{"id":"https://openalex.org/W2343403348","doi":"https://doi.org/10.1109/mdat.2016.2527708","title":"A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications","display_name":"A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications","publication_year":2016,"publication_date":"2016-02-10","ids":{"openalex":"https://openalex.org/W2343403348","doi":"https://doi.org/10.1109/mdat.2016.2527708","mag":"2343403348"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2016.2527708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2016.2527708","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081952251","display_name":"Samah Mohamed Saeed","orcid":"https://orcid.org/0000-0002-8107-3644"},"institutions":[{"id":"https://openalex.org/I4210150356","display_name":"University of Washington Tacoma","ror":"https://ror.org/05n8t2628","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701","https://openalex.org/I4210150356"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Samah Mohamed Saeed","raw_affiliation_strings":["University of Washington, Tacoma, WA, USA"],"affiliations":[{"raw_affiliation_string":"University of Washington, Tacoma, WA, USA","institution_ids":["https://openalex.org/I4210150356"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["New York University"],"affiliations":[{"raw_affiliation_string":"New York University","institution_ids":["https://openalex.org/I57206974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5081952251"],"corresponding_institution_ids":["https://openalex.org/I4210150356"],"apc_list":null,"apc_paid":null,"fwci":0.3153,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5438217,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"34","issue":"1","first_page":"57","last_page":"64"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6380465030670166},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6180861592292786},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.617658793926239},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5513050556182861},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.5165618658065796},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.480185866355896},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.46745285391807556},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.45048192143440247},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.3689550757408142},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3334923982620239},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18967658281326294},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.1574203372001648},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0702909529209137}],"concepts":[{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6380465030670166},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6180861592292786},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.617658793926239},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5513050556182861},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.5165618658065796},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.480185866355896},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.46745285391807556},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.45048192143440247},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.3689550757408142},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3334923982620239},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18967658281326294},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.1574203372001648},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0702909529209137},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2016.2527708","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2016.2527708","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1480960212","https://openalex.org/W1554038051","https://openalex.org/W1964344721","https://openalex.org/W2042812046","https://openalex.org/W2074295325","https://openalex.org/W2085362698","https://openalex.org/W2101863706","https://openalex.org/W2112832628","https://openalex.org/W2139009001","https://openalex.org/W2141624968","https://openalex.org/W2141715577","https://openalex.org/W2144980381"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W3037788266","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2142405811","https://openalex.org/W2164349885"],"abstract_inverted_index":{"Testability":[0],"is":[1],"a":[2,23,27],"perennial":[3],"concern":[4],"that":[5],"requires":[6],"ever-improved":[7],"solutions;":[8],"however,":[9],"potentially":[10],"resultant":[11],"security":[12,56],"vulnerabilities":[13],"need":[14],"to":[15,55],"be":[16],"considered":[17],"as":[18],"well.":[19],"This":[20],"article":[21],"provides":[22],"compact":[24],"look":[25],"at":[26],"body":[28],"of":[29,54],"DfT":[30,39,47],"work":[31],"from":[32],"lead":[33],"practitioners":[34],"in":[35],"the":[36],"field.":[37],"The":[38],"strategies":[40,61],"address":[41],"predicting":[42],"and":[43,51],"data":[44],"Potential":[45],"impacts":[46],"controlling":[48],"test":[49],"volume":[50],"reducing":[52],"power.":[53],"are":[57],"considered,":[58],"along":[59],"with":[60],"for":[62],"providing":[63],"testability":[64],"without":[65],"sacrificing":[66],"security.":[67]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}