{"id":"https://openalex.org/W3176211900","doi":"https://doi.org/10.1109/lra.2021.3093008","title":"High Dynamic Range 6-Axis Force Sensor Employing a Semiconductor\u2013Metallic Foil Strain Gauge Combination","display_name":"High Dynamic Range 6-Axis Force Sensor Employing a Semiconductor\u2013Metallic Foil Strain Gauge Combination","publication_year":2021,"publication_date":"2021-06-28","ids":{"openalex":"https://openalex.org/W3176211900","doi":"https://doi.org/10.1109/lra.2021.3093008","mag":"3176211900"},"language":"en","primary_location":{"id":"doi:10.1109/lra.2021.3093008","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lra.2021.3093008","pdf_url":null,"source":{"id":"https://openalex.org/S4210169774","display_name":"IEEE Robotics and Automation Letters","issn_l":"2377-3766","issn":["2377-3766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Robotics and Automation Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048635099","display_name":"Ryuya Tamura","orcid":null},"institutions":[{"id":"https://openalex.org/I72253084","display_name":"Saitama University","ror":"https://ror.org/02evnh647","country_code":"JP","type":"education","lineage":["https://openalex.org/I72253084"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryuya Tamura","raw_affiliation_strings":["Department of Electrical Engineering, Electronics and Applied Physics, Saitama University, Saitama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Electronics and Applied Physics, Saitama University, Saitama, Japan","institution_ids":["https://openalex.org/I72253084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112658496","display_name":"Tomoki Horikoshi","orcid":null},"institutions":[{"id":"https://openalex.org/I72253084","display_name":"Saitama University","ror":"https://ror.org/02evnh647","country_code":"JP","type":"education","lineage":["https://openalex.org/I72253084"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomoki Horikoshi","raw_affiliation_strings":["Department of Electrical Engineering, Electronics and Applied Physics, Saitama University, Saitama, Japan"],"raw_orcid":"https://orcid.org/0000-0002-4532-4514","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Electronics and Applied Physics, Saitama University, Saitama, Japan","institution_ids":["https://openalex.org/I72253084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065050034","display_name":"Sho Sakaino","orcid":"https://orcid.org/0000-0002-5182-5649"},"institutions":[{"id":"https://openalex.org/I146399215","display_name":"University of Tsukuba","ror":"https://ror.org/02956yf07","country_code":"JP","type":"education","lineage":["https://openalex.org/I146399215"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sho Sakaino","raw_affiliation_strings":["Graduate School of Systems and Information Engineering, University of Tsukuba, Ibaraki, Japan"],"raw_orcid":"https://orcid.org/0000-0002-5182-5649","affiliations":[{"raw_affiliation_string":"Graduate School of Systems and Information Engineering, University of Tsukuba, Ibaraki, Japan","institution_ids":["https://openalex.org/I146399215"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017159721","display_name":"Toshiaki Tsuji","orcid":"https://orcid.org/0000-0002-4532-4514"},"institutions":[{"id":"https://openalex.org/I72253084","display_name":"Saitama University","ror":"https://ror.org/02evnh647","country_code":"JP","type":"education","lineage":["https://openalex.org/I72253084"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiaki Tsuji","raw_affiliation_strings":["Department of Electrical Engineering, Electronics and Applied Physics, Saitama University, Saitama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Electronics and Applied Physics, Saitama University, Saitama, Japan","institution_ids":["https://openalex.org/I72253084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.7832,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.83768393,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"6","issue":"4","first_page":"6243","last_page":"6249"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10338","display_name":"Advanced Sensor and Energy Harvesting Materials","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/strain-gauge","display_name":"Strain gauge","score":0.900580883026123},{"id":"https://openalex.org/keywords/foil-method","display_name":"FOIL method","score":0.6448737978935242},{"id":"https://openalex.org/keywords/strain","display_name":"Strain (injury)","score":0.6221513152122498},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.5798084735870361},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5321661233901978},{"id":"https://openalex.org/keywords/dynamic-range","display_name":"Dynamic