{"id":"https://openalex.org/W1998820179","doi":"https://doi.org/10.1109/lgrs.2013.2264857","title":"A New Quality Map for 2-D Phase Unwrapping Based on Gray Level Co-Occurrence Matrix","display_name":"A New Quality Map for 2-D Phase Unwrapping Based on Gray Level Co-Occurrence Matrix","publication_year":2013,"publication_date":"2013-07-09","ids":{"openalex":"https://openalex.org/W1998820179","doi":"https://doi.org/10.1109/lgrs.2013.2264857","mag":"1998820179"},"language":"en","primary_location":{"id":"doi:10.1109/lgrs.2013.2264857","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2013.2264857","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100412430","display_name":"Gang Liu","orcid":"https://orcid.org/0000-0002-2506-0339"},"institutions":[{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Gang Liu","raw_affiliation_strings":["Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","institution_ids":["https://openalex.org/I4210110458"]},{"raw_affiliation_string":"Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032677320","display_name":"Robert Wang","orcid":"https://orcid.org/0000-0002-9850-7015"},"institutions":[{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Robert Wang","raw_affiliation_strings":["Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","institution_ids":["https://openalex.org/I4210110458"]},{"raw_affiliation_string":"Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108670723","display_name":"Yunkai Deng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"YunKai Deng","raw_affiliation_strings":["Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","institution_ids":["https://openalex.org/I4210110458"]},{"raw_affiliation_string":"Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072261919","display_name":"Runpu Chen","orcid":"https://orcid.org/0000-0001-5290-6064"},"institutions":[{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runpu Chen","raw_affiliation_strings":["Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","institution_ids":["https://openalex.org/I4210110458"]},{"raw_affiliation_string":"Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015563699","display_name":"Yunfeng Shao","orcid":"https://orcid.org/0000-0002-4335-5157"},"institutions":[{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunfeng Shao","raw_affiliation_strings":["Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","institution_ids":["https://openalex.org/I4210110458"]},{"raw_affiliation_string":"Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022647473","display_name":"Zhihui Yuan","orcid":"https://orcid.org/0000-0001-7100-826X"},"institutions":[{"id":"https://openalex.org/I4210110458","display_name":"Institute of Electronics","ror":"https://ror.org/01z143507","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210110458"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihui Yuan","raw_affiliation_strings":["Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China"],"affiliations":[{"raw_affiliation_string":"Space Microwave Remote Sensing System Department, Institute of Electronics, Beijing, China","institution_ids":["https://openalex.org/I4210110458"]},{"raw_affiliation_string":"Space Microwave Remote Sensing Syst. Dept., Inst. of Electron., Beijing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100412430"],"corresponding_institution_ids":["https://openalex.org/I4210110458"],"apc_list":null,"apc_paid":null,"fwci":3.2659,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.92990185,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"11","issue":"2","first_page":"444","last_page":"448"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9836000204086304,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/statistic","display_name":"Statistic","score":0.6946139335632324},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6898616552352905},{"id":"https://openalex.org/keywords/entropy","display_name":"Entropy (arrow of time)","score":0.6234444975852966},{"id":"https://openalex.org/keywords/gray-level","display_name":"Gray level","score":0.6091393828392029},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5626282691955566},{"id":"https://openalex.org/keywords/co-occurrence-matrix","display_name":"Co-occurrence matrix","score":0.5218778252601624},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5013513565063477},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4532890319824219},{"id":"https://openalex.org/keywords/higher-order-statistics","display_name":"Higher-order statistics","score":0.45148617029190063},{"id":"https://openalex.org/keywords/norm","display_name":"Norm (philosophy)","score":0.4442939758300781},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3337574601173401},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3270626664161682},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2595645487308502},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.25360316038131714},{"id":"https://openalex.org/keywords/image-texture","display_name":"Image