{"id":"https://openalex.org/W1963667829","doi":"https://doi.org/10.1109/mdat.2013.2273791","title":"Deriving Feature Fail Rate from Silicon Volume Diagnostics Data","display_name":"Deriving Feature Fail Rate from Silicon Volume Diagnostics Data","publication_year":2013,"publication_date":"2013-07-17","ids":{"openalex":"https://openalex.org/W1963667829","doi":"https://doi.org/10.1109/mdat.2013.2273791","mag":"1963667829"},"language":"en","primary_location":{"id":"doi:10.1109/mdat.2013.2273791","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2013.2273791","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019291470","display_name":"Shobhit Malik","orcid":null},"institutions":[{"id":"https://openalex.org/I4210142027","display_name":"GlobalFoundries (Germany)","ror":"https://ror.org/045jad561","country_code":"DE","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210142027"]},{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"countries":["DE","US"],"is_corresponding":true,"raw_author_name":"Shobhit Malik","raw_affiliation_strings":["GLOBALFOUNDRIES","GLOBALFOUNDRIES Sunnyvale, USA"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES","institution_ids":["https://openalex.org/I4210142027"]},{"raw_affiliation_string":"GLOBALFOUNDRIES Sunnyvale, USA","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083843849","display_name":"Thomas Herrmann","orcid":"https://orcid.org/0000-0002-9270-4501"},"institutions":[{"id":"https://openalex.org/I4210142027","display_name":"GlobalFoundries (Germany)","ror":"https://ror.org/045jad561","country_code":"DE","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210142027"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Herrmann","raw_affiliation_strings":["GLOBALFOUNDRIES","GLOBALFOUNDRIES Dresden (Germany)"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES","institution_ids":["https://openalex.org/I4210142027"]},{"raw_affiliation_string":"GLOBALFOUNDRIES Dresden (Germany)","institution_ids":["https://openalex.org/I4210142027"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008692309","display_name":"Sriram Madhavan","orcid":"https://orcid.org/0009-0005-5544-9141"},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]},{"id":"https://openalex.org/I4210142027","display_name":"GlobalFoundries (Germany)","ror":"https://ror.org/045jad561","country_code":"DE","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210142027"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"Sriram Madhavan","raw_affiliation_strings":["GLOBALFOUNDRIES","GLOBALFOUNDRIES, Sunnyvale"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES","institution_ids":["https://openalex.org/I4210142027"]},{"raw_affiliation_string":"GLOBALFOUNDRIES, Sunnyvale","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027296030","display_name":"Rao Desineni","orcid":null},"institutions":[{"id":"https://openalex.org/I35662394","display_name":"GlobalFoundries (United States)","ror":"https://ror.org/02h0ps145","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]},{"id":"https://openalex.org/I4210142027","display_name":"GlobalFoundries (Germany)","ror":"https://ror.org/045jad561","country_code":"DE","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210142027"]}],"countries":["DE","US"],"is_corresponding":false,"raw_author_name":"Rao Desineni","raw_affiliation_strings":["GLOBALFOUNDRIES","GLOBALFOUNDRIES,"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES","institution_ids":["https://openalex.org/I4210142027"]},{"raw_affiliation_string":"GLOBALFOUNDRIES,","institution_ids":["https://openalex.org/I35662394"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109433539","display_name":"Chris Schuermyer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210099704","display_name":"Mentor","ror":"https://ror.org/016grqh48","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210099704"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["GB","HU"],"is_corresponding":false,"raw_author_name":"Chris Schuermyer","raw_affiliation_strings":["Mentor Graphics Corp","Mentor Graphics Corp., Wilsonville,"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corp","institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville,","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5071079480","display_name":"Geir Egil Eide","orcid":"https://orcid.org/0000-0001-9466-1763"},"institutions":[{"id":"https://openalex.org/I4210142027","display_name":"GlobalFoundries (Germany)","ror":"https://ror.org/045jad561","country_code":"DE","type":"company","lineage":["https://openalex.org/I35662394","https://openalex.org/I4210142027"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["DE","HU"],"is_corresponding":false,"raw_author_name":"Geir Eide","raw_affiliation_strings":["GLOBALFOUNDRIES","Mentor Graphics Corp., Wilsonville,"],"affiliations":[{"raw_affiliation_string":"GLOBALFOUNDRIES","institution_ids":["https://openalex.org/I4210142027"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville,","institution_ids":["https://openalex.org/I105695857"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5019291470"],"corresponding_institution_ids":["https://openalex.org/I35662394","https://openalex.org/I4210142027"],"apc_list":null,"apc_paid":null,"fwci":0.6304,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67235068,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"30","issue":"4","first_page":"26","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.8262768983840942},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.7039212584495544},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5848913788795471},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.4502876400947571},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.43755805492401123},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.34452593326568604},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09822267293930054}],"concepts":[{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.8262768983840942},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.7039212584495544},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5848913788795471},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.4502876400947571},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.43755805492401123},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.34452593326568604},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09822267293930054},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mdat.2013.2273791","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdat.2013.2273791","pdf_url":null,"source":{"id":"https://openalex.org/S4210176427","display_name":"IEEE Design and Test","issn_l":"2168-2356","issn":["2168-2356","2168-2364"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2067067399","https://openalex.org/W2109210220","https://openalex.org/W2111081435","https://openalex.org/W2133188063","https://openalex.org/W2142551277","https://openalex.org/W2152489029","https://openalex.org/W2165162946","https://openalex.org/W2483664965","https://openalex.org/W6682357834"],"related_works":["https://openalex.org/W2798121181","https://openalex.org/W2016805743","https://openalex.org/W4242592912","https://openalex.org/W435830328","https://openalex.org/W2087896742","https://openalex.org/W2328676785","https://openalex.org/W2898732673","https://openalex.org/W1989025965","https://openalex.org/W2322380964","https://openalex.org/W2410053581"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"expanding":[5],"the":[6,14,53],"use":[7],"of":[8,16,31],"volume":[9,39,47],"diagnostics":[10,48],"to":[11,19,49],"go":[12],"beyond":[13],"identification":[15],"critical":[17,34],"features":[18,35],"accurately":[20],"estimate":[21],"their":[22],"FFRs.":[23],"We":[24,41],"present":[25],"a":[26,32],"case":[27],"study":[28],"where":[29],"FFRs":[30,44],"few":[33],"are":[36],"identified":[37],"using":[38],"diagnostics.":[40],"also":[42],"compare":[43],"calculated":[45],"from":[46],"those":[50],"extracted":[51],"for":[52],"same":[54],"feature":[55],"on":[56],"test":[57],"structures,":[58],"which":[59],"validates":[60],"our":[61],"presented":[62],"approach.":[63]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}