{"id":"https://openalex.org/W2007666185","doi":"https://doi.org/10.1109/mcom.1983.1091435","title":"FET technology for low-noise front ends","display_name":"FET technology for low-noise front ends","publication_year":1983,"publication_date":"1983-09-01","ids":{"openalex":"https://openalex.org/W2007666185","doi":"https://doi.org/10.1109/mcom.1983.1091435","mag":"2007666185"},"language":"en","primary_location":{"id":"doi:10.1109/mcom.1983.1091435","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mcom.1983.1091435","pdf_url":null,"source":{"id":"https://openalex.org/S158797327","display_name":"IEEE Communications Magazine","issn_l":"0163-6804","issn":["0163-6804","1558-1896"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Communications Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078492879","display_name":"J. Arnold","orcid":null},"institutions":[{"id":"https://openalex.org/I4210099336","display_name":"Menlo School","ror":"https://ror.org/01240pn49","country_code":"US","type":"education","lineage":["https://openalex.org/I4210099336"]},{"id":"https://openalex.org/I1298353152","display_name":"SRI International","ror":"https://ror.org/05s570m15","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I1298353152"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"J. Arnold","raw_affiliation_strings":["SRI Int., Menlo Park, CA, USA"],"affiliations":[{"raw_affiliation_string":"SRI Int., Menlo Park, CA, USA","institution_ids":["https://openalex.org/I1298353152","https://openalex.org/I4210099336"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5078492879"],"corresponding_institution_ids":["https://openalex.org/I1298353152","https://openalex.org/I4210099336"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.12970452,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"21","issue":"6","first_page":"37","last_page":"42"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9610999822616577,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9596999883651733,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7998925447463989},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.5263755917549133},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.516130805015564},{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.47751274704933167},{"id":"https://openalex.org/keywords/front","display_name":"Front (military)","score":0.44312477111816406},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3793514668941498},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.3377474844455719},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13305369019508362},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08685418963432312}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7998925447463989},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.5263755917549133},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.516130805015564},{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.47751274704933167},{"id":"https://openalex.org/C2777551076","wikidata":"https://www.wikidata.org/wiki/Q842332","display_name":"Front (military)","level":2,"score":0.44312477111816406},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3793514668941498},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.3377474844455719},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13305369019508362},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08685418963432312},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mcom.1983.1091435","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mcom.1983.1091435","pdf_url":null,"source":{"id":"https://openalex.org/S158797327","display_name":"IEEE Communications Magazine","issn_l":"0163-6804","issn":["0163-6804","1558-1896"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Communications Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1783902397","https://openalex.org/W1990898145","https://openalex.org/W2057166989","https://openalex.org/W2077032219","https://openalex.org/W2087774763","https://openalex.org/W2146242275","https://openalex.org/W2147555353","https://openalex.org/W2998863920","https://openalex.org/W6772953302"],"related_works":["https://openalex.org/W4210368779","https://openalex.org/W4232652765","https://openalex.org/W1416210464","https://openalex.org/W2382549550","https://openalex.org/W2164612159","https://openalex.org/W2515238120","https://openalex.org/W1520404809","https://openalex.org/W620214523","https://openalex.org/W112660975","https://openalex.org/W2370581882"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
