{"id":"https://openalex.org/W4390968860","doi":"https://doi.org/10.1109/lra.2024.3355773","title":"Correcting Non-Uniform Sensitivity in EIT Tactile Sensing via Jacobian Vector Approximation","display_name":"Correcting Non-Uniform Sensitivity in EIT Tactile Sensing via Jacobian Vector Approximation","publication_year":2024,"publication_date":"2024-01-18","ids":{"openalex":"https://openalex.org/W4390968860","doi":"https://doi.org/10.1109/lra.2024.3355773"},"language":"en","primary_location":{"id":"doi:10.1109/lra.2024.3355773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lra.2024.3355773","pdf_url":null,"source":{"id":"https://openalex.org/S4210169774","display_name":"IEEE Robotics and Automation Letters","issn_l":"2377-3766","issn":["2377-3766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Robotics and Automation Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059507014","display_name":"Haofeng Chen","orcid":"https://orcid.org/0000-0003-4965-2301"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210099079","display_name":"Institute of Intelligent Machines","ror":"https://ror.org/00w0qep84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210099079"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haofeng Chen","raw_affiliation_strings":["Institute of Intelligent Machines, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, China","Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-4965-2301","affiliations":[{"raw_affiliation_string":"Institute of Intelligent Machines, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I4210099079","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101780772","display_name":"Xuanxuan Yang","orcid":"https://orcid.org/0000-0001-9174-1063"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210099079","display_name":"Institute of Intelligent Machines","ror":"https://ror.org/00w0qep84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210099079"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuanxuan Yang","raw_affiliation_strings":["Institute of Intelligent Machines, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, China","Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-9174-1063","affiliations":[{"raw_affiliation_string":"Institute of Intelligent Machines, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I4210099079","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033545990","display_name":"Gang Ma","orcid":"https://orcid.org/0000-0001-5822-7556"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gang Ma","raw_affiliation_strings":["Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0001-5822-7556","affiliations":[{"raw_affiliation_string":"Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100351295","display_name":"Xiaojie Wang","orcid":"https://orcid.org/0000-0002-4740-7882"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I2802624667","display_name":"Hefei Institutes of Physical Science","ror":"https://ror.org/046n57345","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667"]},{"id":"https://openalex.org/I4210099079","display_name":"Institute of Intelligent Machines","ror":"https://ror.org/00w0qep84","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I2802624667","https://openalex.org/I4210099079"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaojie Wang","raw_affiliation_strings":["Institute of Intelligent Machines, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-4740-7882","affiliations":[{"raw_affiliation_string":"Institute of Intelligent Machines, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei, China","institution_ids":["https://openalex.org/I2802624667","https://openalex.org/I4210099079","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5577,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.82029864,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"9","issue":"3","first_page":"2335","last_page":"2342"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9782999753952026,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jacobian-matrix-and-determinant","display_name":"Jacobian matrix and determinant","score":0.8510406017303467},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6971212029457092},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6430984139442444},{"id":"https://openalex.org/keywords/tactile-sensor","display_name":"Tactile sensor","score":0.6167048215866089},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5475871562957764},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5127533674240112},{"id":"https://openalex.org/keywords/imaging-phantom","display_name":"Imaging phantom","score":0.5055270195007324},{"id":"https://openalex.org/keywords/robot","display_name":"Robot","score":0.5003468990325928},{"id":"https://openalex.org/keywords/electrical-impedance-tomography","display_name":"Electrical impedance tomography","score":0.49345460534095764},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3659075200557709},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3583679795265198},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3228326141834259},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.30901193618774414},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.30847376585006714},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22660773992538452},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1880873441696167},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18339359760284424},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.13689002394676208},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1148945689201355}],"concepts":[{"id":"https://openalex.org/C200331156","wikidata":"https://www.wikidata.org/wiki/Q506041","display_name":"Jacobian matrix and