{"id":"https://openalex.org/W4220800309","doi":"https://doi.org/10.1109/mc.2021.3132710","title":"On the Testability of Artificial Intelligence and Machine Learning Systems","display_name":"On the Testability of Artificial Intelligence and Machine Learning Systems","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4220800309","doi":"https://doi.org/10.1109/mc.2021.3132710"},"language":"en","primary_location":{"id":"doi:10.1109/mc.2021.3132710","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mc.2021.3132710","pdf_url":"https://ieeexplore.ieee.org/ielx7/2/9734242/09734245.pdf","source":{"id":"https://openalex.org/S178916657","display_name":"Computer","issn_l":"0018-9162","issn":["0018-9162","1558-0814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/2/9734242/09734245.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037800748","display_name":"Raghvinder S. Sangwan","orcid":"https://orcid.org/0000-0002-3575-5441"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Raghvinder S. Sangwan","raw_affiliation_strings":["Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054494073","display_name":"Youakim Badr","orcid":"https://orcid.org/0000-0002-8976-7894"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Youakim Badr","raw_affiliation_strings":["Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021929717","display_name":"Satish Srinivasan","orcid":"https://orcid.org/0000-0003-1377-3726"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Satish Srinivasan","raw_affiliation_strings":["Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101800479","display_name":"Partha P. Mukherjee","orcid":"https://orcid.org/0000-0001-9244-8600"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Partha Mukherjee","raw_affiliation_strings":["Pennsylvania State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Pennsylvania State University","institution_ids":["https://openalex.org/I130769515"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130769515"],"apc_list":null,"apc_paid":null,"fwci":0.5249,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69230582,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"55","issue":"3","first_page":"101","last_page":"105"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9779999852180481,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9779999852180481,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9532999992370605,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9521999955177307,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8117657899856567},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7347666025161743},{"id":"https://openalex.org/keywords/granularity","display_name":"Granularity","score":0.6018826365470886},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5773382782936096},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.5681678056716919},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4554845690727234},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4207334816455841},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4165252149105072},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.38102883100509644},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.17990505695343018},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.16071009635925293},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10447466373443604}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8117657899856567},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7347666025161743},{"id":"https://openalex.org/C177774035","wikidata":"https://www.wikidata.org/wiki/Q1246948","display_name":"Granularity","level":2,"score":0.6018826365470886},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5773382782936096},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.5681678056716919},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4554845690727234},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4207334816455841},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4165252149105072},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.38102883100509644},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.17990505695343018},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.16071009635925293},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10447466373443604},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mc.2021.3132710","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mc.2021.3132710","pdf_url":"https://ieeexplore.ieee.org/ielx7/2/9734242/09734245.pdf","source":{"id":"https://openalex.org/S178916657","display_name":"Computer","issn_l":"0018-9162","issn":["0018-9162","1558-0814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/mc.2021.3132710","is_oa":true,"landing_page_url":"https://doi.org/10.1109/mc.2021.3132710","pdf_url":"https://ieeexplore.ieee.org/ielx7/2/9734242/09734245.pdf","source":{"id":"https://openalex.org/S178916657","display_name":"Computer","issn_l":"0018-9162","issn":["0018-9162","1558-0814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320310419","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4220800309.pdf","grobid_xml":"https://content.openalex.org/works/W4220800309.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W1800478330","https://openalex.org/W2462906003","https://openalex.org/W2945883466","https://openalex.org/W3007157104","https://openalex.org/W3087720408"],"related_works":["https://openalex.org/W2931688134","https://openalex.org/W2377919138","https://openalex.org/W2378857091","https://openalex.org/W4256502920","https://openalex.org/W103652678","https://openalex.org/W2999756192","https://openalex.org/W4226090359","https://openalex.org/W1979652744","https://openalex.org/W2154035833","https://openalex.org/W2107904603"],"abstract_inverted_index":{"This":[0],"article":[1],"examines":[2],"current":[3],"testing":[4,25],"techniques":[5],"for":[6],"the":[7,22],"quality":[8],"assurance":[9],"of":[10,24],"artificial":[11],"intelligence":[12],"and":[13,27],"machine":[14],"learning":[15],"systems.":[16],"It":[17],"organizes":[18],"them":[19],"based":[20],"on":[21],"granularity":[23],"level":[26],"explores":[28],"design":[29],"tactics":[30],"using":[31],"these":[32],"techniques.":[33]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
