{"id":"https://openalex.org/W2072550473","doi":"https://doi.org/10.1109/lgrs.2014.2351792","title":"Efficient Pseudopolar Format Algorithm for Down-Looking Linear-Array SAR 3-D Imaging","display_name":"Efficient Pseudopolar Format Algorithm for Down-Looking Linear-Array SAR 3-D Imaging","publication_year":2014,"publication_date":"2014-09-09","ids":{"openalex":"https://openalex.org/W2072550473","doi":"https://doi.org/10.1109/lgrs.2014.2351792","mag":"2072550473"},"language":"en","primary_location":{"id":"doi:10.1109/lgrs.2014.2351792","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2014.2351792","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113491179","display_name":"Han Kuoye","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Han Kuoye","raw_affiliation_strings":["Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210110458","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":null,"display_name":"Wang Yanping","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Yanping","raw_affiliation_strings":["Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210110458","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110508763","display_name":"Tan Weixian","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tan Weixian","raw_affiliation_strings":["Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210110458","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102344364","display_name":"Hong Wen","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong Wen","raw_affiliation_strings":["Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Microwave Imaging Laboratory, Institute of Electronics, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210110458","https://openalex.org/I19820366"]},{"raw_affiliation_string":"Sci. & Technol. on Microwave Imaging Lab., Inst. of Electron., Beijing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":58.9517,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.99577581,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"12","issue":"3","first_page":"572","last_page":"576"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.8230302333831787},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.7673003077507019},{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.7051368355751038},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7004837989807129},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6799325346946716},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.5792184472084045},{"id":"https://openalex.org/keywords/convergence","display_name":"Convergence (economics)","score":0.5478106737136841},{"id":"https://openalex.org/keywords/inverse-synthetic-aperture-radar","display_name":"Inverse synthetic aperture radar","score":0.5370904803276062},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.5140396356582642},{"id":"https://openalex.org/keywords/image-formation","display_name":"Image formation","score":0.44920292496681213},{"id":"https://openalex.org/keywords/image-scaling","display_name":"Image scaling","score":0.4213523268699646},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41984957456588745},{"id":"https://openalex.org/keywords/linear-interpolation","display_name":"Linear interpolation","score":0.41095829010009766},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4047052562236786},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.3091776967048645},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.29066693782806396},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.27786263823509216},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.12855246663093567},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09660398960113525}],"concepts":[{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.8230302333831787},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.7673003077507019},{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.7051368355751038},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7004837989807129},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6799325346946716},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.5792184472084045},{"id":"https://openalex.org/C2777303404","wikidata":"https://www.wikidata.org/wiki/Q759757","display_name":"Convergence (economics)","level":2,"score":0.5478106737136841},{"id":"https://openalex.org/C109094680","wikidata":"https://www.wikidata.org/wiki/Q6060432","display_name":"Inverse synthetic aperture radar","level":4,"score":0.5370904803276062},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.5140396356582642},{"id":"https://openalex.org/C125045340","wikidata":"https://www.wikidata.org/wiki/Q6002224","display_name":"Image formation","level":3,"score":0.44920292496681213},{"id":"https://openalex.org/C27405340","wikidata":"https://www.wikidata.org/wiki/Q440296","display_name":"Image scaling","level":4,"score":0.4213523268699646},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41984957456588745},{"id":"https://openalex.org/C171836373","wikidata":"https://www.wikidata.org/wiki/Q2266329","display_name":"Linear interpolation","level":3,"score":0.41095829010009766},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4047052562236786},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.3091776967048645},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.29066693782806396},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.27786263823509216},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.12855246663093567},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09660398960113525},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lgrs.2014.2351792","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2014.2351792","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W599284720","https://openalex.org/W2078618370","https://openalex.org/W2120395839","https://openalex.org/W2130380164","https://openalex.org/W2138774395","https://openalex.org/W2151187453","https://openalex.org/W2151846609","https://openalex.org/W2796908055","https://openalex.org/W2946289328","https://openalex.org/W3145958984","https://openalex.org/W6680427457","https://openalex.org/W7011625045"],"related_works":["https://openalex.org/W1902088139","https://openalex.org/W2369403794","https://openalex.org/W2603539507","https://openalex.org/W2274264870","https://openalex.org/W2132198845","https://openalex.org/W1530257205","https://openalex.org/W2061619473","https://openalex.org/W814520242","https://openalex.org/W2379217792","https://openalex.org/W2442274486"],"abstract_inverted_index":{"In":[0],"this":[1],"letter,":[2],"a":[3,65],"novel":[4,66],"3-D":[5,67,117],"imaging":[6,118],"algorithm":[7,128],"for":[8,72],"down-looking":[9],"linear-array":[10],"synthetic":[11],"aperture":[12],"radar":[13],"is":[14,41,70,105,120,129],"presented.":[15],"The":[16,36,116],"usual":[17],"algorithms":[18],"involve":[19],"either":[20],"time-consuming":[21],"interpolations":[22],"or":[23],"huge":[24,29],"oversampling":[25,79],"operations,":[26],"which":[27],"adds":[28],"burden":[30],"to":[31,76,81,85,107],"the":[32,73,87,109,112,123,126],"image":[33,88,94,113],"formation":[34,89],"processor.":[35],"proposed":[37,127],"algorithm,":[38],"in":[39,102],"contrast,":[40],"not":[42],"only":[43],"accurate":[44],"because":[45,55],"little":[46],"approximation":[47],"has":[48],"been":[49],"made":[50],"but":[51],"also":[52],"quite":[53],"efficient":[54],"of":[56,111,125],"two":[57],"major":[58],"endeavors":[59],"that":[60],"we":[61],"have":[62],"made:":[63],"First,":[64],"pseudopolar":[68],"domain":[69],"introduced":[71,106],"focused":[74],"data":[75],"avoid":[77],"any":[78],"and":[80,97,122],"make":[82],"it":[83],"possible":[84],"formulate":[86],"process":[90],"as":[91],"an":[92],"interpolation-free":[93],"series":[95,114],"expansion,":[96],"second,":[98],"convergence":[99,110],"acceleration":[100],"theory":[101],"computational":[103],"mathematics":[104],"accelerate":[108],"expansion.":[115],"capability":[119],"evaluated,":[121],"validation":[124],"done":[130],"by":[131],"exploiting":[132],"simulated":[133],"data.":[134]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}