{"id":"https://openalex.org/W4413074576","doi":"https://doi.org/10.1109/lssc.2025.3589611","title":"A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement","display_name":"A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4413074576","doi":"https://doi.org/10.1109/lssc.2025.3589611"},"language":"en","primary_location":{"id":"doi:10.1109/lssc.2025.3589611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3589611","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"},"type":"article","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2504.08305","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091946973","display_name":"Yuibi Gomi","orcid":null},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yuibi Gomi","raw_affiliation_strings":["Department of Informatics, Kyoto University, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0009-0005-6422-6425","affiliations":[{"raw_affiliation_string":"Department of Informatics, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061547032","display_name":"Akira Sato","orcid":"https://orcid.org/0000-0002-3617-8121"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Sato","raw_affiliation_strings":["Department of Physics, Osaka University, Toyonaka, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Osaka University, Toyonaka, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060789782","display_name":"Waleed Madany","orcid":"https://orcid.org/0000-0002-5653-9983"},"institutions":[{"id":"https://openalex.org/I4400009020","display_name":"Institute of Science Tokyo","ror":"https://ror.org/05dqf9946","country_code":null,"type":"education","lineage":["https://openalex.org/I4400009020"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Waleed Madany","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-5653-9983","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I4400009020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064086312","display_name":"Kenichi Okada","orcid":"https://orcid.org/0000-0002-1082-7672"},"institutions":[{"id":"https://openalex.org/I4400009020","display_name":"Institute of Science Tokyo","ror":"https://ror.org/05dqf9946","country_code":null,"type":"education","lineage":["https://openalex.org/I4400009020"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenichi Okada","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan"],"raw_orcid":"https://orcid.org/0000-0002-1082-7672","affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Institute of Science Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I4400009020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041721347","display_name":"Satoshi Adachi","orcid":"https://orcid.org/0000-0002-8454-3971"},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Adachi","raw_affiliation_strings":["Research Center for Accelerator and Radioisotope Science (RARiS), Tohoku University, Sendai, Japan"],"raw_orcid":"https://orcid.org/0000-0002-8454-3971","affiliations":[{"raw_affiliation_string":"Research Center for Accelerator and Radioisotope Science (RARiS), Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100840033","display_name":"Masatoshi Itoh","orcid":null},"institutions":[{"id":"https://openalex.org/I201537933","display_name":"Tohoku University","ror":"https://ror.org/01dq60k83","country_code":"JP","type":"education","lineage":["https://openalex.org/I201537933"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masatoshi Itoh","raw_affiliation_strings":["Research Center for Accelerator and Radioisotope Science (RARiS), Tohoku University, Sendai, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Center for Accelerator and Radioisotope Science (RARiS), Tohoku University, Sendai, Japan","institution_ids":["https://openalex.org/I201537933"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002405139","display_name":"Masanori Hashimoto","orcid":"https://orcid.org/0000-0002-0377-2108"},"institutions":[{"id":"https://openalex.org/I22299242","display_name":"Kyoto University","ror":"https://ror.org/02kpeqv85","country_code":"JP","type":"education","lineage":["https://openalex.org/I22299242"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masanori Hashimoto","raw_affiliation_strings":["Department of Informatics, Kyoto University, Kyoto, Japan"],"raw_orcid":"https://orcid.org/0000-0002-0377-2108","affiliations":[{"raw_affiliation_string":"Department of Informatics, Kyoto University, Kyoto, Japan","institution_ids":["https://openalex.org/I22299242"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5091946973"],"corresponding_institution_ids":["https://openalex.org/I22299242"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17337026,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"8","issue":null,"first_page":"245","last_page":"248"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8912156224250793},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5919109582901001},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5801378488540649},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4950961172580719},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.49499982595443726},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4261154234409332},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.273567795753479},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2402673065662384},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17678150534629822},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16515690088272095},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10368716716766357}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8912156224250793},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5919109582901001},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5801378488540649},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4950961172580719},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.49499982595443726},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4261154234409332},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.273567795753479},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2402673065662384},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17678150534629822},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16515690088272095},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10368716716766357},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/lssc.2025.3589611","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3589611","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2504.08305","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2504.08305","pdf_url":"https://arxiv.org/pdf/2504.08305","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2504.08305","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2504.08305","pdf_url":"https://arxiv.org/pdf/2504.08305","source":{"id":"https://openalex.org/S4393918464","display_name":"ArXiv.org","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G522892186","display_name":null,"funder_award_id":"24H00073","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G6550208139","display_name":null,"funder_award_id":"JP19H05664","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2072397237","https://openalex.org/W2132286986","https://openalex.org/W2148186459","https://openalex.org/W2173097224","https://openalex.org/W2546044294","https://openalex.org/W3099426297","https://openalex.org/W4388133405","https://openalex.org/W4406858340","https://openalex.org/W4407566455"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2622269177","https://openalex.org/W2363504003","https://openalex.org/W1523508240","https://openalex.org/W2548582980","https://openalex.org/W2102538861","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W3208260600"],"abstract_inverted_index":{"We":[0],"developed":[1,38],"a":[2,30,111],"55":[3],"nm":[4],"CMOS":[5],"static":[6],"random":[7],"access":[8],"memory":[9],"(SRAM)":[10],"chip":[11,39,90],"that":[12,68],"scans":[13],"all":[14],"data":[15,24],"every":[16],"125":[17],"ns":[18],"and":[19,40,48,55,65,91,117],"outputs":[20],"timestamped":[21],"soft":[22,45],"error":[23,46],"via":[25],"an":[26],"SPI":[27],"interface":[28],"through":[29],"FIFO.":[31],"The":[32],"proposed":[33],"system,":[34],"consisting":[35],"of":[36,51,125],"the":[37,83,88,92],"particle":[41,93],"detectors,":[42],"enables":[43],"event-wise":[44],"measurement":[47],"precise":[49],"identification":[50],"single":[52],"bit":[53],"upset":[54],"multiple-cell":[56],"upsets":[57],"(MCUs),":[58],"thus":[59],"resolving":[60],"misclassifications":[61],"such":[62],"as":[63],"Pseudo-":[64],"Distant":[66],"MCUs":[67],"conventional":[69],"methods":[70],"cannot":[71],"distinguish.":[72],"An":[73],"80-MeV":[74],"proton":[75],"irradiation":[76],"experiment":[77],"at":[78],"RARiS,":[79],"Tohoku":[80],"University":[81],"verified":[82],"system":[84],"operation.":[85],"Timestamps":[86],"between":[87],"SRAM":[89],"detectors":[94],"were":[95],"successfully":[96],"synchronized,":[97],"accounting":[98],"for":[99],"PLL":[100],"disturbances":[101],"caused":[102],"by":[103,109],"radiation.":[104],"Event":[105],"building":[106],"was":[107,120],"achieved":[108],"determining":[110],"reset":[112],"offset":[113],"with":[114],"sub-ns":[115],"resolution,":[116],"spatial":[118],"synchronization":[119],"maintained":[121],"within":[122],"several":[123],"tens":[124],"micrometers.":[126]},"counts_by_year":[],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}