{"id":"https://openalex.org/W3198014086","doi":"https://doi.org/10.1109/lgrs.2021.3104593","title":"A Comparison of Bistatic and Monostatic Radar Images of 1-D Perfectly Conducting Rough Surfaces","display_name":"A Comparison of Bistatic and Monostatic Radar Images of 1-D Perfectly Conducting Rough Surfaces","publication_year":2021,"publication_date":"2021-08-25","ids":{"openalex":"https://openalex.org/W3198014086","doi":"https://doi.org/10.1109/lgrs.2021.3104593","mag":"3198014086"},"language":"en","primary_location":{"id":"doi:10.1109/lgrs.2021.3104593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2021.3104593","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065657855","display_name":"Ethan Raines","orcid":"https://orcid.org/0000-0001-7264-0224"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ethan Raines","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101568042","display_name":"James Park","orcid":"https://orcid.org/0000-0001-6893-4131"},"institutions":[{"id":"https://openalex.org/I4210090800","display_name":"Sensors (United States)","ror":"https://ror.org/00b4mz884","country_code":"US","type":"company","lineage":["https://openalex.org/I4210090800"]},{"id":"https://openalex.org/I3130687028","display_name":"United States Department of the Navy","ror":"https://ror.org/03ar0mv07","country_code":"US","type":"funder","lineage":["https://openalex.org/I1330347796","https://openalex.org/I3130687028"]},{"id":"https://openalex.org/I1280414376","display_name":"United States Air Force Research Laboratory","ror":"https://ror.org/02e2egq70","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"James Park","raw_affiliation_strings":["Department of Sensors Directorate, Air Force Research Laboratory, Dayton, OH, USA","Navy Research Laboratory, USA"],"affiliations":[{"raw_affiliation_string":"Department of Sensors Directorate, Air Force Research Laboratory, Dayton, OH, USA","institution_ids":["https://openalex.org/I1280414376","https://openalex.org/I4210090800"]},{"raw_affiliation_string":"Navy Research Laboratory, USA","institution_ids":["https://openalex.org/I3130687028"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004567285","display_name":"Joel T. Johnson","orcid":"https://orcid.org/0000-0002-6921-6059"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joel T. Johnson","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033746387","display_name":"Robert J. Burkholder","orcid":"https://orcid.org/0000-0003-3448-9265"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robert J. Burkholder","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5065657855"],"corresponding_institution_ids":["https://openalex.org/I52357470"],"apc_list":null,"apc_paid":null,"fwci":0.6791,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69211156,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"19","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bistatic-radar","display_name":"Bistatic radar","score":0.9305051565170288},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.7057689428329468},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.685906708240509},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.5816217660903931},{"id":"https://openalex.org/keywords/radar-engineering-details","display_name":"Radar engineering details","score":0.522441565990448},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.47246766090393066},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.46772658824920654},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.44725683331489563},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33560577034950256},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33017730712890625},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.32063743472099304},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.1363876461982727},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13586512207984924},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0867299735546112}],"concepts":[{"id":"https://openalex.org/C100102862","wikidata":"https://www.wikidata.org/wiki/Q2625855","display_name":"Bistatic radar","level":4,"score":0.9305051565170288},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.7057689428329468},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.685906708240509},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.5816217660903931},{"id":"https://openalex.org/C134406370","wikidata":"https://www.wikidata.org/wiki/Q832005","display_name":"Radar engineering details","level":4,"score":0.522441565990448},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.47246766090393066},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.46772658824920654},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.44725683331489563},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33560577034950256},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33017730712890625},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.32063743472099304},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.1363876461982727},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13586512207984924},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0867299735546112}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lgrs.2021.3104593","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2021.3104593","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2021772514","https://openalex.org/W2025969570","https://openalex.org/W2034611846","https://openalex.org/W2041120945","https://openalex.org/W2051207590","https://openalex.org/W2105144235","https://openalex.org/W2147208072","https://openalex.org/W2159245090","https://openalex.org/W2328431020"],"related_works":["https://openalex.org/W2125716714","https://openalex.org/W2352259907","https://openalex.org/W2358247812","https://openalex.org/W4380451819","https://openalex.org/W3198014086","https://openalex.org/W2387210280","https://openalex.org/W3127689436","https://openalex.org/W2982652090","https://openalex.org/W1981675605","https://openalex.org/W2742737769"],"abstract_inverted_index":{"Radar":[0],"images":[1,28],"of":[2],"a":[3],"1-D":[4],"perfectly":[5],"conducting":[6],"rough":[7],"surface":[8],"are":[9,29],"compared":[10],"for":[11,14,39],"monostatic":[12],"and":[13],"the":[15],"equivalent":[16],"bistatic":[17],"imaging":[18,42],"configurations.":[19],"The":[20],"results":[21],"show":[22,36],"that,":[23],"while":[24],"first-order":[25],"\u201csingle\u201d":[26],"scattering":[27,33],"largely":[30],"similar;":[31],"higher-order":[32],"effects":[34],"can":[35],"differing":[37],"signatures":[38],"these":[40],"two":[41],"modalities.":[43]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2025-12-19T19:40:27.379048","created_date":"2025-10-10T00:00:00"}