{"id":"https://openalex.org/W4411471926","doi":"https://doi.org/10.1109/lssc.2025.3581584","title":"A 10.9-nV/\u221aHz, 74.9-dB DR, 20-MS/s Ultrasound Analog Front End for Fully Digital Beamforming","display_name":"A 10.9-nV/\u221aHz, 74.9-dB DR, 20-MS/s Ultrasound Analog Front End for Fully Digital Beamforming","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4411471926","doi":"https://doi.org/10.1109/lssc.2025.3581584"},"language":"en","primary_location":{"id":"doi:10.1109/lssc.2025.3581584","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3581584","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Changde Ding","orcid":"https://orcid.org/0009-0003-0496-1546"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Changde Ding","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0003-0496-1546","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041077139","display_name":"Yan Zhu","orcid":"https://orcid.org/0000-0001-7342-3782"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Zhu","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050090260","display_name":"Pengjie Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengjie Wang","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0009-0000-9006-8946","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082092557","display_name":"Zhiliang Hong","orcid":"https://orcid.org/0000-0002-9968-5964"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Hong","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9968-5964","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089070385","display_name":"Jiawei Xu","orcid":"https://orcid.org/0000-0002-4150-0971"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Xu","raw_affiliation_strings":["State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-4150-0971","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.20931201,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"8","issue":null,"first_page":"185","last_page":"188"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10727","display_name":"Ultrasound Imaging and Elastography","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},"topics":[{"id":"https://openalex.org/T10727","display_name":"Ultrasound Imaging and Elastography","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","score":0.963100016117096,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9524000287055969,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.7122043967247009},{"id":"https://openalex.org/keywords/beamforming","display_name":"Beamforming","score":0.6898578405380249},{"id":"https://openalex.org/keywords/analog-front-end","display_name":"Analog front-end","score":0.6525381207466125},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.46538227796554565},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3958989381790161},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35041922330856323},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3309818506240845},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2917397618293762},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2630414664745331},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.21569564938545227},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.053410619497299194}],"concepts":[{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.7122043967247009},{"id":"https://openalex.org/C54197355","wikidata":"https://www.wikidata.org/wiki/Q5782992","display_name":"Beamforming","level":2,"score":0.6898578405380249},{"id":"https://openalex.org/C2778870119","wikidata":"https://www.wikidata.org/wiki/Q16002927","display_name":"Analog front-end","level":3,"score":0.6525381207466125},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.46538227796554565},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3958989381790161},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35041922330856323},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3309818506240845},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2917397618293762},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2630414664745331},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.21569564938545227},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.053410619497299194},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lssc.2025.3581584","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3581584","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8399999737739563}],"awards":[{"id":"https://openalex.org/G1976581355","display_name":null,"funder_award_id":"2022YFB4400800","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2111186324","https://openalex.org/W2564345649","https://openalex.org/W2889595172","https://openalex.org/W2892743721","https://openalex.org/W2901134537","https://openalex.org/W2970445595","https://openalex.org/W4295036168","https://openalex.org/W4385696367","https://openalex.org/W4391467944","https://openalex.org/W6757700659"],"related_works":["https://openalex.org/W2019044074","https://openalex.org/W2744701634","https://openalex.org/W1988799405","https://openalex.org/W4391311879","https://openalex.org/W2079771749","https://openalex.org/W2146322466","https://openalex.org/W3144946090","https://openalex.org/W1974376478","https://openalex.org/W4306768468","https://openalex.org/W2040185614"],"abstract_inverted_index":{"This":[0],"letter":[1],"presents":[2],"a":[3,31,36,41,56,95,103],"compact":[4],"and":[5,16,40,50,70,82,120],"energy-efficient":[6],"analog":[7,24],"front-end":[8],"(AFE)":[9],"circuit":[10],"for":[11],"fully-digital":[12],"beamforming":[13],"in":[14,94],"endoscopic":[15],"catheter-based":[17],"3D-ultrasound":[18],"imaging.":[19],"The":[20,127],"AFE":[21,101],"converts":[22],"single-ended":[23],"input":[25,117],"from":[26],"each":[27],"transducer":[28],"element":[29],"into":[30],"10-bit":[32],"digital":[33,71],"output":[34],"through":[35],"low-noise":[37],"amplifier":[38,59],"(LNA)":[39],"20":[42],"MS/s":[43],"SAR":[44],"ADC.":[45],"To":[46],"minimize":[47],"chip":[48],"area":[49,106],"power":[51,62,129],"consumption,":[52],"the":[53,65,79,83,99],"LNA":[54],"employs":[55],"capacitor-splitting":[57],"inverterbased":[58],"with":[60],"dynamic":[61,113],"control,":[63],"while":[64],"ADC":[66],"utilizes":[67],"unit-length":[68],"capacitors":[69],"error":[72],"correction.":[73],"A":[74],"modified":[75],"monotonic":[76],"switching":[77],"improves":[78],"conversion":[80],"rate,":[81],"kickback":[84],"noise":[85],"is":[86,131],"reduced":[87],"by":[88],"an":[89],"enhanced":[90],"Elzakker":[91],"comparator.":[92],"Fabricated":[93],"0.18\u03bcm":[96],"CMOS":[97],"process,":[98],"ultrasound":[100],"occupies":[102],"low":[104],"silicon":[105],"of":[107],"0.052":[108],"mm2/channel,":[109],"achieves":[110],"74.93":[111],"dB":[112,122],"range":[114],"(DR),":[115],"10.9nV/\u221aHz":[116],"referred":[118],"noise,":[119],"-58.33":[121],"total":[123],"harmonic":[124],"distortion":[125],"(THD).":[126],"average":[128],"consumption":[130],"1.34mW/channel.":[132]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}