{"id":"https://openalex.org/W1992966282","doi":"https://doi.org/10.1109/mdat.2014.2364871","title":"Design and Testing of Millimeter-Wave/Subterahertz Circuits and Systems","display_name":"Design and Testing of Millimeter-Wave/Subterahertz Circuits and Systems","publication_year":2014,"publication_date":"2014-12-01","ids":{"openalex":"https://openalex.org/W1992966282","doi":"https://doi.org/10.1109/mdat.2014.2364871","mag":"1992966282"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2014.2364871","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2014.2364871","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975301.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975301.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062724257","display_name":"A. Ivanov","orcid":"https://orcid.org/0000-0002-0882-6750"},"institutions":[{"id":"https://openalex.org/I3132238960","display_name":"Institute of Electrical and Electronics Engineers","ror":"https://ror.org/01n002310","country_code":"US","type":"education","lineage":["https://openalex.org/I3132238960"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Andre Ivanov","raw_affiliation_strings":["IEEE Design & Test"],"affiliations":[{"raw_affiliation_string":"IEEE Design & Test","institution_ids":["https://openalex.org/I3132238960"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5062724257"],"corresponding_institution_ids":["https://openalex.org/I3132238960"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05794793,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"6","first_page":"4","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10936","display_name":"Millimeter-Wave Propagation and Modeling","score":0.9779000282287598,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.601384162902832},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.5531286001205444},{"id":"https://openalex.org/keywords/millimeter","display_name":"Millimeter","score":0.4595341682434082},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4210607409477234},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.32085248827934265},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.28646641969680786},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2686319947242737},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23889389634132385},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21944907307624817}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.601384162902832},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.5531286001205444},{"id":"https://openalex.org/C109792285","wikidata":"https://www.wikidata.org/wiki/Q174789","display_name":"Millimeter","level":2,"score":0.4595341682434082},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4210607409477234},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.32085248827934265},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.28646641969680786},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2686319947242737},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23889389634132385},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21944907307624817}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2014.2364871","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2014.2364871","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975301.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/mdat.2014.2364871","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2014.2364871","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975301.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5699999928474426,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1992966282.pdf","grobid_xml":"https://content.openalex.org/works/W1992966282.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2317169686","https://openalex.org/W3159902002","https://openalex.org/W1185324648","https://openalex.org/W2539553997","https://openalex.org/W2363237216","https://openalex.org/W2033762247","https://openalex.org/W2530392398","https://openalex.org/W1997983170","https://openalex.org/W2752062855","https://openalex.org/W4234622976"],"abstract_inverted_index":{"our":[0],"readers":[1],"to":[2,8,20,40,75,80],"a":[3,98],"topic":[4],"we":[5],"have":[6],"yet":[7],"cover:":[9],"millimeter":[10],"wave":[11],"(mm-wave)":[12],"and":[13,24,46,50,56,68],"subterahertz":[14],"(sub-THz)":[15],"circuits.":[16],"We":[17],"are":[18],"excited":[19],"bring":[21],"this":[22,61,90,103],"focused":[23],"timely":[25],"issue":[26],"before":[27],"you,":[28],"with":[29],"the":[30,36,44,84],"goal":[31],"of":[32,35,48,60,87],"highlighting":[33],"some":[34],"most":[37],"trailblazing":[38],"solutions":[39],"contemporary":[41],"challenges":[42],"in":[43,71,89],"design":[45],"test":[47],"mm-wave":[49],"sub-THz":[51],"circuits/systems.":[52],"The":[53],"wide":[54],"applicability":[55],"concrete":[57],"industry":[58],"examples":[59],"issue's":[62],"selected":[63],"articles":[64,88],"fill":[65],"an":[66],"important":[67],"interesting":[69],"gap":[70],"D&T's":[72],"topical":[73],"coverage":[74],"date.":[76],"I":[77],"am":[78],"happy":[79],"shed":[81],"light":[82],"on":[83],"impressive":[85],"list":[86],"special":[91],"issue.":[92],"(The":[93],"guest":[94],"editors":[95],"will":[96],"do":[97],"much":[99],"better":[100],"job":[101],"at":[102],"than":[104],"I!)":[105]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}