{"id":"https://openalex.org/W4409356487","doi":"https://doi.org/10.1109/lssc.2025.3559900","title":"A MOS-Based Temperature Sensor With Energy-Efficient Techniques","display_name":"A MOS-Based Temperature Sensor With Energy-Efficient Techniques","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4409356487","doi":"https://doi.org/10.1109/lssc.2025.3559900"},"language":"en","primary_location":{"id":"doi:10.1109/lssc.2025.3559900","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3559900","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082386430","display_name":"Jooeun Kim","orcid":"https://orcid.org/0000-0002-2590-6795"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jooeun Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2590-6795","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079397184","display_name":"Jeongmyeong Kim","orcid":"https://orcid.org/0000-0002-6498-1309"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeongmyeong Kim","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-6498-1309","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037296602","display_name":"Minkyu Yang","orcid":"https://orcid.org/0000-0002-2915-1481"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minkyu Yang","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-2915-1481","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028892416","display_name":"Kyounghun Kang","orcid":"https://orcid.org/0000-0001-7307-1457"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyounghun Kang","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-7307-1457","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034737783","display_name":"Wanyeong Jung","orcid":"https://orcid.org/0000-0002-5671-1341"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wanyeong Jung","raw_affiliation_strings":["School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-5671-1341","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5082386430"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":0.6531,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68406278,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"8","issue":null,"first_page":"109","last_page":"112"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.8960000276565552,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.8960000276565552,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.8787999749183655,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.8360999822616577,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4775451123714447},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40337979793548584},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33861708641052246},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.3249322474002838},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17313224077224731}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4775451123714447},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40337979793548584},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33861708641052246},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3249322474002838},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17313224077224731}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lssc.2025.3559900","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lssc.2025.3559900","pdf_url":null,"source":{"id":"https://openalex.org/S4210192596","display_name":"IEEE Solid-State Circuits Letters","issn_l":"2573-9603","issn":["2573-9603"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Solid-State Circuits Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2072872087","https://openalex.org/W2093290783","https://openalex.org/W2997030307","https://openalex.org/W3040027038","https://openalex.org/W3083634856","https://openalex.org/W3155524421","https://openalex.org/W4365420985","https://openalex.org/W4392739401","https://openalex.org/W4406895399"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4404995717","https://openalex.org/W2016187641","https://openalex.org/W4404725684","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W4409278740","https://openalex.org/W2898370298"],"abstract_inverted_index":{"This":[0],"letter":[1],"presents":[2],"an":[3,66],"energy-efficient":[4,19],"MOS-based":[5,155],"temperature":[6,83,89],"sensor,":[7],"enhanced":[8],"through":[9],"transducer":[10,22],"and":[11,18,23,47,61,79,98,123,140],"readout":[12,24],"circuit":[13,25],"integrated":[14,26],"design,":[15],"LSB-first":[16,45,54],"SAR,":[17],"comparator.":[20],"The":[21,53,88],"design":[27],"reduces":[28,56],"noise":[29],"by":[30],"combining":[31],"two":[32],"blocks":[33],"into":[34],"one.":[35],"With":[36],"temperature-dependent":[37],"offset":[38],"voltage,":[39],"the":[40,44,57,70,73,99,120,134,147],"comparator":[41],"integrates":[42],"with":[43,93,111],"SAR":[46,55],"is":[48],"optimized":[49],"for":[50,75],"energy":[51,62],"efficiency.":[52],"number":[58],"of":[59,151],"cycles":[60],"consumption.":[63],"In":[64],"addition,":[65],"asynchronous":[67],"clock":[68],"controls":[69],"circuit,":[71],"eliminating":[72],"need":[74],"a":[76,94,112],"timing":[77],"reference":[78],"adjusting":[80],"speed":[81],"to":[82,84,103,128],"increase":[85],"measurement":[86,106],"robustness.":[87],"sensor":[90,100,135],"was":[91],"fabricated":[92],"65nm":[95],"CMOS":[96],"process,":[97],"has":[101],"60":[102],"145":[104],"\u2218C":[105,118,125],"range.":[107],"After":[108],"two-point":[109],"calibration":[110],"second-order":[113],"polynomial,":[114],"errors":[115],"are":[116],"1.93/+1.44":[117],"over":[119],"entire":[121],"range":[122],"0.96/+0.94":[124],"from":[126],"43":[127],"137":[129],"\u2218C.":[130],"At":[131],"room":[132],"temperature,":[133],"achieves":[136],"71.8":[137],"mK":[138],"resolution":[139,149],"41.9":[141],"pJ":[142],"per":[143],"conversion,":[144],"resulting":[145],"in":[146],"best":[148],"figure-of-merit":[150],"216":[152],"fJ\u2219K":[153],"among":[154],"sensors.":[156]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}