[28],"chip's":[30],"lifetime":[31],"through":[32],"efficient":[33],"utilization":[34],"of":[35,52],"computational":[36],"resources":[37],"budget,":[40],"while":[41],"still":[42],"performing":[43],"in":[44],"similar":[46],"way.":[47],"-Muhammad":[48],"Shafique,":[49],"Vienna":[50],"University":[51],"Technology.":[53]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}