{"id":"https://openalex.org/W2294574557","doi":"https://doi.org/10.1109/mdat.2015.2417799","title":"A Look at Asynchronous Design and Photonic Network-on-a-Chip (PNoC)","display_name":"A Look at Asynchronous Design and Photonic Network-on-a-Chip (PNoC)","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W2294574557","doi":"https://doi.org/10.1109/mdat.2015.2417799","mag":"2294574557"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2015.2417799","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2015.2417799","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/7119625/07119651.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/6221038/7119625/07119651.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062724257","display_name":"A. Ivanov","orcid":"https://orcid.org/0000-0002-0882-6750"},"institutions":[{"id":"https://openalex.org/I3132238960","display_name":"Institute of Electrical and Electronics Engineers","ror":"https://ror.org/01n002310","country_code":"US","type":"education","lineage":["https://openalex.org/I3132238960"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Andre Ivanov","raw_affiliation_strings":["IEEE Design & Test"],"affiliations":[{"raw_affiliation_string":"IEEE Design & Test","institution_ids":["https://openalex.org/I3132238960"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5062724257"],"corresponding_institution_ids":["https://openalex.org/I3132238960"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14149927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"32","issue":"3","first_page":"4","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9894000291824341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10232","display_name":"Optical Network Technologies","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.6969558596611023},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6123074293136597},{"id":"https://openalex.org/keywords/photonics","display_name":"Photonics","score":0.5077987313270569},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45337623357772827},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2540886700153351},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2524814009666443},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.22180238366127014}],"concepts":[{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.6969558596611023},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6123074293136597},{"id":"https://openalex.org/C20788544","wikidata":"https://www.wikidata.org/wiki/Q467054","display_name":"Photonics","level":2,"score":0.5077987313270569},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45337623357772827},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2540886700153351},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2524814009666443},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.22180238366127014}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2015.2417799","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2015.2417799","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/7119625/07119651.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/mdat.2015.2417799","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2015.2417799","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/7119625/07119651.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2294574557.pdf","grobid_xml":"https://content.openalex.org/works/W2294574557.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2116677773","https://openalex.org/W2155261584","https://openalex.org/W2584231425","https://openalex.org/W2042919702","https://openalex.org/W2390279801","https://openalex.org/W2150611273","https://openalex.org/W4207086172","https://openalex.org/W2358668433","https://openalex.org/W4225981436"],"abstract_inverted_index":{"Presents":[0],"the":[1,6,11,19,25],"introductory":[2],"welcome":[3],"message":[4],"from":[5],"conference":[7,12,20],"proceedings.":[8],"May":[9],"include":[10],"officers'":[13],"congratulations":[14],"to":[15],"all":[16],"involved":[17],"with":[18],"event":[21],"and":[22],"publication":[23],"of":[24],"proceedings":[26],"record.":[27]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}