{"id":"https://openalex.org/W4386634176","doi":"https://doi.org/10.1109/lgrs.2023.3314511","title":"A Combined Side-Slither Relative Radiometric Calibration Method for Non-Collinear TDI-CCDs","display_name":"A Combined Side-Slither Relative Radiometric Calibration Method for Non-Collinear TDI-CCDs","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4386634176","doi":"https://doi.org/10.1109/lgrs.2023.3314511"},"language":"en","primary_location":{"id":"doi:10.1109/lgrs.2023.3314511","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2023.3314511","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101533216","display_name":"Tao Peng","orcid":"https://orcid.org/0009-0008-4694-7212"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]},{"id":"https://openalex.org/I4210118728","display_name":"State Key Laboratory of Information Engineering in Surveying Mapping and Remote Sensing","ror":"https://ror.org/02bpap860","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118728"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tao Peng","raw_affiliation_strings":["State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I4210118728","https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076361735","display_name":"Yingdong Pi","orcid":"https://orcid.org/0000-0003-4092-1544"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]},{"id":"https://openalex.org/I4210118728","display_name":"State Key Laboratory of Information Engineering in Surveying Mapping and Remote Sensing","ror":"https://ror.org/02bpap860","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118728"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingdong Pi","raw_affiliation_strings":["State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I4210118728","https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100724610","display_name":"Ru Chen","orcid":"https://orcid.org/0000-0003-3961-0773"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]},{"id":"https://openalex.org/I4210118728","display_name":"State Key Laboratory of Information Engineering in Surveying Mapping and Remote Sensing","ror":"https://ror.org/02bpap860","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118728"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ru Chen","raw_affiliation_strings":["State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I4210118728","https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015083158","display_name":"Jun Pan","orcid":"https://orcid.org/0000-0001-6756-0692"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]},{"id":"https://openalex.org/I4210118728","display_name":"State Key Laboratory of Information Engineering in Surveying Mapping and Remote Sensing","ror":"https://ror.org/02bpap860","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118728"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Pan","raw_affiliation_strings":["State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I4210118728","https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102377998","display_name":"Jianwei Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092591","display_name":"China Centre for Resources Satellite Data and Application","ror":"https://ror.org/00ft0fw96","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210092591"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwei Cai","raw_affiliation_strings":["China Center for Resources Satellite Data and Application, Beijing, China"],"affiliations":[{"raw_affiliation_string":"China Center for Resources Satellite Data and Application, Beijing, China","institution_ids":["https://openalex.org/I4210092591"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100742710","display_name":"Mi Wang","orcid":"https://orcid.org/0000-0003-2799-5987"},"institutions":[{"id":"https://openalex.org/I4210118728","display_name":"State Key Laboratory of Information Engineering in Surveying Mapping and Remote Sensing","ror":"https://ror.org/02bpap860","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210118728"]},{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mi Wang","raw_affiliation_strings":["State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Information Engineering in Surveying, Mapping and Remote Sensing, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I4210118728","https://openalex.org/I37461747"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101533216"],"corresponding_institution_ids":["https://openalex.org/I37461747","https://openalex.org/I4210118728"],"apc_list":null,"apc_paid":null,"fwci":1.7647,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.86706063,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"20","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6966347098350525},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6348217129707336},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.61436527967453},{"id":"https://openalex.org/keywords/radiometry","display_name":"Radiometry","score":0.5554863214492798},{"id":"https://openalex.org/keywords/radiometric-calibration","display_name":"Radiometric calibration","score":0.5314489603042603},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5201540589332581},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.48617666959762573},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.4806484282016754},{"id":"https://openalex.org/keywords/field-of-view","display_name":"Field of view","score":0.46244388818740845},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.43080317974090576},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.41835829615592957},{"id":"https://openalex.org/keywords/charge-coupled-device","display_name":"Charge-coupled