{"id":"https://openalex.org/W4414110587","doi":"https://doi.org/10.1109/lssc.2025.3608096","title":"A Linear Dynamic Voltage Scaling Technique With Adaptive Minimum Voltage Headroom Tracking for Implantable Neurostimulation","display_name":"A Linear Dynamic Voltage Scaling Technique With Adaptive Minimum Voltage Headroom Tracking for Implantable Neurostimulation","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4414110587","doi":"https://doi.org/10.1109/lssc.2025.3608096"},"language":"en","primary_location":{"id":"doi:10.1109/lssc.2025.3608096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3608096","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025896161","display_name":"Kai Cui","orcid":"https://orcid.org/0000-0003-0450-775X"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Cui","raw_affiliation_strings":["School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China"],"raw_orcid":"https://orcid.org/0000-0003-0450-775X","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Honglei Xu","orcid":"https://orcid.org/0009-0001-4644-7751"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honglei Xu","raw_affiliation_strings":["School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China"],"raw_orcid":"https://orcid.org/0009-0001-4644-7751","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103782535","display_name":"Yingduo Duan","orcid":"https://orcid.org/0009-0006-4131-311X"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingduo Duan","raw_affiliation_strings":["School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China"],"raw_orcid":"https://orcid.org/0009-0006-4131-311X","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071025160","display_name":"Yan L\u00fc","orcid":"https://orcid.org/0000-0001-9273-7576"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Lu","raw_affiliation_strings":["Department of Electronic Engineering, Tsinghua University, Beijing, China","Department of Electronic Engineering, Tsinghua University, Beijing, P. R. China"],"raw_orcid":"https://orcid.org/0000-0001-9273-7576","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Department of Electronic Engineering, Tsinghua University, Beijing, P. R. China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017058932","display_name":"Xiaoya Fan","orcid":"https://orcid.org/0000-0002-6190-8077"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoya Fan","raw_affiliation_strings":["School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China"],"raw_orcid":"https://orcid.org/0000-0002-6190-8077","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086943772","display_name":"Yanzhao Ma","orcid":"https://orcid.org/0000-0001-9261-6088"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanzhao Ma","raw_affiliation_strings":["School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China"],"raw_orcid":"https://orcid.org/0000-0001-9261-6088","affiliations":[{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Microelectronics, Northwestern Polytechnical University, Xi’an, P. R. China","institution_ids":["https://openalex.org/I17145004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22888348,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"8","issue":null,"first_page":"261","last_page":"264"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10784","display_name":"Muscle activation and electromyography studies","score":0.984000027179718,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10919","display_name":"Neurological disorders and treatments","score":0.9819999933242798,"subfield":{"id":"https://openalex.org/subfields/2728","display_name":"Neurology"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6248999834060669},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5849999785423279},{"id":"https://openalex.org/keywords/stimulus","display_name":"Stimulus (psychology)","score":0.4169999957084656},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4050999879837036},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.3296999931335449},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.32280001044273376}],"concepts":[{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6248999834060669},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5849999785423279},{"id":"https://openalex.org/C2779918689","wikidata":"https://www.wikidata.org/wiki/Q3771842","display_name":"Stimulus (psychology)","level":2,"score":0.4169999957084656},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40529999136924744},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4050999879837036},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36980000138282776},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.3296999931335449},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.32280001044273376},{"id":"https://openalex.org/C107464732","wikidata":"https://www.wikidata.org/wiki/Q235781","display_name":"Adaptive control","level":3,"score":0.2924000024795532},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2838999927043915},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.2632000148296356},{"id":"https://openalex.org/C6802819","wikidata":"https://www.wikidata.org/wiki/Q1072174","display_name":"Linear system","level":2,"score":0.2630999982357025},{"id":"https://openalex.org/C2776179129","wikidata":"https://www.wikidata.org/wiki/Q7998640","display_name":"Wide dynamic range","level":2,"score":0.2615000009536743},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.25760000944137573},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.2556999921798706}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lssc.2025.3608096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3608096","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2046820813","https://openalex.org/W2586828162","https://openalex.org/W2737046459","https://openalex.org/W3016136396","https://openalex.org/W3048219852","https://openalex.org/W3170203354","https://openalex.org/W4210906921","https://openalex.org/W4386230606","https://openalex.org/W4392979898","https://openalex.org/W4402568860","https://openalex.org/W4406553733"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4256510171","https://openalex.org/W2791717398","https://openalex.org/W2944375777","https://openalex.org/W2137484429","https://openalex.org/W2117151692","https://openalex.org/W2013769480","https://openalex.org/W2093044760","https://openalex.org/W2431651879","https://openalex.org/W2593331554"],"abstract_inverted_index":{"This":[0],"letter":[1],"presents":[2],"a":[3,11,57,76,93,98],"linear":[4,50],"dynamic":[5],"voltage":[6,18,96],"scaling":[7],"(DVS)":[8],"technique":[9,82],"using":[10],"dual-loop":[12],"multi-stage":[13],"chargepump":[14],"maintaining":[15],"the":[16,32,42,45,49,65,84,104,107],"minimum":[17],"headroom":[19],"for":[20],"implantable":[21],"neurostimulation.":[22],"By":[23],"adopting":[24],"an":[25],"analog":[26],"DVS":[27,81],"with":[28,97],"adaptive":[29],"feedback":[30],"divider,":[31],"stimulus":[33,54,86,108],"current":[34,109],"source":[35],"could":[36],"be":[37],"always":[38],"kept":[39],"operating":[40],"at":[41],"boundary":[43],"of":[44,68,101,106],"saturation":[46],"region":[47,51],"and":[48],"under":[52],"different":[53],"currents.":[55],"Furthermore,":[56],"simple":[58],"mode-switched":[59],"control":[60],"is":[61],"introduced":[62],"to":[63,89,113],"improve":[64],"loop":[66],"response":[67],"charge-pump.":[69],"The":[70,80],"design":[71],"has":[72],"been":[73],"fabricated":[74],"in":[75,103],"0.18-\u03bcm":[77],"BCD":[78],"process.":[79],"increases":[83],"measured":[85],"efficiency":[87,100],"up":[88],"52.8%":[90],"higher":[91],"than":[92],"fixed":[94],"supply":[95],"peak":[99],"89.6%":[102],"range":[105],"from":[110],"0.5":[111],"mA":[112],"0.9":[114],"mA.":[115]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}