{"id":"https://openalex.org/W2065694183","doi":"https://doi.org/10.1109/mce.2011.2172080","title":"Methods for Assessing Product Reliability: Looking for enhancements by adopting condition-based monitoring","display_name":"Methods for Assessing Product Reliability: Looking for enhancements by adopting condition-based monitoring","publication_year":2011,"publication_date":"2011-12-22","ids":{"openalex":"https://openalex.org/W2065694183","doi":"https://doi.org/10.1109/mce.2011.2172080","mag":"2065694183"},"language":"en","primary_location":{"id":"doi:10.1109/mce.2011.2172080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mce.2011.2172080","pdf_url":null,"source":{"id":"https://openalex.org/S2483040032","display_name":"IEEE Consumer Electronics Magazine","issn_l":"2162-2248","issn":["2162-2248","2162-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Consumer Electronics Magazine","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059450636","display_name":"Bernard Fong","orcid":"https://orcid.org/0000-0003-3726-2701"},"institutions":[{"id":"https://openalex.org/I114017466","display_name":"University of Technology Sydney","ror":"https://ror.org/03f0f6041","country_code":"AU","type":"education","lineage":["https://openalex.org/I114017466"]},{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["AU","HK"],"is_corresponding":false,"raw_author_name":"Bernard Fong","raw_affiliation_strings":["City University of Hong Kong, Hong Kong, China","B.S. degree in electronics from the University of Manchester, United Kingdom, and his Ph.D. degree in medical technology from the University of New South Wales, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"City University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I168719708"]},{"raw_affiliation_string":"B.S. degree in electronics from the University of Manchester, United Kingdom, and his Ph.D. degree in medical technology from the University of New South Wales, Australia","institution_ids":["https://openalex.org/I114017466"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024230702","display_name":"Chenghai LI","orcid":null},"institutions":[{"id":"https://openalex.org/I94951947","display_name":"University of Westminster","ror":"https://ror.org/04ycpbx82","country_code":"GB","type":"education","lineage":["https://openalex.org/I94951947"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"C.K. Li","raw_affiliation_strings":["University of Westminster, UK","B.Sc. degree with first-class honors from the University of Westminster, United Kingdom, his M.Sc. degree from London University, and his Ph.D. degree from the University of Westminster in 1976, 1978, and 1984, respectively"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Westminster, UK","institution_ids":["https://openalex.org/I94951947"]},{"raw_affiliation_string":"B.Sc. degree with first-class honors from the University of Westminster, United Kingdom, his M.Sc. degree from London University, and his Ph.D. degree from the University of Westminster in 1976, 1978, and 1984, respectively","institution_ids":["https://openalex.org/I94951947"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.3853,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.93926951,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"1","issue":"1","first_page":"43","last_page":"48"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/warranty","display_name":"Warranty","score":0.9828429222106934},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7821770310401917},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.7109776735305786},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6280619502067566},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6050481200218201},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.5172886848449707},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.5078573822975159},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.46455663442611694},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.3882591724395752},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.33460646867752075},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.25804781913757324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19765552878379822},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.09427392482757568},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08996590971946716}],"concepts":[{"id":"https://openalex.org/C2779056723","wikidata":"https://www.wikidata.org/wiki/Q329717","display_name":"Warranty","level":2,"score":0.9828429222106934},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7821770310401917},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.7109776735305786},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6280619502067566},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6050481200218201},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5172886848449707},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.5078573822975159},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.46455663442611694},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3882591724395752},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.33460646867752075},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.25804781913757324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19765552878379822},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.09427392482757568},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08996590971946716},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mce.2011.2172080","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mce.2011.2172080","pdf_url":null,"source":{"id":"https://openalex.org/S2483040032","display_name":"IEEE Consumer Electronics Magazine","issn_l":"2162-2248","issn":["2162-2248","2162-2256"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Consumer Electronics Magazine","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W158001369","https://openalex.org/W613140020","https://openalex.org/W1979913690","https://openalex.org/W1985121360","https://openalex.org/W1990115979","https://openalex.org/W2000964653","https://openalex.org/W2025772701","https://openalex.org/W2027430010","https://openalex.org/W2030728935","https://openalex.org/W2040651020","https://openalex.org/W2057113485","https://openalex.org/W2073171195","https://openalex.org/W2095500747","https://openalex.org/W2108154989","https://openalex.org/W2115300597","https://openalex.org/W2117572225","https://openalex.org/W2126903876","https://openalex.org/W2139075362","https://openalex.org/W2143245515","https://openalex.org/W2149772057","https://openalex.org/W2160998879","https://openalex.org/W2166927187","https://openalex.org/W2258468378","https://openalex.org/W2276078146","https://openalex.org/W3144575434","https://openalex.org/W6683359870","https://openalex.org/W6692489000","https://openalex.org/W6792908516"],"related_works":["https://openalex.org/W4247898262","https://openalex.org/W2038323968","https://openalex.org/W4386591436","https://openalex.org/W2374836656","https://openalex.org/W2382637078","https://openalex.org/W2351687577","https://openalex.org/W2373363799","https://openalex.org/W2386420233","https://openalex.org/W2576172759","https://openalex.org/W170871033"],"abstract_inverted_index":{"The":[0],"consumer":[1],"electronics":[2],"industry":[3],"needs":[4],"more":[5],"sophisticated":[6],"methods":[7],"for":[8],"assessing":[9],"product":[10,120],"reliability":[11],"than":[12],"those":[13],"documented":[14],"in":[15],"traditional":[16],"reliabilitv":[17],"handbooks":[18],"such":[19],"as":[20,29],"the":[21,36,65,83,130,140],"widely":[22],"adopted":[23],"U.S.":[24],"Military":[25],"MIL-HDBK-217":[26],"hand":[27],"book,":[28],"standard":[30],"laboratory":[31],"tests":[32,57],"fail":[33],"to":[34,43,48,108,114,128],"consider":[35],"fact":[37],"that":[38,69],"each":[39],"individual":[40,100],"device":[41,97],"sold":[42],"different":[44,49,53],"consumers":[45,137],"are":[46],"subjected":[47],"operating":[50],"environments":[51],"with":[52,106],"usage":[54],"profiles.":[55],"Standard":[56],"cannot":[58],"distinguish":[59],"between":[60],"two":[61],"identical":[62],"devices":[63],"from":[64,136],"same":[66],"production":[67],"line":[68],"may":[70,85],"have":[71],"been":[72],"used":[73,87],"a":[74],"little":[75],"and":[76,122,142],"were":[77],"well":[78],"taken":[79],"care":[80],"of,":[81],"while":[82],"other":[84],"be":[86,125],"heavily":[88],"under":[89],"rough":[90],"conditions.":[91],"Condition-based":[92],"monitoring":[93],"not":[94],"only":[95],"assesses":[96],"on":[98],"an":[99],"basis":[101],"but":[102],"also":[103],"provides":[104],"manufacturers":[105],"information":[107],"optimally":[109],"revise":[110],"warranty":[111,134,145],"support":[112],"programs":[113],"enhance":[115],"cost":[116,131],"effectiveness.":[117],"Further,":[118],"anv":[119],"misuse":[121],"maltreatment":[123],"can":[124],"readily":[126],"detected":[127],"reduce":[129],"of":[132,144],"providing":[133],"claims":[135],"who":[138],"violated":[139],"terms":[141],"conditions":[143],"coverage.":[146]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}