{"id":"https://openalex.org/W2025877245","doi":"https://doi.org/10.1109/mdat.2014.2345020","title":"Guest Editors' Introduction: Design and Testing of Millimeter-Wave/Subterahertz Circuits and Systems","display_name":"Guest Editors' Introduction: Design and Testing of Millimeter-Wave/Subterahertz Circuits and Systems","publication_year":2014,"publication_date":"2014-12-01","ids":{"openalex":"https://openalex.org/W2025877245","doi":"https://doi.org/10.1109/mdat.2014.2345020","mag":"2025877245"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2014.2345020","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2014.2345020","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975269.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975269.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086461408","display_name":"Deukhyoun Heo","orcid":"https://orcid.org/0000-0002-1152-1739"},"institutions":[{"id":"https://openalex.org/I72951846","display_name":"Washington State University","ror":"https://ror.org/05dk0ce17","country_code":"US","type":"education","lineage":["https://openalex.org/I72951846"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Deukhyoun Heo","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, Washington State University, Pullman, WA, USA","institution_ids":["https://openalex.org/I72951846"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030106215","display_name":"Jonghae Kim","orcid":"https://orcid.org/0000-0003-1222-0054"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Jonghae Kim","raw_affiliation_strings":["Qualcomm Incorporated"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Qualcomm Incorporated","institution_ids":["https://openalex.org/I19268510"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"6","first_page":"6","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9818000197410583,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10936","display_name":"Millimeter-Wave Propagation and Modeling","score":0.9225000143051147,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.6975457072257996},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.6679168343544006},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6598128080368042},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6081189513206482},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.5455330610275269},{"id":"https://openalex.org/keywords/millimeter","display_name":"Millimeter","score":0.5225086808204651},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.43889957666397095},{"id":"https://openalex.org/keywords/high-data-rate","display_name":"High data rate","score":0.431476354598999},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3770923316478729},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3377101719379425},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27923235297203064},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18081721663475037},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17892351746559143},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.13403210043907166}],"concepts":[{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.6975457072257996},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.6679168343544006},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6598128080368042},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6081189513206482},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.5455330610275269},{"id":"https://openalex.org/C109792285","wikidata":"https://www.wikidata.org/wiki/Q174789","display_name":"Millimeter","level":2,"score":0.5225086808204651},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.43889957666397095},{"id":"https://openalex.org/C3019438356","wikidata":"https://www.wikidata.org/wiki/Q155028","display_name":"High data rate","level":3,"score":0.431476354598999},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3770923316478729},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3377101719379425},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27923235297203064},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18081721663475037},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17892351746559143},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.13403210043907166},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2014.2345020","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2014.2345020","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975269.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/mdat.2014.2345020","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mdat.2014.2345020","pdf_url":"https://ieeexplore.ieee.org/ielx7/6221038/6974939/06975269.pdf","source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5799999833106995,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2025877245.pdf","grobid_xml":"https://content.openalex.org/works/W2025877245.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2317169686","https://openalex.org/W3159902002","https://openalex.org/W1185324648","https://openalex.org/W2539553997","https://openalex.org/W2363237216","https://openalex.org/W2033762247","https://openalex.org/W2530392398","https://openalex.org/W1997983170","https://openalex.org/W2752062855","https://openalex.org/W4234622976"],"abstract_inverted_index":{"The":[0],"articles":[1],"in":[2,17],"this":[3],"special":[4],"issue":[5],"focus":[6],"on":[7],"millimeter-wave":[8],"(mmwave)and":[9],"subterahertz":[10],"(sub-THz)":[11],"circuits":[12,31],"and":[13,29,32,51],"systems.":[14,33],"Recent":[15],"advances":[16],"silicon":[18],"technologies":[19],"have":[20,36,54],"opened":[21],"up":[22],"new":[23],"opportunities":[24],"for":[25],"investigations":[26],"into":[27],"mmwave":[28],"sub-THz":[30],"These":[34],"systems":[35],"enabled":[37],"extremely":[38],"high-data-rate":[39],"communications.":[40],"Hence,":[41],"many":[42],"applications":[43],"like":[44],"high-definition":[45],"media":[46],"transfer,":[47],"wireless":[48],"network-on-chip":[49],"(NoC),":[50],"high-frequency":[52],"radar,":[53],"evolved":[55],"to":[56],"incorporate":[57],"these":[58],"technologies.":[59]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}