{"id":"https://openalex.org/W4414110588","doi":"https://doi.org/10.1109/lssc.2025.3608187","title":"A 38.1 fJ/Bit Capacitive-Latch True Random Number Generator Featuring Both Autozeroed Inverter Mismatch and Accelerated Evaluation","display_name":"A 38.1 fJ/Bit Capacitive-Latch True Random Number Generator Featuring Both Autozeroed Inverter Mismatch and Accelerated Evaluation","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4414110588","doi":"https://doi.org/10.1109/lssc.2025.3608187"},"language":"en","primary_location":{"id":"doi:10.1109/lssc.2025.3608187","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3608187","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114461979","display_name":"Woojin Lee","orcid":"https://orcid.org/0009-0005-1873-2597"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Woojin Lee","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047022976","display_name":"Changmin Sim","orcid":"https://orcid.org/0009-0003-6748-1283"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]},{"id":"https://openalex.org/I4210089054","display_name":"Seoul Semiconductor (South Korea)","ror":"https://ror.org/007vmjm88","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210089054"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changmin Sim","raw_affiliation_strings":["Department of Semiconductor System Engineering, Korea University, Seoul, South Korea","Department of Semiconductor System Engineering, Korea University, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"Department of Semiconductor System Engineering, Korea University, South Korea","institution_ids":["https://openalex.org/I4210089054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064702531","display_name":"Changjoo Kim","orcid":"https://orcid.org/0009-0007-7839-2058"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changjoo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101932009","display_name":"Jin-Woo Jeon","orcid":"https://orcid.org/0000-0001-8034-9672"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]},{"id":"https://openalex.org/I4210089054","display_name":"Seoul Semiconductor (South Korea)","ror":"https://ror.org/007vmjm88","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210089054"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinwoo Jeon","raw_affiliation_strings":["Department of Semiconductor System Engineering, Korea University, Seoul, South Korea","Department of Semiconductor System Engineering, Korea University, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Semiconductor System Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"Department of Semiconductor System Engineering, Korea University, South Korea","institution_ids":["https://openalex.org/I4210089054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014354843","display_name":"Hyundo Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyundo Jung","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102890453","display_name":"Taesan Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taihyun Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100777100","display_name":"Chulwoo Kim","orcid":"https://orcid.org/0000-0003-4379-7905"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chulwoo Kim","raw_affiliation_strings":["Department of Electrical Engineering, Korea University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Korea University, Seoul, South Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5114461979"],"corresponding_institution_ids":["https://openalex.org/I197347611"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.24977488,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"8","issue":null,"first_page":"265","last_page":"268"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11017","display_name":"Chaos-based Image/Signal Encryption","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11017","display_name":"Chaos-based Image/Signal Encryption","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13182","display_name":"Quantum-Dot Cellular Automata","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11975","display_name":"Evolutionary Algorithms and Applications","score":0.9708999991416931,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7166000008583069},{"id":"https://openalex.org/keywords/random-number-generation","display_name":"Random number generation","score":0.6807000041007996},{"id":"https://openalex.org/keywords/nist","display_name":"NIST","score":0.6798999905586243},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.642799973487854},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5595999956130981},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5146999955177307},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4657000005245209},{"id":"https://openalex.org/keywords/randomness","display_name":"Randomness","score":0.4627000093460083},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4551999866962433}],"concepts":[{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7166000008583069},{"id":"https://openalex.org/C201866948","wikidata":"https://www.wikidata.org/wiki/Q228206","display_name":"Random