range","score":0.53070467710495},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4952313005924225},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4668719470500946},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31420958042144775},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.3035900592803955},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2563403248786926},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23705792427062988},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.1826368272304535},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16586026549339294}],"concepts":[{"id":"https://openalex.org/C60584519","wikidata":"https://www.wikidata.org/wiki/Q610723","display_name":"Strain gauge","level":2,"score":0.900580883026123},{"id":"https://openalex.org/C7363328","wikidata":"https://www.wikidata.org/wiki/Q5426847","display_name":"FOIL method","level":2,"score":0.6448737978935242},{"id":"https://openalex.org/C2778022156","wikidata":"https://www.wikidata.org/wiki/Q576145","display_name":"Strain (injury)","level":2,"score":0.6221513152122498},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.5798084735870361},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5321661233901978},{"id":"https://openalex.org/C87133666","wikidata":"https://www.wikidata.org/wiki/Q1161699","display_name":"Dynamic range","level":2,"score":0.53070467710495},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4952313005924225},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4668719470500946},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31420958042144775},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3035900592803955},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2563403248786926},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23705792427062988},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.1826368272304535},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16586026549339294},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lra.2021.3093008","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lra.2021.3093008","pdf_url":null,"source":{"id":"https://openalex.org/S4210169774","display_name":"IEEE Robotics and Automation Letters","issn_l":"2377-3766","issn":["2377-3766"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Robotics and Automation Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.44999998807907104,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1964599152","https://openalex.org/W1980908923","https://openalex.org/W2010951383","https://openalex.org/W2028679076","https://openalex.org/W2084321111","https://openalex.org/W2135455531","https://openalex.org/W2137458859","https://openalex.org/W2138735009","https://openalex.org/W2150347298","https://openalex.org/W2159144495","https://openalex.org/W2315725482","https://openalex.org/W2745261858","https://openalex.org/W2792339997","https://openalex.org/W2792735655","https://openalex.org/W2793156678","https://openalex.org/W2890585863","https://openalex.org/W2968613918","https://openalex.org/W3168797336","https://openalex.org/W6796737655"],"related_works":["https://openalex.org/W3082440218","https://openalex.org/W2380293314","https://openalex.org/W2943188944","https://openalex.org/W2137307547","https://openalex.org/W4285802202","https://openalex.org/W2082293200","https://openalex.org/W3008690834","https://openalex.org/W2016101288","https://openalex.org/W2032191695","https://openalex.org/W3176211900"],"abstract_inverted_index":{"This":[0],"letter":[1],"proposes":[2],"a":[3,21,98],"force":[4,18,73,128],"sensor":[5,96,129],"that":[6,42,93],"combines":[7],"semiconductor":[8,34],"strain":[9,14,28,35,47,67],"gauges":[10,15,29,68],"and":[11,56,69],"metallic":[12,45],"foil":[13,46],"to":[16,25,104],"present":[17],"information":[19],"of":[20,43,66,82,125],"higher":[22],"dynamic":[23,71,111,123],"range":[24,72,100,112,124,133],"robots.":[26],"The":[27,110],"have":[30],"different":[31],"sensitivities,":[32],"with":[33,130],"gauge":[36],"sensitivity":[37],"being":[38],"approximately":[39],"90-fold":[40],"than":[41],"the":[44,63,79,89,94,107,122,126,131],"gauges.":[48],"Using":[49],"this":[50],"difference":[51],"in":[52,134],"sensitivity,":[53],"large":[54],"forces":[55,58],"small":[57],"are":[59],"both":[60],"detected":[61],"through":[62],"two":[64],"types":[65],"high":[70],"detection":[74],"is":[75,113],"achieved":[76],"by":[77],"combining":[78],"output":[80],"signals":[81],"these":[83],"two.":[84],"It":[85],"was":[86],"confirmed":[87],"from":[88,101],"SN":[90],"ratio":[91],"test":[92],"proposed":[95],"has":[97],"measurement":[99],"0.005":[102],"N":[103],"1000":[105],"N,":[106],"maximum":[108],"load.":[109],"2":[114],"<inline-formula":[115],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex-math":[117],"notation=\"LaTeX\">$\\times":[118],"10^5$</tex-math></inline-formula>":[119],",":[120],"extending":[121],"6-axis":[127],"highest":[132],"previous":[135],"studies":[136],"two-fold.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}