{"id":"https://openalex.org/W2483514863","doi":"https://doi.org/10.1109/mdat.2016.2594180","title":"Interdependencies of Degradation Effects and Their Impact on Computing","display_name":"Interdependencies of Degradation Effects and Their Impact on Computing","publication_year":2016,"publication_date":"2016-07-27","ids":{"openalex":"https://openalex.org/W2483514863","doi":"https://doi.org/10.1109/mdat.2016.2594180","mag":"2483514863"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2016.2594180","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2016.2594180","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059133190","display_name":"Hussam Amrouch","orcid":"https://orcid.org/0000-0002-5649-3102"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Hussam Amrouch","raw_affiliation_strings":["Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027765192","display_name":"Victor M. van Santen","orcid":"https://orcid.org/0000-0002-6629-4713"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Victor M. van Santen","raw_affiliation_strings":["Karlsruhe Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063508488","display_name":"J\u00f6rg Henkel","orcid":"https://orcid.org/0000-0001-9602-2922"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Jorg Henkel","raw_affiliation_strings":["Karlsruhe Institute of Technology"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5059133190"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":2.0507,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.87887558,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"34","issue":"3","first_page":"59","last_page":"67"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interdependence","display_name":"Interdependence","score":0.7656697034835815},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.741978645324707},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4672427475452423},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.3499235510826111},{"id":"https://openalex.org/keywords/political-science","display_name":"Political science","score":0.07759389281272888}],"concepts":[{"id":"https://openalex.org/C185874996","wikidata":"https://www.wikidata.org/wiki/Q269699","display_name":"Interdependence","level":2,"score":0.7656697034835815},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.741978645324707},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4672427475452423},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.3499235510826111},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.07759389281272888},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2016.2594180","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2016.2594180","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1529164337","https://openalex.org/W1676110029","https://openalex.org/W2005494397","https://openalex.org/W2012356218","https://openalex.org/W2013978035","https://openalex.org/W2111566830","https://openalex.org/W2115073796","https://openalex.org/W2126248298","https://openalex.org/W2150056343","https://openalex.org/W2163494715","https://openalex.org/W2167021379","https://openalex.org/W2346485801","https://openalex.org/W2396345169","https://openalex.org/W3149249597","https://openalex.org/W4251123232","https://openalex.org/W6631689600","https://openalex.org/W6637360692","https://openalex.org/W6640183753"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2969604939","https://openalex.org/W2378306841","https://openalex.org/W2390279801","https://openalex.org/W3122988618","https://openalex.org/W2358668433","https://openalex.org/W2382776042","https://openalex.org/W4229005360","https://openalex.org/W2584455473"],"abstract_inverted_index":{"Editor's":[0],"note:":[1],"Process":[2],"variations,":[3],"aging":[4],"and":[5,15,48,56],"wearout,":[6],"are":[7,50],"nonidealities":[8],"that":[9,45,88],"lead":[10],"to":[11,20,59,76,92],"suboptimal":[12],"system":[13],"performance":[14],"increased":[16],"power.":[17],"In":[18],"order":[19],"understand":[21],"the":[22,89,94,97],"effects":[23,99],"of":[24,73,96],"these":[25,74],"degradation":[26,98],"effects,":[27],"until":[28],"now,":[29],"researchers":[30],"have":[31],"investigated":[32],"them":[33],"thoroughly,":[34],"but":[35],"separately":[36],"from":[37,53],"each":[38,54],"other.":[39],"What":[40],"this":[41],"article":[42,64],"shows":[43,65],"is":[44,86],"process":[46],"variations":[47],"wearout":[49],"not":[51],"independent":[52],"other":[55,83],"they":[57,68],"need":[58],"be":[60],"considered":[61],"together.":[62],"The":[63],"designers":[66],"how":[67],"can":[69],"sometimes":[70],"take":[71],"advantage":[72],"interdependencies":[75,90],"safely":[77],"reduce":[78],"design":[79],"margins,":[80],"while":[81],"in":[82,100],"cases,":[84],"it":[85],"possible":[87],"conspire":[91],"amplify":[93],"effect":[95],"catastrophic":[101],"ways.":[102]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":1}],"updated_date":"2026-03-31T07:56:22.981413","created_date":"2025-10-10T00:00:00"}