{"id":"https://openalex.org/W1987850317","doi":"https://doi.org/10.1109/lgrs.2014.2336983","title":"Electromagnetic Inverse Scattering Series Method for Positioning Three-Dimensional Targets in Near-Surface Two-Layer Medium With Unknown Dielectric Properties","display_name":"Electromagnetic Inverse Scattering Series Method for Positioning Three-Dimensional Targets in Near-Surface Two-Layer Medium With Unknown Dielectric Properties","publication_year":2014,"publication_date":"2014-07-28","ids":{"openalex":"https://openalex.org/W1987850317","doi":"https://doi.org/10.1109/lgrs.2014.2336983","mag":"1987850317"},"language":"en","primary_location":{"id":"doi:10.1109/lgrs.2014.2336983","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2014.2336983","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100633389","display_name":"Jinguo Wang","orcid":"https://orcid.org/0000-0002-1620-0803"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jinguo Wang","raw_affiliation_strings":["School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China","Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029879015","display_name":"Zhiqin Zhao","orcid":"https://orcid.org/0000-0002-7908-1178"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiqin Zhao","raw_affiliation_strings":["School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China","Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077498008","display_name":"Zaiping Nie","orcid":"https://orcid.org/0000-0002-9563-4115"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zaiping Nie","raw_affiliation_strings":["School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China","Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, University of Electronic Science and Technology of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]},{"raw_affiliation_string":"Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100345153","display_name":"Qing Liu","orcid":"https://orcid.org/0000-0001-5286-4423"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qing-Huo Liu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#","institution_ids":["https://openalex.org/I170897317"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100633389"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":2.5047,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.88233493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"12","issue":"2","first_page":"299","last_page":"303"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11698","display_name":"Underwater Acoustics Research","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/1910","display_name":"Oceanography"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6737989783287048},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.6323347091674805},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.6031591892242432},{"id":"https://openalex.org/keywords/electromagnetic-radiation","display_name":"Electromagnetic radiation","score":0.5529607534408569},{"id":"https://openalex.org/keywords/inverse-scattering-problem","display_name":"Inverse scattering problem","score":0.5437057018280029},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.5075184106826782},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5068026185035706},{"id":"https://openalex.org/keywords/inverse","display_name":"Inverse","score":0.4833261966705322},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.45658770203590393},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4393070936203003},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.42468202114105225},{"id":"https://openalex.org/keywords/electromagnetics","display_name":"Electromagnetics","score":0.41495490074157715},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3616216480731964},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.35163694620132446},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17103391885757446},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1698552370071411},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.16263934969902039},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.1483791470527649},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.10525703430175781}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6737989783287048},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.6323347091674805},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.6031591892242432},{"id":"https://openalex.org/C149773537","wikidata":"https://www.wikidata.org/wiki/Q12969754","display_name":"Electromagnetic radiation","level":2,"score":0.5529607534408569},{"id":"https://openalex.org/C174558057","wikidata":"https://www.wikidata.org/wiki/Q11639409","display_name":"Inverse scattering problem","level":3,"score":0.5437057018280029},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.5075184106826782},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5068026185035706},{"id":"https://openalex.org/C207467116","wikidata":"https://www.wikidata.org/wiki/Q4385666","display_name":"Inverse","level":2,"score":0.4833261966705322},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.45658770203590393},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4393070936203003},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.42468202114105225},{"id":"https://openalex.org/C2909720056","wikidata":"https://www.wikidata.org/wiki/Q11406","display_name":"Electromagnetics","level":2,"score":0.41495490074157715},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3616216480731964},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.35163694620132446},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17103391885757446},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1698552370071411},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.16263934969902039},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1483791470527649},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.10525703430175781},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lgrs.2014.2336983","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2014.2336983","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G243324882","display_name":null,"funder_award_id":"ZYGX2012Z005","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G2744917465","display_name":null,"funder_award_id":"61171044","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6971563662","display_name":null,"funder_award_id":"20120185110024","funder_id":"https://openalex.org/F4320336024","funder_display_name":"Specialized Research Fund for the Doctoral Program of Higher Education of China"},{"id":"https://openalex.org/G8377148270","display_name":null,"funder_award_id":"2672013ZYGX2013Z002","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null},{"id":"https://openalex.org/F4320336024","display_name":"Specialized Research Fund for the Doctoral Program of Higher Education of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1481020370","https://openalex.org/W1995439525","https://openalex.org/W2004251455","https://openalex.org/W2048401162","https://openalex.org/W2130734760","https://openalex.org/W2134536864","https://openalex.org/W2135712412","https://openalex.org/W2156504573","https://openalex.org/W2159552791","https://openalex.org/W2331463206","https://openalex.org/W2342258582","https://openalex.org/W3016993242","https://openalex.org/W6628643783","https://openalex.org/W6683147659"],"related_works":["https://openalex.org/W2520812953","https://openalex.org/W2144075718","https://openalex.org/W3101167575","https://openalex.org/W2545426741","https://openalex.org/W1567523647","https://openalex.org/W4321641047","https://openalex.org/W2033816073","https://openalex.org/W2515315840","https://openalex.org/W651169017","https://openalex.org/W2130400067"],"abstract_inverted_index":{"Positioning":[0],"3-D":[1,72],"targets":[2,73],"buried":[3,74,132],"in":[4,40,53,75,133],"layered":[5,37,100],"medium":[6,135],"with":[7,114,136],"electromagnetic":[8,24,60],"waves":[9],"has":[10],"widespread":[11],"applications,":[12],"such":[13],"as":[14],"the":[15,22,30,33,82,95,99,107,115,124,130],"detection":[16],"of":[17,21,32,81,98,128],"land":[18],"mines.":[19],"Most":[20],"current":[23],"inverse":[25,61],"methods":[26],"need":[27,90],"to":[28,42],"know":[29],"preknowledge":[31],"dielectric":[34,96],"properties":[35,97],"for":[36,70],"background":[38],"medium,":[39],"order":[41],"accurately":[43],"reconstruct":[44],"concealed":[45],"targets.":[46],"However,":[47],"this":[48,57],"condition":[49],"is":[50,66,85,109,126],"hardly":[51],"satisfied":[52],"real":[54],"problems.":[55],"In":[56],"letter,":[58],"an":[59],"scattering":[62],"series":[63],"method":[64,84],"(EISSM)":[65],"developed":[67],"and":[68,111],"derived":[69],"positioning":[71,129],"two-layered":[76],"medium.":[77,101],"The":[78,102],"prominent":[79],"advantage":[80],"proposed":[83],"that":[86,123],"it":[87],"does":[88],"not":[89],"any":[91],"prior":[92],"information":[93],"about":[94],"position":[103],"error":[104],"predicted":[105],"by":[106],"EISSM":[108,125],"analyzed":[110],"discussed.":[112],"Compared":[113],"commonly":[116],"used":[117],"time-reversal-mirror":[118],"technique,":[119],"numerical":[120],"simulations":[121],"show":[122],"capable":[127],"target":[131],"two-layer":[134],"less":[137],"error.":[138]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}