{"id":"https://openalex.org/W7161145324","doi":"https://doi.org/10.1109/lssc.2026.3692971","title":"Minimizing the Noise in Low-Current Sensing by MOSFET p-n Junction Diode Feedback","display_name":"Minimizing the Noise in Low-Current Sensing by MOSFET p-n Junction Diode Feedback","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7161145324","doi":"https://doi.org/10.1109/lssc.2026.3692971"},"language":null,"primary_location":{"id":"doi:10.1109/lssc.2026.3692971","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2026.3692971","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043489805","display_name":"Ehsan Semsar Parapari","orcid":"https://orcid.org/0000-0003-1122-1004"},"institutions":[{"id":"https://openalex.org/I4210136873","display_name":"Azienda-Unita' Sanitaria Locale Di Cesena","ror":"https://ror.org/04kgp1379","country_code":"IT","type":"government","lineage":["https://openalex.org/I4210136873"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Ehsan Semsar Parapari","raw_affiliation_strings":["Elements Srl, Cesena, Italy"],"raw_orcid":"https://orcid.org/0000-0003-1122-1004","affiliations":[{"raw_affiliation_string":"Elements Srl, Cesena, Italy","institution_ids":["https://openalex.org/I4210136873"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019890296","display_name":"Marco Bennati","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136873","display_name":"Azienda-Unita' Sanitaria Locale Di Cesena","ror":"https://ror.org/04kgp1379","country_code":"IT","type":"government","lineage":["https://openalex.org/I4210136873"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Bennati","raw_affiliation_strings":["Elements Srl, Cesena, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elements Srl, Cesena, Italy","institution_ids":["https://openalex.org/I4210136873"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5126419632","display_name":"Michele Biondi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136873","display_name":"Azienda-Unita' Sanitaria Locale Di Cesena","ror":"https://ror.org/04kgp1379","country_code":"IT","type":"government","lineage":["https://openalex.org/I4210136873"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Michele Biondi","raw_affiliation_strings":["Elements Srl, Cesena, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Elements Srl, Cesena, Italy","institution_ids":["https://openalex.org/I4210136873"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136176545","display_name":"Marco Crescentini","orcid":"https://orcid.org/0000-0001-8024-3077"},"institutions":[{"id":"https://openalex.org/I4210136873","display_name":"Azienda-Unita' Sanitaria Locale Di Cesena","ror":"https://ror.org/04kgp1379","country_code":"IT","type":"government","lineage":["https://openalex.org/I4210136873"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Crescentini","raw_affiliation_strings":["Department of Electrical, Electronic, and Information Engineering, University of Bologna, Cesena Campus, Cesena, Italy"],"raw_orcid":"https://orcid.org/0000-0001-8024-3077","affiliations":[{"raw_affiliation_string":"Department of Electrical, Electronic, and Information Engineering, University of Bologna, Cesena Campus, Cesena, Italy","institution_ids":["https://openalex.org/I4210136873"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5136091932","display_name":"Federico Thei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136873","display_name":"Azienda-Unita' Sanitaria Locale Di Cesena","ror":"https://ror.org/04kgp1379","country_code":"IT","type":"government","lineage":["https://openalex.org/I4210136873"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Federico Thei","raw_affiliation_strings":["Elements Srl, Cesena, Italy"],"raw_orcid":"https://orcid.org/0000-0002-3959-2002","affiliations":[{"raw_affiliation_string":"Elements Srl, Cesena, Italy","institution_ids":["https://openalex.org/I4210136873"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210136873"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.4133859,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":null,"first_page":"162","last_page":"165"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.28349998593330383,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.28349998593330383,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.2425999939441681,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.18060000240802765,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5266000032424927},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.45840001106262207},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.3589000105857849},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.3472999930381775},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.33899998664855957},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.29600000381469727}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5266000032424927},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.45840001106262207},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4390999972820282},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4171999990940094},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4124999940395355},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.385699987411499},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3774999976158142},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.3589000105857849},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.3472999930381775},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.33899998664855957},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33489999175071716},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.29600000381469727},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29249998927116394},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.2840999960899353},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.2818000018596649},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.2816999852657318},{"id":"https://openalex.org/C142083831","wikidata":"https://www.wikidata.org/wiki/Q2926532","display_name":"Burst noise","level":5,"score":0.2565000057220459}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lssc.2026.3692971","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2026.3692971","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.814163863658905,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1867948870","https://openalex.org/W1970975244","https://openalex.org/W1989057441","https://openalex.org/W2169455211","https://openalex.org/W2770963164","https://openalex.org/W2803083542","https://openalex.org/W2968741159","https://openalex.org/W3111262097","https://openalex.org/W3116615804","https://openalex.org/W4285262688","https://openalex.org/W4306645271","https://openalex.org/W4416214902"],"related_works":[],"abstract_inverted_index":{"This":[0],"letter":[1],"proposes":[2],"a":[3,19,23,96,101,114,120],"transimpedance":[4,115],"amplifier":[5],"(TIA)":[6],"architecture":[7],"that":[8,33],"minimizes":[9],"noise":[10,42,55,60,105],"for":[11],"continuous-time":[12],"(CT)":[13],"low-current":[14],"sensing.":[15],"The":[16,90],"approach":[17],"leverages":[18],"MOSFET":[20],"to":[21,62],"realize":[22],"pure":[24],"PN-junction":[25,64],"diode":[26],"as":[27],"the":[28,53,77],"TIA":[29,92],"feedback":[30,48],"element,":[31],"such":[32],"MOS":[34],"channel":[35],"conduction":[36],"is":[37,56,80],"completely":[38],"suppressed.":[39],"Therefore,":[40],"channel-induced":[41],"contributions":[43],"associated":[44],"with":[45,82,119],"conventional":[46],"MOS-based":[47],"TIAs":[49],"are":[50],"mitigated,":[51],"and":[52,87],"input-referred":[54,103],"dominated":[57],"by":[58],"shot":[59],"due":[61],"intrinsic":[63],"mechanisms,":[65],"which":[66],"remains":[67],"ultra-low":[68],"at":[69],"pA-level":[70],"input":[71],"currents.":[72],"To":[73],"enable":[74],"proper":[75],"evaluation,":[76],"proposed":[78],"concept":[79],"combined":[81],"architectural":[83],"enhancements,":[84],"ensuring":[85],"symmetric":[86],"linear":[88],"operation.":[89],"implemented":[91],"prototype,":[93],"fabricated":[94],"in":[95],"0.35-\u03bcm":[97],"CMOS":[98],"process,":[99],"demonstrates":[100],"minimum":[102],"current":[104],"density":[106],"of":[107,117,124],"1.5":[108],"fA/":[109],"\u221a":[110],"Hz,":[111],"while":[112],"providing":[113],"gain":[116],"100M\u03a9":[118],"\u20133":[121],"dB":[122],"bandwidth":[123],"700":[125],"kHz.":[126]},"counts_by_year":[],"updated_date":"2026-08-13T07:04:57.449891","created_date":"2026-05-15T00:00:00"}