texture","score":0.2491343915462494},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.23407307267189026},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2082836627960205},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.10890635848045349}],"concepts":[{"id":"https://openalex.org/C89128539","wikidata":"https://www.wikidata.org/wiki/Q1949963","display_name":"Statistic","level":2,"score":0.6946139335632324},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6898616552352905},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.6234444975852966},{"id":"https://openalex.org/C2985861186","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Gray level","level":3,"score":0.6091393828392029},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5626282691955566},{"id":"https://openalex.org/C117479156","wikidata":"https://www.wikidata.org/wiki/Q1543908","display_name":"Co-occurrence matrix","level":5,"score":0.5218778252601624},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5013513565063477},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4532890319824219},{"id":"https://openalex.org/C2780576426","wikidata":"https://www.wikidata.org/wiki/Q5757980","display_name":"Higher-order statistics","level":4,"score":0.45148617029190063},{"id":"https://openalex.org/C191795146","wikidata":"https://www.wikidata.org/wiki/Q3878446","display_name":"Norm (philosophy)","level":2,"score":0.4442939758300781},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3337574601173401},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3270626664161682},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2595645487308502},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.25360316038131714},{"id":"https://openalex.org/C63099799","wikidata":"https://www.wikidata.org/wiki/Q17147001","display_name":"Image texture","level":4,"score":0.2491343915462494},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.23407307267189026},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2082836627960205},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.10890635848045349},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/lgrs.2013.2264857","is_oa":false,"landing_page_url":"https://doi.org/10.1109/lgrs.2013.2264857","pdf_url":null,"source":{"id":"https://openalex.org/S126920919","display_name":"IEEE Geoscience and Remote Sensing Letters","issn_l":"1545-598X","issn":["1545-598X","1558-0571"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Geoscience and Remote Sensing Letters","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W585975565","https://openalex.org/W1612390354","https://openalex.org/W2031763899","https://openalex.org/W2038421263","https://openalex.org/W2044465660","https://openalex.org/W2055689483","https://openalex.org/W2061577342","https://openalex.org/W2072218449","https://openalex.org/W2088946018","https://openalex.org/W2117438495","https://openalex.org/W2129206142","https://openalex.org/W2130204909","https://openalex.org/W2158755508","https://openalex.org/W2161661683","https://openalex.org/W2172041488","https://openalex.org/W6636637458","https://openalex.org/W6658309321"],"related_works":["https://openalex.org/W1505833044","https://openalex.org/W2617798614","https://openalex.org/W2393987497","https://openalex.org/W2366706511","https://openalex.org/W2358710088","https://openalex.org/W2799833988","https://openalex.org/W2365822921","https://openalex.org/W2085254577","https://openalex.org/W2388086542","https://openalex.org/W1999006669"],"abstract_inverted_index":{"Both":[0],"in":[1,18,71,129],"quality-guide":[2],"phase":[3,9,22],"unwrapping":[4,10],"algorithms":[5,127],"and":[6,132,136],"weighted":[7],"minimum-norm":[8],"algorithms,":[11],"quality":[12,35,98],"maps":[13,36],"play":[14],"a":[15,30,49],"crucial":[16],"role":[17],"obtaining":[19],"the":[20,24,39,56,63,72,79,82,84,97,103,111,116,119,130,137],"absolute":[21],"from":[23],"wrapped":[25],"ones.":[26],"In":[27],"this":[28],"letter,":[29],"new":[31,120],"technique":[32],"for":[33,54,115],"generating":[34],"based":[37],"on":[38],"gray":[40],"level":[41],"co-occurrence":[42],"matrix":[43],"(GLCM)":[44],"is":[45,48,93,122],"proposed.":[46],"GLCM":[47,88],"classical":[50],"second-order":[51,64,85],"statistics":[52,65],"method":[53],"analyzing":[55],"texture":[57],"features":[58],"of":[59,66,81,87,91,105,107],"images.":[60],"Through":[61],"exploring":[62],"GLCM,":[67],"much":[68],"useful":[69],"information":[70],"image":[73],"can":[74],"be":[75],"exploited.":[76],"According":[77],"to":[78,95,109],"characteristics":[80],"interferogram,":[83],"statistic":[86,112],"called":[89],"\u201cdifference":[90,106],"entropy\u201d":[92,108],"used":[94],"generate":[96],"maps.":[99],"Besides,":[100],"we":[101],"modified":[102],"definition":[104],"make":[110],"more":[113],"suitable":[114],"problem.":[117],"Finally,":[118],"algorithm":[121],"compared":[123],"with":[124],"other":[125],"conventional":[126],"both":[128],"simulated":[131],"real":[133],"data":[134],"experiments":[135],"results":[138],"show":[139],"its":[140],"better":[141],"performance.":[142]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}