number generation","level":2,"score":0.6807000041007996},{"id":"https://openalex.org/C111219384","wikidata":"https://www.wikidata.org/wiki/Q6954384","display_name":"NIST","level":2,"score":0.6798999905586243},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.642799973487854},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5625},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5595999956130981},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5146999955177307},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4984000027179718},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4657000005245209},{"id":"https://openalex.org/C125112378","wikidata":"https://www.wikidata.org/wiki/Q176640","display_name":"Randomness","level":2,"score":0.4627000093460083},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4551999866962433},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41929998993873596},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4041000008583069},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.38440001010894775},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.3474999964237213},{"id":"https://openalex.org/C18017163","wikidata":"https://www.wikidata.org/wiki/Q13560113","display_name":"Randomness tests","level":3,"score":0.32850000262260437},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.32109999656677246},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.3075000047683716},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29269999265670776},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.29120001196861267},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.2777999937534332},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2632000148296356},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.2621000111103058},{"id":"https://openalex.org/C157808515","wikidata":"https://www.wikidata.org/wiki/Q4781508","display_name":"Filter capacitor","level":4,"score":0.26030001044273376},{"id":"https://openalex.org/C68278764","wikidata":"https://www.wikidata.org/wiki/Q444167","display_name":"Capacitive coupling","level":3,"score":0.25999999046325684}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lssc.2025.3608187","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3608187","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1517403092","https://openalex.org/W2155332436","https://openalex.org/W2163359472","https://openalex.org/W2784781042","https://openalex.org/W2908207594","https://openalex.org/W3122652066","https://openalex.org/W3135413876","https://openalex.org/W4226024719","https://openalex.org/W4388505398","https://openalex.org/W4400525480"],"related_works":["https://openalex.org/W2028353274","https://openalex.org/W3149091528","https://openalex.org/W2944782356","https://openalex.org/W4410296103","https://openalex.org/W2984938468","https://openalex.org/W2422095090","https://openalex.org/W2257409576","https://openalex.org/W4407765690","https://openalex.org/W4407950573","https://openalex.org/W4254551318"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,79,86,116],"capacitive-latch":[4],"(C-latch)":[5],"true":[6],"random":[7],"number":[8],"generator":[9],"(TRNG)":[10],"that":[11],"achieves":[12,85],"both":[13,137],"inverter":[14,32,44],"mismatch":[15,30,45],"autozeroing":[16,43],"and":[17,46,73,98,125,133,139],"accelerated":[18],"evaluation":[19,72],"by":[20],"utilizing":[21],"coupling":[22,36,57],"capacitors.":[23],"The":[24],"proposed":[25],"C-latch":[26],"TRNG":[27,84],"samples":[28],"the":[29,39,60,64,83,99],"between":[31],"equalization":[33,40],"voltages":[34],"through":[35],"capacitors":[37,58],"during":[38],"phase,":[41],"effectively":[42],"enabling":[47],"high-entropy":[48],"raw":[49],"bit":[50],"generation":[51],"without":[52],"calibration.":[53],"In":[54],"addition,":[55],"larger":[56],"reduce":[59],"effective":[61],"capacitance":[62],"in":[63,70,78],"gate-node":[65],"stochastic":[66],"differential":[67],"equation,":[68],"resulting":[69],"faster":[71],"reduced":[74],"energy":[75,88],"consumption.":[76],"Fabricated":[77],"28-nm":[80],"CMOS":[81],"process,":[82],"minimum":[87],"consumption":[89],"of":[90,102],"38.1":[91],"fJ/bit":[92],"at":[93,105],"0.4":[94],"V":[95],"supply":[96],"voltage":[97,132],"maximum":[100],"throughput":[101],"162.48":[103],"Mb/s":[104],"0.9":[106],"V.":[107],"A":[108],"4-bit":[109],"von":[110],"Neumann":[111],"post":[112],"processor":[113],"consistently":[114],"extract":[115],"full":[117],"entropy,":[118],"which":[119],"successfully":[120],"passes":[121],"all":[122],"NIST":[123,126],"SP800-22":[124],"SP800-90B":[127],"randomness":[128],"tests":[129],"under":[130],"wide":[131],"temperature":[134],"variations,":[135],"implying":[136],"robustness":[138],"cryptographic":[140],"suitability.":[141]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-10-10T00:00:00"}