{"id":"https://openalex.org/W2296130515","doi":"https://doi.org/10.1109/mdat.2013.2291168","title":"Planned Unobsolescence","display_name":"Planned Unobsolescence","publication_year":2013,"publication_date":"2013-12-01","ids":{"openalex":"https://openalex.org/W2296130515","doi":"https://doi.org/10.1109/mdat.2013.2291168","mag":"2296130515"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2013.2291168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2013.2291168","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101573181","display_name":"Scott Davidson","orcid":"https://orcid.org/0000-0002-9390-6084"},"institutions":[{"id":"https://openalex.org/I16269868","display_name":"Santa Clara University","ror":"https://ror.org/03ypqe447","country_code":"US","type":"education","lineage":["https://openalex.org/I16269868"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Scott Davidson","raw_affiliation_strings":["Santa Clara"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Santa Clara","institution_ids":["https://openalex.org/I16269868"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5101573181"],"corresponding_institution_ids":["https://openalex.org/I16269868"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28460856,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"30","issue":"6","first_page":"104","last_page":"104"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14014","display_name":"Transportation Systems and Infrastructure","score":0.7314000129699707,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T14014","display_name":"Transportation Systems and Infrastructure","score":0.7314000129699707,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.008899999782443047,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14431","display_name":"Diverse Research and Applications","score":0.008299999870359898,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/obsolescence","display_name":"Obsolescence","score":0.6756734848022461},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.3122166395187378},{"id":"https://openalex.org/keywords/marketing","display_name":"Marketing","score":0.06231415271759033}],"concepts":[{"id":"https://openalex.org/C30795975","wikidata":"https://www.wikidata.org/wiki/Q282744","display_name":"Obsolescence","level":2,"score":0.6756734848022461},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.3122166395187378},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.06231415271759033}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2013.2291168","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2013.2291168","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W4285293690","https://openalex.org/W3124382960","https://openalex.org/W1590264876","https://openalex.org/W1570681957","https://openalex.org/W3131858951","https://openalex.org/W2090970427","https://openalex.org/W3125496616","https://openalex.org/W2787744881","https://openalex.org/W3125372081"],"abstract_inverted_index":{"Examines":[0],"the":[1],"concept":[2],"of":[3],"planned":[4],"obsolescence.":[5]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}