{"id":"https://openalex.org/W1986833340","doi":"https://doi.org/10.1109/mc.1979.1658853","title":"Experience with Automated Testing Analysis","display_name":"Experience with Automated Testing Analysis","publication_year":1979,"publication_date":"1979-08-01","ids":{"openalex":"https://openalex.org/W1986833340","doi":"https://doi.org/10.1109/mc.1979.1658853","mag":"1986833340"},"language":"en","primary_location":{"id":"doi:10.1109/mc.1979.1658853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mc.1979.1658853","pdf_url":null,"source":{"id":"https://openalex.org/S178916657","display_name":"Computer","issn_l":"0018-9162","issn":["0018-9162","1558-0814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105946525","display_name":"Holthouse","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Holthouse","raw_affiliation_strings":["Analytic Sciences Corporation, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analytic Sciences Corporation, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106766029","display_name":"Hatch","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hatch","raw_affiliation_strings":["Analytic Sciences Corporation, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analytic Sciences Corporation, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.6986,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.88,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"12","issue":"8","first_page":"33","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8120641708374023},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.4612630009651184},{"id":"https://openalex.org/keywords/software-testing","display_name":"Software testing","score":0.42892590165138245},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2391277253627777},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.22135448455810547}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8120641708374023},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.4612630009651184},{"id":"https://openalex.org/C2984328558","wikidata":"https://www.wikidata.org/wiki/Q188522","display_name":"Software testing","level":3,"score":0.42892590165138245},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2391277253627777},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.22135448455810547}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mc.1979.1658853","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mc.1979.1658853","pdf_url":null,"source":{"id":"https://openalex.org/S178916657","display_name":"Computer","issn_l":"0018-9162","issn":["0018-9162","1558-0814"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320439","host_organization_name":"IEEE Computer Society","host_organization_lineage":["https://openalex.org/P4310320439","https://openalex.org/P4310319808"],"host_organization_lineage_names":["IEEE Computer Society","Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computer","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W205339378","https://openalex.org/W1972173511","https://openalex.org/W2011715836","https://openalex.org/W2060872943","https://openalex.org/W2141104706","https://openalex.org/W2143434204"],"related_works":["https://openalex.org/W2090301720","https://openalex.org/W3089971865","https://openalex.org/W3176274227","https://openalex.org/W2008194781","https://openalex.org/W2913502950","https://openalex.org/W1592877999","https://openalex.org/W4232483586","https://openalex.org/W2914660298","https://openalex.org/W4243211268","https://openalex.org/W1916954724"],"abstract_inverted_index":{"Automated":[0],"testing":[1,14],"analyzers":[2],"are":[3],"popular":[4],"software":[5,24],"test":[6],"tools.":[7],"Such":[8],"an":[9],"analyzer,":[10],"using":[11],"a":[12,17],"branch":[13],"strategy,":[15],"provides":[16],"cost-effective":[18],"way":[19],"of":[20],"increasing":[21],"confidence":[22],"in":[23],"behavior.":[25]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}