device","score":0.414615273475647},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3875078856945038},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3869260847568512},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.32800033688545227},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.21763277053833008},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19654834270477295},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.114195317029953},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.11294502019882202},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09460330009460449},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08642053604125977}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6966347098350525},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6348217129707336},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.61436527967453},{"id":"https://openalex.org/C87456703","wikidata":"https://www.wikidata.org/wiki/Q247760","display_name":"Radiometry","level":2,"score":0.5554863214492798},{"id":"https://openalex.org/C2778522173","wikidata":"https://www.wikidata.org/wiki/Q7281293","display_name":"Radiometric calibration","level":3,"score":0.5314489603042603},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5201540589332581},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.48617666959762573},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.4806484282016754},{"id":"https://openalex.org/C150627866","wikidata":"https://www.wikidata.org/wiki/Q1076893","display_name":"Field of view","level":2,"score":0.46244388818740845},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.43080317974090576},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.41835829615592957},{"id":"https://openalex.org/C152213855","wikidata":"https://www.wikidata.org/wiki/Q189880","display_name":"Charge-coupled device","level":2,"score":0.414615273475647},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3875078856945038},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3869260847568512},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32800033688545227},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.21763277053833008},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19654834270477295},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.114195317029953},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.11294502019882202},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09460330009460449},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08642053604125977},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lgrs.2023.3314511","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2023.3314511","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4308293926","display_name":null,"funder_award_id":"42192583","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5974932335","display_name":null,"funder_award_id":"2022YFB3902804","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1969445049","https://openalex.org/W1970193657","https://openalex.org/W2022887200","https://openalex.org/W2034671455","https://openalex.org/W2042978621","https://openalex.org/W2080160644","https://openalex.org/W2125885303","https://openalex.org/W2260750785","https://openalex.org/W2746069471","https://openalex.org/W2794123029","https://openalex.org/W3095113756","https://openalex.org/W3172877834","https://openalex.org/W4388375774","https://openalex.org/W7014929278"],"related_works":["https://openalex.org/W1995114632","https://openalex.org/W2753146189","https://openalex.org/W2166003495","https://openalex.org/W1495496653","https://openalex.org/W4320479303","https://openalex.org/W2116728133","https://openalex.org/W2347506004","https://openalex.org/W2000047745","https://openalex.org/W151369123","https://openalex.org/W4281572087"],"abstract_inverted_index":{"Relative":[0],"radiometric":[1,122],"calibration":[2,88],"(RRC)":[3],"is":[4,67,103],"a":[5,19,79,90],"crucial":[6],"step":[7,102],"in":[8,141],"enhancing":[9],"the":[10,24,62,70,113,120,150],"quality":[11],"of":[12,26,50,72,89,97],"satellite":[13],"images,":[14],"and":[15,93,145],"it":[16],"serves":[17],"as":[18,40,58],"fundamental":[20],"technology":[21],"to":[22,43,105,118],"ensure":[23,44],"reliability":[25],"information":[27],"extracted":[28],"from":[29],"these":[30,73],"images.":[31],"Traditional":[32],"side-slither":[33,82],"RRC":[34,83,154],"methods":[35],"typically":[36],"use":[37],"homogeneous":[38],"scenes":[39],"imaging":[41],"sites":[42],"approximately":[45],"identical":[46],"input":[47],"for":[48,64],"detectors":[49],"multiple":[51],"non-collinear":[52],"time-delay":[53],"integration-charge-coupled":[54],"devices":[55],"(TDI-CCDs).":[56],"However,":[57],"spatial":[59],"resolution":[60],"improves,":[61],"demand":[63],"site":[65],"uniformity":[66],"increasing,":[68],"limiting":[69],"application":[71],"traditional":[74],"methods.":[75,155],"Therefore,":[76],"we":[77],"propose":[78],"push-broom":[80,116],"data-aided":[81],"method,":[84],"which":[85],"involves":[86],"sequential":[87],"single":[91],"TDI-CCD":[92],"an":[94],"entire":[95],"field":[96],"view":[98],"(FOV).":[99],"The":[100],"first":[101],"designed":[104],"eliminate":[106],"response":[107],"differences":[108],"within":[109],"each":[110],"TDI-CCD,":[111],"while":[112],"latter":[114],"incorporates":[115],"data":[117],"determine":[119],"adjacent":[121],"relationship":[123],"via":[124],"adjustment":[125],"with":[126,149],"maximum":[127],"standard":[128],"deviation":[129],"preservation":[130],"(MSDP).":[131],"Experiments":[132],"show":[133],"that":[134],"our":[135],"method":[136],"has":[137],"achieved":[138],"better":[139],"results":[140],"both":[142],"visual":[143],"effect":[144],"quantitative":[146],"assessment,":[147],"compared":[148],"other":[151],"two":[152],"advanced":[153]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}