determinant","level":2,"score":0.8510406017303467},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6971212029457092},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6430984139442444},{"id":"https://openalex.org/C46722567","wikidata":"https://www.wikidata.org/wiki/Q7674139","display_name":"Tactile sensor","level":3,"score":0.6167048215866089},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5475871562957764},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5127533674240112},{"id":"https://openalex.org/C104293457","wikidata":"https://www.wikidata.org/wiki/Q28324852","display_name":"Imaging phantom","level":2,"score":0.5055270195007324},{"id":"https://openalex.org/C90509273","wikidata":"https://www.wikidata.org/wiki/Q11012","display_name":"Robot","level":2,"score":0.5003468990325928},{"id":"https://openalex.org/C155175808","wikidata":"https://www.wikidata.org/wiki/Q1326472","display_name":"Electrical impedance tomography","level":3,"score":0.49345460534095764},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3659075200557709},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3583679795265198},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3228326141834259},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.30901193618774414},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.30847376585006714},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22660773992538452},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1880873441696167},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18339359760284424},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13689002394676208},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1148945689201355},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lra.2024.3355773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lra.2024.3355773","pdf_url":null,"source":{"id":"https://openalex.org/S4210169774","display_name":"IEEE Robotics and Automation Letters","issn_l":"2377-3766","issn":["2377-3766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Robotics and Automation Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1098162945","display_name":null,"funder_award_id":"62303436","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8069724935","display_name":null,"funder_award_id":"WK5290000004","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1992153419","https://openalex.org/W1993323973","https://openalex.org/W2034658223","https://openalex.org/W2037486375","https://openalex.org/W2041556066","https://openalex.org/W2112890043","https://openalex.org/W2113761410","https://openalex.org/W2516314007","https://openalex.org/W3095708125","https://openalex.org/W3173189733","https://openalex.org/W3188369056","https://openalex.org/W4200014843","https://openalex.org/W4226188202","https://openalex.org/W4226226871","https://openalex.org/W4286859924","https://openalex.org/W4308499529","https://openalex.org/W4312616583","https://openalex.org/W4312912495","https://openalex.org/W4322724845","https://openalex.org/W4388688088","https://openalex.org/W6803142512"],"related_works":["https://openalex.org/W2359871536","https://openalex.org/W1992681652","https://openalex.org/W2991320615","https://openalex.org/W1979972895","https://openalex.org/W2007405763","https://openalex.org/W3136087161","https://openalex.org/W1486373823","https://openalex.org/W2944246511","https://openalex.org/W4285180073","https://openalex.org/W2017349683"],"abstract_inverted_index":{"Electrical":[0],"impedance":[1],"tomography":[2],"(EIT)-based":[3],"tactile":[4,156,180],"sensors":[5,63,181],"enable":[6],"promising":[7,175],"capabilities":[8,176],"for":[9],"safe":[10,190],"human-robot":[11,184],"interaction":[12,185],"through":[13,96],"large-area":[14,179],"distributed":[15],"force":[16,36,143],"sensing.":[17],"However,":[18],"their":[19],"practical":[20],"realization":[21],"is":[22],"hampered":[23],"by":[24,64],"non-uniform":[25],"sensitivity":[26,60,80,188],"distribution":[27],"which":[28,100],"varies":[29],"at":[30],"different":[31],"locations.":[32],"This":[33,76],"prevents":[34],"reliable":[35],"calibration":[37,88],"and":[38,133,140],"measurement.":[39],"We":[40,91],"propose":[41],"a":[42,66,130,159,169],"novel":[43],"Jacobian":[44,74],"vector":[45,69],"correction":[46],"(JVC)":[47],"method":[48,56,95,119],"to":[49,147,189],"address":[50],"this":[51],"critical":[52],"challenge.":[53],"The":[54,118,164],"JVC":[55,94,166],"corrects":[57],"the":[58,72,82,93,104,154,174],"spatial":[59],"of":[61,161,177],"EIT":[62,125],"constructing":[65],"tailored":[67],"scaling":[68],"derived":[70],"from":[71,145],"system's":[73],"matrix.":[75],"achieves":[77],"approximately":[78],"uniform":[79],"across":[81,150,182],"entire":[83],"sensing":[84],"area":[85],"without":[86],"extensive":[87],"data":[89],"requirements.":[90],"evaluated":[92],"detailed":[97],"FEM":[98],"simulations":[99],"provided":[101],"insights":[102],"into":[103,123],"working":[105],"principles.":[106],"Phantom":[107],"experiments":[108],"using":[109],"test":[110],"objects":[111],"with":[112,158],"various":[113],"conductivities":[114],"validated":[115],"its":[116],"robustness.":[117],"was":[120],"further":[121],"integrated":[122],"an":[124],"sensor":[126,157],"prototype":[127],"based":[128],"on":[129,153],"porous":[131],"polymer":[132],"ionic":[134],"liquid":[135],"structure.":[136],"Tests":[137],"showed":[138],"accurate":[139],"consistent":[141],"touch":[142,191],"prediction":[144],"0":[146],"4":[148],"N":[149],"diverse":[151,183],"locations":[152],"circular":[155],"diameter":[160],"10":[162],"cm.":[163],"proposed":[165],"approach":[167],"represents":[168],"significant":[170],"advance":[171],"in":[172],"realizing":[173],"EIT-based":[178],"scenarios":[186],"requiring":[187],"forces.":[192]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}